• Title/Summary/Keyword: Testing Method

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A Fast Shadow Testing Algorithm during Ray Tracing. (광선추적 수행중 그림자의 빠른 검사를 위한 효과적인 알고리즘)

  • Eo, Kil-Su;Choi, Hun-Kyu;Kyung, Chong-Min
    • Proceedings of the KIEE Conference
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    • 1988.07a
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    • pp.537-540
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    • 1988
  • This paper presents a new shadow testing acceleration scheme for ray tracing called hybrid shadow testing(HST), based on conditional switching between the conventional shadow testing method and Crow's shadow volume method, with the object polygons as well as the shadow polygons registered onto the corresponding cells under the 3-D space subdivision environment. Despite the preprocessing time for the generation and registration of the shadow polygons, the total shadow testing time of the new algorithm was approximately 50 % of that of the conventional shadow testing method for several examples while the total ray tracing time was typically reduced by 30% from the conventional approach.

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Object Oriented Fault Detection for Fault Models of Current Testing (전류 테스팅 고장모델을 위한 객체기반의 고장 검출)

  • Bae, Sung-Hwan;Han, Jong-Kil
    • The Journal of the Korea institute of electronic communication sciences
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    • v.5 no.4
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    • pp.443-449
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    • 2010
  • Current testing is an effective method which offers higher fault detection and diagnosis capabilities than voltage testing. Since current testing requires much longer testing time than voltage testing, it is important to note that a fault is untestable if the two nodes have same values at all times. In this paper, we present an object oriented fault detection scheme for various fault models using current testing. Experimental results for ISCAS benchmark circuits show the effectiveness of the proposed method in reducing the number of faults and its usefulness in various fault models.

Dynamic Power Supply Current Testing for Open Defects in CMOS SRAMs

  • Yoon, Doe-Hyun;Kim, Hong-Sik;Kang, Sung-Ho
    • ETRI Journal
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    • v.23 no.2
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    • pp.77-84
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    • 2001
  • The detection of open defects in CMOS SRAM has been a time consuming process. This paper proposes a new dynamic power supply current testing method to detect open defects in CMOS SRAM cells. By monitoring a dynamic current pulse during a transition write operation or a read operation, open defects can be detected. In order to measure the dynamic power supply current pulse, a current monitoring circuit with low hardware overhead is developed. Using the sensor, the new testing method does not require any additional test sequence. The results show that the new test method is very efficient compared with other testing methods. Therefore, the new testing method is very attractive.

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A METHOD FOR TESTING SURFACE DEFORMS OF LARGE CONVEX MIRRORS

  • Kim Young-Soo
    • Bulletin of the Korean Space Science Society
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    • 2004.10b
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    • pp.254-257
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    • 2004
  • Both ground and space telescopes are being built larger and larger. Accordingly, the secondary mirrors become larger which are convex mostly on the surface form. Testing convex mirrors becomes more difficult and delicate than testing concave mirrors in optics, because additional optical components are needed to make the reflected rays converge. Hindle type tests are frequently used for measuring the surface deforms of convex mirrors, which employs a meniscus lens to reverse the diverted rays from the mirrors. In case of testing large convex mirrors by using Hindle type tests, attention would be needed as larger meniscus lens is required. A method of modified Hindle test has been studied and the characteristics are analyzed. In this paper, current method of testing convex mirrors is presented, and a new method is discussed.

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A Source Code Cross-site Scripting Vulnerability Detection Method

  • Mu Chen;Lu Chen;Zhipeng Shao;Zaojian Dai;Nige Li;Xingjie Huang;Qian Dang;Xinjian Zhao
    • KSII Transactions on Internet and Information Systems (TIIS)
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    • v.17 no.6
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    • pp.1689-1705
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    • 2023
  • To deal with the potential XSS vulnerabilities in the source code of the power communication network, an XSS vulnerability detection method combining the static analysis method with the dynamic testing method is proposed. The static analysis method aims to analyze the structure and content of the source code. We construct a set of feature expressions to match malignant content and set a "variable conversion" method to analyze the data flow of the code that implements interactive functions. The static analysis method explores the vulnerabilities existing in the source code structure and code content. Dynamic testing aims to simulate network attacks to reflect whether there are vulnerabilities in web pages. We construct many attack vectors and implemented the test in the Selenium tool. Due to the combination of the two analysis methods, XSS vulnerability discovery research could be conducted from two aspects: "white-box testing" and "black-box testing". Tests show that this method can effectively detect XSS vulnerabilities in the source code of the power communication network.

Conformance Testing of Multi-protocol IUTs (다중계층 프로토콜의 적합성시험 방안)

  • Park, Yong-Beom;Kim, Myeong-Cheol;Kim, Jang-Gyeong
    • The Transactions of the Korea Information Processing Society
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    • v.6 no.11
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    • pp.3086-3096
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    • 1999
  • To declare conformance of multi-protocol Implementation Under Test(IUT), every layer of the multi-protocol IUT should be tested. According to ISO9646, single-layer test method is applied to testing the highest layer of multi-protocol IUT and single-layer embedded test method is used for the layers by layer all the protocols in a multi-protocol IUT. This paper proposes a new method for testing a multi-protocol IUT. The proposed test method assumes that a multi-protocol IUT is under test and that the interfaces between the layers cannot be controlled or observed by the tester. We apply the proposed test method to TCP/IP and compare the application results with those of the existing test turns out that the proposed test method significantly reduces the number of test cases as well as the number of test events while providing the same test coverage. In addition, the proposed test method shows the capability to locate the layer that is source of failure in testing multi-protocol IUTs.

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Development of Conformance Testing Criteria for STEP AP218 (Ship Structure) (선체구조 모델 데이터의 교환 표준에 따른 적합성 시험 기준의 개발)

  • Hwang, Ho-Jin
    • Journal of Ocean Engineering and Technology
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    • v.24 no.2
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    • pp.74-81
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    • 2010
  • Ship STEP is the international standard for the exchange of ship modeling data between heterogeneous systems. It is expected that STEP AP218 can be used for seamless data exchange between various CAD/CAM/CAE systems used in the shipbuilding design process. Although the conformance assessment for standards would maximize the performance and confidence about data exchanges, most research has been directed toward interoperability testing. ISO SC4/TC184 only provides the method for conformance testing, and it can be used with test cases on application protocols. Even though standards have been defined for conformance assessment and testing, there is no organization or association. CAD vendors have focused on interoperability testing for evaluation of the performance of their systems. In this paper, the conformance testing criteria for AP218 have been developed with abstract test cases of ship structures. The requested STEP translator was also reviewed with a developed item pool of testing criteria. The criteria methodology would be a guideline for the development of translators and interfaces. The item pool method of testing criteria for conformance assessment would increase performance and efficiency of data translators for Ship STEP and other standards.

LED Delamination Evaluating Method by Thermal Shock Test (열충격시험을 통한 LED 박리 평가법에 관한 연구)

  • Jang, In-Hyeok;Han, Ji-Hoon;Ko, Min-ji;Lee, Young-Joo;Lim, Hong-Woo
    • Journal of Advanced Engineering and Technology
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    • v.6 no.2
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    • pp.121-124
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    • 2013
  • This paper proposed a new concept of estimating method for LED(light-emitting diode) delamination with high accuracy. Usually, The LED is composed several materials which are LED chips, gold wire, phosphor, epoxy resin, adhesive, reflector and lead frame. These different materials are usually delaminated in a trouble conditions which are huge temperature difference, hot and humid or mechanical shocked. When the components are delaminated, a luminance will be lost, moisture be absorbed easily and a thermal resistance be increased attendantly. As a conventional method to estimate a delamination of LEDs, a solution immersing method is usually used in a field of LED manufacturing companies or researching institutes. This method has an advantage of simplicity but it is only shown that the existence of delamination or not. In this paper, we have proposed an estimating method for LEDs delamination using the polishing and the electron microscope. New proposed method has shown the result of confirming delamination without destruction and enabled quantitative analysis for LED delamination.

A Hybrid Shadow Testing Scheme During Ray Tracing (광선추적 수행중 혼합 음영검사에 관한 연구)

  • Eo, Kil-Su;Kyung, Chong-Min
    • Journal of the Korean Institute of Telematics and Electronics
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    • v.26 no.3
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    • pp.95-104
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    • 1989
  • This paper presents a new shadow testing acceleration scheme for ray tracing called Hybrid Shadow Testing (HST) based on a conditional switching between the conventinal shadow testing method and Crow's shadow volume method, where the shadow polygons as well as the object polygons are registered onto the corresponding cells under the 3-D space subdivision environment. Despite the preprocessing time for the generation and registration of the shadow polygons, the total shadow testing time of the proposed algorithm, HST was approximately 50% of that of the conventional shadow testing method for several examples while the total ray tracing time was typically reduced by 30% from the conventional approach. This due to the selective use of the shadow volume method with a compromise between the maximal utilisation of shadow's spatial coherency and minimising the computational overhead for checking ray intersections with the shadow polygons. A parameter, $N_{th}$ denoting the critical number of shadow polygons between successive reflection points was used as a guideline for switching the shadow testing scheme between the conventional method and shadow volume method. A method for calculating $N_{th}$ from such statistical data as the number of object polygons, average polygon size average peripheral length of the polygons was proposed, resulting in good agreement with the experimental results.

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Direct-to-consumer genetic testing

  • Kim, Jong-Won
    • Genomics & Informatics
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    • v.17 no.3
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    • pp.34.1-34.3
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    • 2019
  • Direct-to-consumer (DTC) genetic testing is a controversial issue although Korean Government is considering to expand DTC genetic testing. Preventing the exaggeration and abusing of DTC genetic testing is an important task considering the early history of DTC genetic testing in Korea. And the DTC genetic testing performance or method has been rarely reported to the scientific and/or medical community and reliability of DTC genetic testing needs to be assessed. Law enforcement needs to improve these issues. Also principle of transparency needs to be applied.