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Object Oriented Fault Detection for Fault Models of Current Testing  

Bae, Sung-Hwan (한려대학교 멀티미디어정보통신공학과)
Han, Jong-Kil (한려대학교 멀티미디어정보통신공학과)
Publication Information
The Journal of the Korea institute of electronic communication sciences / v.5, no.4, 2010 , pp. 443-449 More about this Journal
Abstract
Current testing is an effective method which offers higher fault detection and diagnosis capabilities than voltage testing. Since current testing requires much longer testing time than voltage testing, it is important to note that a fault is untestable if the two nodes have same values at all times. In this paper, we present an object oriented fault detection scheme for various fault models using current testing. Experimental results for ISCAS benchmark circuits show the effectiveness of the proposed method in reducing the number of faults and its usefulness in various fault models.
Keywords
Current Testing; Fault Models; Fault Detection; ISCAS Benchmark Circuits; CMOS VLSI Circuits;
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