• Bulletin of the Korean Chemical Society
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• v.31 no.12
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• pp.3723-3729
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• 2010

We investigated the high-excitation voltage cathodoluminescence (CL) performance of blue light-emitting (ZnS:Ag,Al,Cl) and green light-emitting (ZnS:Cu,Al) phosphors coated with metal oxides ($SiO_2$, $Al_2O_3$, and MgO). Hydrolysis of the metal oxide precursors tetraethoxysilane, aluminum isopropoxide, and magnesium nitrate, with subsequent heat annealing at $400^{\circ}C$, produced $SiO_2$ nanoparticles, an $Al_2O_3$ thin film, and MgO scale-type film, respectively, on the surface of the phosphors. Effects of the phosphor surface coatings on CL intensities and aging behavior of the phosphors were assessed using an accelerating voltage of 12 kV. The MgO thick film coverage exhibited less reduction in initial CL intensity and was most effective in improving aging degradation. Phosphors treated with a low concentration of magnesium nitrate maintained their initial CL intensities without aging degradation for 2000 s. In contrast, the $SiO_2$ and the $Al_2O_3$ coverages were ineffective in improving aging degradation.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2009.06a
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• pp.44-44
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• 2009

Recently, transparent ZnO-based TFTs have attracted much attention for flexible displays because they can be fabricated on plastic substrates at low temperature. We report the fabrication and characteristics of ZnO channel layers(ZnO TFTs) having different channel thicknesses. The ZnO film were deposited as active channel layers on $Si_3N_4/Ti/SiO_2p$-Si substrates by rf magnetron sputtering at $100\;^{\circ}C$ without additional annealing. Also the Zno thin films deposited at oxygen partial pressures of 40%. ZnO TFTs using a bottom-gate configuration were investigated. The $Si_3N_4$ film were deposited as gate insulator by PE-CVD at $15\;^{\circ}C$. All Processes were processed below $150^{\circ}C$ which is optimal temperature for flexible display and were used dry etching method.

• Proceedings of the Korean Vacuum Society Conference
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• 2011.08a
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• pp.354-354
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• 2011

ZnO 나노와이어는 밴드 갭이 3.37 ev로 큰 밴드 갭을 갖는 물질이며 엑시톤 결합에너지가 60 meV로 GaN(25 meV)같은 다른 반도체보다 매우 크다. 또한 밴드갭 에너지가 큰 GaN, SiC와 같은 반도체에 비해서 화학적, 열적 안정성이 크며 낮은 온도에서 성장이 가능하다는 장점이 있다. 본 연구에서는 pre-heating process를 이용하여 1차원 구조인 ZnO nanowire를 수열합성법으로 합성하였다. 실험방법으로는 E2K glass 기판위에 AZO40 nm를 증착후, 시드층으로 이용하여 ZnO nanowire를 성장하였다. precusor 전구체에는 ZN(NO3)2 ${\cdot}$ 6H2O와 Capping agent으로의 역할을 위해 PEI와 OH-source 공급을 위한 Ammonium chloride를 첨가하여 합성하였고, 그에 따른 ZnO nanowire의 morphology 및 aspect ratio를 조절하고자 하였다. 마지막으로 ZnO 나노와이어의 구조적, 광학적 특성 평가를 하기위해 XRD, FE-SEM, PL 등을 이용하여 측정 하였고, 향후 나노발전기, 태양전지 등 여러 광학기기 등에 전극재료로서 응용 가능성에 대해 알아보고자 하였다.

• Korean Journal of Materials Research
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• v.27 no.10
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• pp.569-575
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• 2017

To improve photocatalytic performance, a $PbS/ZnO/TiO_2$ nanotube catalyst was synthesized, and its surface characteristics and photocatalytic efficiency were investigated. The hybrid photocatalysts were produced by anodic oxidation and successive ionic layer adsorption and reaction(SILAR). The photocatalytic efficiency was evaluated using the dye degradation rate. The $PbS/ZnO/TiO_2$ photocatalyst significantly enhanced the photocatalytic activity for dye degradation, which was ascribed to the synergistic effect of their better absorption of solar light and a decrease in the rate of excited electron-hole recombination.

• Advances in nano research
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• v.1 no.1
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• pp.59-70
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• 2013

ZnO nanostructures of rod-like, faceted bar, cup-end bars, and spindle shaped morphologies could be grown by a low power ultrasonic synthesis process. pH of the reaction mixture seems to plays an important role for defining the final morphology of ZnO nanostructures. While the solution pH as low as 7 produces long, uniform rod-like nanostructures of mixed phase (ZnO and $Zn(OH)_2$), higher pH of the reaction mixture produces ZnO nanostructures of different morphologies in pure hexagonal wurtzite phase. pH of the reaction as high as 10 produces bar shaped uniform nanostructures with lower specific surface area and lower surface and lattice defects, reducing the defect emissions of ZnO in the visible region of their photoluminescence spectra.

• Progress in Superconductivity
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• v.13 no.2
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• pp.90-96
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• 2011

We investigated the properties of artificial pinning centers of YBCO multilayer films in which $Y_2O_3$ and ZnO nanoparticles are uniformly introduced by using the pulsed laser deposition (PLD) technique. $Y_2O_3$ and ZnO nanoparticles were deposited on top of YBCO buffer layer and the density of nanoparticles was controlled by varying the number of nanoparticle layers. YBCO superconducting layers with total thickness of 250 nm were deposited on top of $Y_2O_3$ and ZnO nanoparticles. Based on analyses of the surface morphology, the transition temperature $T_c$, and the critical current density $J_c$, we discussed the difference between the two kinds of nanoparticles as flux pinning centers.

• Proceedings of the KIEE Conference
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• 2003.10a
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• pp.186-188
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• 2003

The ZnO surge arrester is the protective device for limiting surge voltages on equipment by diverting surge current and returning the device to its original status. The occurrence of overvoltage appears in any phase to AC power supply system and it appears in mixing AC and impulse voltages, moreover because HVDC power supply system uses converter in semiconductor, it makes mixed DC and high harmonics voltages. In this study, the various mixed AC and DC voltages was made for investigating the degradation effect of ZnO arrester according to mixed voltage. As a result, the increase of DC component to mixed voltages causes the increase of resistive component of total leakage current to ZnO block. In changing V-I curve for mixed voltages, the cross-over point acts a factor as making the proper capacitor size of an equivalent circuit for ZnO block.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.30 no.1
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• pp.54-58
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• 2017

The effect of low temperature ($250^{\circ}C$) heat treatment after electron irradiation (irradiation time = 30, 180, 300s) on the chemical bonding and electrical properties of ZnO thin films prepared using a sol-gel process were examined. XPS (X-ray photoelectron spectroscopy) analysis showed that the electron beam irradiation decreased the concentration of M-O bonding and increased the OH bonding. As a result of the electron beam irradiation, the carrier concentration of ZnO films increased. The on/off ratio was maintained at ${\sim}10^5$ and the $V_{TH}$ values shifted negatively from 11 to 1 V. As the irradiation time increased from 0 to 300s, the calculated S. S. (subthreshold swing) of ZnO TFTs increased from 1.03 to 3.69 V/decade. These values are superior when compared the sample heat-treated at $400^{\circ}C$ representing on/off ratio of ${\sim}10^2$ and S. S. value of 10.40 V/decade.

• Transactions on Electrical and Electronic Materials
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• v.18 no.1
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• pp.21-24
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• 2017

Usually, the oxygen vacancy is an important factor in an oxide semiconductor device because the conductivity is related to the oxygen vacancy, which is formed at the interface between oxide semiconductors and electrodes with an annealing processes. ZTO is made by mixing n-type ZnO and p-type $SnO_2$. Zink tin oxide (ZTO), zink oxide (ZnO) and tin oxide ($SnO_2$) thin films deposited by RF magnetron sputtering and annealed, to generate the oxygen vacancy, were analyzed by XPS spectra. The contents of oxygen vacancy were the highest in ZTO annealed at $150^{\circ}C$, ZnO annealed at $200^{\circ}C$ and $SnO_2$ annealed at $100^{\circ}C$. The current was also increased with increasing the oxygen vacancy ions. The highest content of ZTO oxygen vacancies was obtained when annealed at 150. This is the middle level in compared with those of ZnO annealed at $200^{\circ}C$ and $SnO_2$ annealed at $100^{\circ}C$. The electrical properties of ZTO followed those of $SnO_2$, which acts a an enhancer in the oxide semiconductor.

• Proceedings of the Korean Vacuum Society Conference
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• 2010.02a
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• pp.107-107
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• 2010

ZnO는 상온에서 에너지 밴드갭이 3.37 eV 이고 엑시톤 속박에너지가 60 meV 인 넓은 에너지 띠를 가진 반도체이다. ZnO 반도체는 고에너지 영역에서 광투과율 및 에너지 수집율이 큰 특성을 가지고 있기 때문에 단파장 영역에서 작동하는 발광 다이오드나 반도체레이저 소자 응용에 사용되고 있다. 이와 더불어 액정디스플레이, 유기발광소자 및 태양전지에서 투명 산화물 전극으로 많은 응용이 되고 있다. 본 연구에서는 p-type Si 기판 위에 ZnO 나노입자 형성과 구조적 성질과 전자적 성질에 대하여 조사하였다. ZnO 나노입자를 형성하기 위해 ethanol에 zinc acetate dehydrate (5 wt%)을 적절히 분산시킨 $Zn(CH_3COO)_2H_2O\;+\;CH_3OH$ 용액을 스핀 코팅하여 산소 분위기에서 각각 $300^{\circ}C$, $500^{\circ}C$, $700^{\circ}C$ 및 $900^{\circ}C$로 각각 2시간 동안 열처리 하였다. X-ray 회절 실험 결과는 열처리 온도에 관계없이 ZnO (0001)의 피크가 관측되었다. 원자힘 현미경 이미지상으로 열처리 온도에 따른 ZnO 나노입자의 표면상태의 변화와 나노입자의 크기의 변화를 확인하였다. X-ray 광전자 분광 스펙트럼 결과는 Zn $2p_{3/2}$와 O 1s의 전자상태 스펙트럼을 분석하여 ZnO 나노입자가 형성됨을 보여주었다. 본 연구를 통하여 용액방법을 사용하여 제작된 ZnO 나노입자의 열처리 온도변화에 따른 구조적 성질과 전자적 성질을 이해하는데 도움을 줄 것이다.