Influence of Electron Beam Irradiation on the Electrical Properties of ZnO Thin Film Transistor |
Choi, Jun Hyuk
(Neutron Utilization Technology Division, Korea Atomic Energy Research Institute)
Cho, In Hwan (Neutron Utilization Technology Division, Korea Atomic Energy Research Institute) Kim, Chan-Joong (Neutron Utilization Technology Division, Korea Atomic Energy Research Institute) Jun, Byung-Hyuk (Neutron Utilization Technology Division, Korea Atomic Energy Research Institute) |
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