• Journal of Sensor Science and Technology
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• v.19 no.5
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• pp.391-397
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• 2010

This paper proposes a differential structure sensor for detecting Ringer's solution exhaustion, in which three C-type electrodes of 10 mm width are disposed on a ringer hose at a distance of 5 mm each other in the direction of Ringer's solution flow. In the center of middle electrode, two capacitances are formed at the proposed sensor. When ringer hose is filled with Ringer's solution, there is no difference between two capacitances. But capacitance difference exist under the Ringer's solution shortage, because the shortage causes the hose filled with air from the top position electrode. The capacitance difference got to maximum 1.81 pF, when air was filled between top and middle electrode and the last of hose was filled with 10 % dextrose injection Ringer's solution. The capacitance difference varied with hose-wraparound coverage of electrodes as well as the width of them. For hose-wraparound electrode coverage of 90 % and 70 %, the maximum capacitance difference was 1.81 pF and 1.56 pF, respectively. A differential charge amplifier converted the capacitance difference to electric signal, and minimized electrodes' adhering problem and external noise coupling problem.

• Journal of IKEEE
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• v.13 no.4
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• pp.63-68
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• 2009

The power management integrated circuit(PMIC) for CCD image sensor is presented in this study. A CCD image sensor is very sensitive against temperature. The temperature, that is heat, is generally generated by the PMIC with low efficiency. Since the generated heat influences performance of CCD image sensor, it should be minimized by using a PMIC which has a high efficiency. In order to develop the PMIC with high efficiency, the input stage is designed with synchronous type step down DC-DC converter. The operating range of the converter is from 5V to 15V and the converter is controlled using PWM method. The PWM control circuit consists of a saw-tooth generator, a band-gap reference circuit, an error amplifier and a comparator circuit. The saw-tooth generator is designed with 1.2MHz oscillation frequency. The comparator is designed with the two stages OP Amp. And the error amplifier has 40dB DC gain and $77^{\circ}$ phase margin. The output of the step down converter is connected to input stage of the charge pump. The output of the charge pump is connected to input of the LDO which is the output stage of the PMIC. Finally, the PMIC, based on the PWM control circuit and the charge pump and the LDO, has output voltage of 15V, -7.5V, 3.3V and 5V. The PMIC is designed with a 0.35um process.

• Transactions on Electrical and Electronic Materials
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• v.15 no.3
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• pp.139-143
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• 2014

In this paper, an integrated low-voltage control circuit is introduced for a charge pump DC-DC boost converter. By exploiting the advantage of the integration of the feedback control circuit within CMOS technology, the charge pump boost converter offers a low-current operation with small ripple voltage. The error amplifier, comparator, and oscillator in the control circuit are designed with the supply voltage of 3.3 V and the operating frequency of 1.6~5.5 MHz. The charge pump converter with the 4 or 8 pump stages is measured in simulation. The test in the $0.35{\mu}m$ CMOS process shows that the load current and ripple ratio are controlled under 1 mA and 2% respectively. The output-voltage is obtained from 4.8 ~ 8.5 V with the supply voltage of 3.3 V.

• JSTS:Journal of Semiconductor Technology and Science
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• v.7 no.2
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• pp.67-75
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• 2007

To improve low sense margin at low voltage, we propose a negatively driven sensing (NDS) scheme and to solve the problem of WL-to-BL short leakage fail, a variable bitline reference scheme with free-level precharged bitline (FLPB) scheme is adopted. The influence of the threshold voltage offset of NMOS and PMOS transistors in a latch type sense amplifier is very important factor these days. From evaluating the sense amplifier offset voltage distribution of NMOS and PMOS, it is well known that PMOS has larger distribution in threshold voltage variation than that of NMOS. The negatively-driven sensing (NDS) scheme enhances the NMOS amplifying ability. The offset voltage distribution is overcome by NMOS activation with NDS scheme first and PMOS activation followed by time delay. The sense amplifier takes a negative voltage during the sensing and amplifying period. The negative voltage of NDS scheme is about -0.3V to -0.6V. The performance of the NDS scheme for DRAM at the gigabit level has been verified through its realization on 1-Gb DDR2 DRAM chip.

• Journal of the Semiconductor & Display Technology
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• v.22 no.4
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• pp.161-165
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• 2023

This paper designed a voltage feedback driving circuit to compensate for the characteristic deviation of the Active Matrix Organic Light Emitting Diode driving Thin Film Transistor. This paper describes a stable and fast circuit by applying charge sharing and polar stabilization methods. A 12-inch Organic Light Emitting Diode with a Double Wide Ultra eXtended Graphics Array resolution creates a screen distortion problem for line parasitism, and charge sharing and polar stabilization structures were applied to solve the problem. By applying Charge Sharing, all data lines are shorted at the same time and quickly positioned as the average voltage to advance the compensated change time of the gate voltage in the next operation period. A buffer circuit and a current pass circuit were added to lower the Amplifier resistance connected to the line as a polar stabilization method. The advantage of suppressing the Ringing of the driving Thin Film Transistor can be obtained by increasing the stability. As a result, a circuit was designed to supply a stable current to the Organic Light Emitting Diode even if the characteristic deviation of the driving Thin Film Transistor occurs.

• The Journal of Korea Institute of Information, Electronics, and Communication Technology
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• v.13 no.5
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• pp.403-411
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• 2020

Since the analog circuit of the beta ray sensor circuit for the true random number generator and the power and ground line used in the comparator circuit are shared with each other, the power generated by the digital switching of the comparator circuit and the voltage drop at the ground line was the cause of the decreasein the output signal voltage drop at the analog circuit including CSA (Charge Sensitive Amplifier). Therefore, in this paper, the output signal voltage of the analog circuit including the CSAcircuit is reduced by separating the power and ground line used in the comparator circuit, which is the source of digital switching noise, from the power and ground line of the analog circuit. In addition, in the voltage-to-voltage converter circuit that converts VREF (=1.195V) voltage to VREF_VCOM and VREF_VTHR voltage, there was a problem that the VREF_VCOM and VREF_VTHR voltages decrease because the driving current flowing through each current mirror varies due to channel length modulation effect at a high voltage VDD of 5.5V when the drain voltage of the PMOS current mirror is different when driving the IREF through the PMOS current mirror. Therefore, in this paper, since the PMOS diode is added to the PMOS current mirror of the voltage-to-voltage converter circuit, the voltages of VREF_VCOM and VREF_VTHR do not go down at a high voltage of 5.5V.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.12 no.7
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• pp.1235-1242
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• 2008

In this paper, x-ray image sensor of photon counting type having a $32{\times}32$ pixel array is designed with $0.18{\mu}m$ triple-well CMOS process. Each pixel of the designed image sensor has an area of loot $100{\times}100\;{\mu}m2$ and is composed of about 400 transistors. It has an open pad of an area of $50{\times}50{\mu}m2$ of CSA(charge Sensitive Amplifier) with x-ray detector through a bump bonding. To reduce layout size, self-biased folded cascode CMOS OP amp is used instead of folded cascode OP amp with voltage bias circuit at each single-pixel CSA, and 15-bit LFSR(Linear Feedback Shift Register) counter clock generator is proposed to remove short pulse which occurs from the clock before and after it enters the counting mode. And it is designed that sensor data can be read out of the sensor column by column using a column address decoder to reduce the maximum current of the CMOS x-ray image sensor in the readout mode.

• 전기의세계
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• v.11
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• pp.8-13
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• 1963

Solid state nuclear radiation detector에 사용되는 transistor에 의한 저잡음 charge sensitive preamplifier의 설계방식과 이에 대한 실측결과에 관하여 기술하였다. 먼저 transistor noise의 제원인을 분석하고 이 잡음들을 최소로 하기 위하여 이에 관련된 각 parameter에 대하여 이론 및 실험적으로 고찰하였다. 지금까지 알려진 진공관식 증폭기의 최소잡음은 등가전자수로 표시하면 약 250전자 정도이고 그 transistor증폭기에 있어서는 약 1,000전자 정도이었으나 본 설계방식에 의하여 제작된 transistor증폭기에서는 detector를 포함한 전 input capacitance가 약 100PF일때 약 400전자의 양호한 저잡음특성을 보이고 있으며 linearity 및 stability도 매우 좋은 결과를 보이고 있다. 여기에 사용된 cascode회로 자체는 이미 오래 전부터 알려져 있었지만 잡음을 최소로 하기 위한 설계방법은 지금껏 알려지지 않고 있으므로 본 논문에서는 전치증복기의 소요이득에서 잡음을 최소로 할 수 있는 설계방식을 확립하여 이 방식에 의한 실측결과는 종래의 transistor를 사용한 것보다 가장 좋았다.

• Journal of Power Electronics
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• v.13 no.1
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• pp.51-58
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• 2013

This paper proposes the power conversion mechanism of a bailer-charge-transfer zero-current-switching (CT-ZCS) circuit. The operation modes are analyzed and researched using state trajectory equations. The topology of CT-ZCS based on soft-switching inverters offers some merits such as: tracking the input reference signal dynamically, bearing load shock and short circuit, multiplying inverter N+1 redundancy parallel, coordinating power balance for easy control, and soft-switching commutation for high efficiency and large capacity. These advantages are distinctive from conventional inverter topologies and are especially demanded in AC drives: new energy generation and grid, distributed generation systems, switching power amplifier, active power filter, and reactive power compensation and so on. Prototype is manufactured and experiment results show the feasibility and dynamic voltage-tracking characteristics of the topology.

• Journal of the Korean Institute of Telematics and Electronics B
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• v.31B no.3
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• pp.53-59
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• 1994

A new fully differential sample-and-hold circuit which can effectively compensate the offset voltage of an operational amplifier and the charge injection of a MOS switch is presented. The proposed circuit shows a true sample-and-hold function without a reset period or an input-track period. The prototype fabricated using a 1.2$\mu$m double-polysilicon CMOS process occupies an area of 550$\mu$m$\times$288$\mu$m and the error of the sampled ouput is 0.056% on average for 3V input at DC.