• Journal of the Microelectronics and Packaging Society
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• v.26 no.3
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• pp.75-80
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• 2019

Silicon solar cells have been widely used as a most promising renewable energy source due to eco-friendliness and high efficiency. As modules of silicon solar cells are connected in series for a practical electricity generation, a large voltage of 500-1,500 V is applied to the modules inevitably. Potential-induced degradation (PID), a deterioration of the efficiency and maximum power output by the continuously applied high voltage between the module frames and solar cells, has been regarded as the major cause that reduces the lifetime of silicon solar cells. In particular, the migration of the $Na^+$ ions from the front glass into Si through the anti-reflection coating and the accumulation of $Na^+$ ions at stacking faults inside Si have been reported as the reason of PID. In this research, the thickness effect of $SiO_x$ layer that can block the migration of $Na^+$ ions on the reduction of PID is investigated as it is incorporated between anti-reflection coating and p-n junction in p-type PERC solar cells. From the measurement of shunt resistance, efficiency, and maximum power output after the continuous application of 1,000 V for 96 hours, it is revealed that the thickness of $SiO_x$ layer should be larger than 7-8 nm to reduce PID effectively.

• Journal of the Korean Society for Aeronautical & Space Sciences
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• v.45 no.10
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• pp.898-906
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• 2017

This paper discusses the efficient high fidelity calculation of external thermal loads of a spacecraft on its orbit. Thermal loads to a spacecraft consist of three major components, direct solar radiation, earth reflection of solar rays, and earth irradiation. With the assumption that both earth reflection and earth emission are diffuse, thermal loads from earth surface divided into pieces of segments to satellite surfaces are individually calculated and summed over. By using analytical integration of both reflected and emitted heat load by earth, high rate of numerical convergence is achieved and the results are even exactly calculated in special cases. Moreover, KD tree ray tracing is employed in the calculation of thermal load to determine whether the radiated ray is obstructed or not by satellite structure.

• Solar Energy
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• v.11 no.2
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• pp.20-28
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• 1991

The purpose of this paper is found consistent mathematical data of Inter-reflection of calculation as a mean to grasp characteristics reflex of building materials that primarily uses in Building, and that comes in to the market. The measurement of directional characteristics of non-metallic Building Materials is based on seperation measurement of Boundary Reflected and Layer Reflected component using a Reflectmeter with Polarized. And this study analyzed with not only experiment but simulation to furnish basic data for illumination design to daylighting.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2006.06a
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• pp.152-153
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• 2006

본 연구에서는 태양전지 표면에 입사된 광자의 반사손실을 최소화하기 위한 방법으로써 기판 표면에 다공성 실리콘층을 이용한 반사방지막 (Anti-Reflection Coating, ARC)을 형성하는 실험을 하였다. 다공성 실리콘(Porous silicon, PSi)은 실온에서 일정 비율로 만든 전해질 용액($HF-C_2H_5OH-H_2O$)을 사용하여 실리콘 표면을 양극산화처리 함으로써 단순 공정만으로 실리콘 기판의 반사율을 높일 수 있다. 또한 새로운 레이어(layer)없이 기존 기판을 식각시켜 만들기 때문에 박막형 태양전지를 제작시 적용이 용이하다. 저비용, 단순공정의 이점을 살려 전류밀도에 따른 PSi의 반사방지막으로써의 특성을 비교 분석하였다.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.08a
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• pp.300.1-300.1
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• 2013

반사방지막 코팅(Anti-reflection coating)은 태양전지(Solar cell), 발광다이오드(LED) 등의 반사율을 낮추어 효율을 증대시키기 위하여 사용되고 있다. 본 실험에서는 유리 기판 위에 실리콘 타겟을 이용한 Reactive magnetron sputtering 장비를 활용하여, 50~100 mTorr의 높은 공정 압력(High pressure)에서 증착하여 SiO2 반사방지막 코팅층을 형성하였다. Ellipsometer를 이용하여 SiO2 박막층의 굴절률(Refractive index)을 측정한 결과, 공정 압력에 따라 SiO2 박막이 다양한 굴절률을 가지는 것을 확인할 수 있었다. 또한, UV-Vis spectrometer를 이용하여, 450~600 nm 파장에서의 반사율(Reflectance)과 투과율(Transmittance)을 측정하여 비교, 분석하였다. 나아가 증착된 SiO2 반사방지막을 비정질 실리콘 박막 태양전지에 적용하여 효율 향상 효과를 실험하였다. 이를 활용하여 낮은 굴절률을 갖는 반사방지용 SiO2 코팅층을 형성하여 태양전지의 광 변환 효율을 상승 시킬 수 있고, 발광다이오드의 광 추출 효율을 증가시킬 있을 것으로 여겨진다.

• Journal of the Korean Society of Safety
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• v.36 no.2
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• pp.26-31
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• 2021

Buildings with glass curtain walls have become popular due to their appealing aesthetics and ability to let in natural light. However, light reflection from the glass surface is unavoidable in these buildings. In particular, the reflection of light from the glass envelope can create afterimage glare, a hazard to nearby drivers and pedestrians. Despite this potential danger, glare from buildings with curtain walls has not been well-studied. Hence, we analyzed the effect of light reflection on glare around a glass-enclosed skyscraper, depending on its surface reflectance. We investigated the potential hazard of glare to drivers using a commercially available software program. The results indicate that the direction of light reflection is distinctive when the incident angle of solar light increases. Moreover, this light reflection is high enough to induce an afterimage to drivers and pedestrians near the building. We found that keeping the reflectance of the building surface under 3% is required to minimize the afterimage hazard to drivers. Consequently, we recommend managing glass reflectance and installing additional traffic safety systems to reduce traffic accidents near curtain wall buildings.

• Transactions on Electrical and Electronic Materials
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• v.16 no.5
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• pp.264-267
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• 2015

AlCrNO cermet films were prepared on aluminum substrates using a DC-reactive magnetron sputtering method and a water-cooled Al:Cr target. The Al₂O₃/AlCrNO (LMVF)/AlCrNO (MMVF)/AlCrNO (HMVF)/Al/substrate of the 5 multi-layers was prepared according to the Ar and (N₂ + O₂) gas-mixture rates. The Al₂O₃ of the top layer is the anti-reflection layer of triple AlCrNO (LMVF)/AlCrNO (MMVF)/AlCrNO (HMVF) layers, and an Al metal forms the infrared reflection layer. In this study, the crystallinity and surface properties of the AlCrNO thin films were estimated using X-ray diffraction (XRD) and field-emission scanning electron microscopy (FESEM), while the composition of the thin films was systematically investigated using Auger electron spectroscopy (AES). The optical properties of the wavelength spectrum were recorded using UH4150 spectrophotometry (UV-Vis-NIR) at a range of 0.3 μm to 2.5 μm.

• Transactions on Electrical and Electronic Materials
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• v.4 no.3
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• pp.29-33
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• 2003

Tri-crystalline silicon wafers have three different orientations and three-grain boundaries. In this paper, tri-crystalline silicon (tri-Si) wafers have been used for the fabrication of buried contact solar cells. The optical and micro-structural properties of these cells after texturing in KOH solution have been investigated and compared with those of cast mult- crystalline silicon (multi-Si) wafers. We employed a cost effective fabrication process and achieved buried contact solar cell (BCSC) energy conversion efficiencies up to $15\%$ whereas the cast multi-Si wafer has efficiency around $14\%$.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2003.07a
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• pp.176-180
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• 2003

Tri-crystalline silicon (Tri-Si) wafers have three different orientations and three grain boundaries. In this paper, tri-Si wafers have been used for the fabrication of buried contact solar cells. The optical and micro-structural properties of these cells after texturing in KOH solution have been investigated and compared with those of cast multi-crystalline silicon (multi-Si) wafers. We employed a cost effective fabrication process and achieved buried contact solar cell (BCSC) energy conversion efficiencies up to 15% whereas the cast multi-Si wafer has efficiency around 14%.

• Proceedings of the KIEE Conference
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• 2006.07b
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• pp.1201-1202
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• 2006

In this paper, I try to measure characteristic transmission-reflection by environmental change or solar cell. I keep my eye on the characteristics variation of solar cell as environmental change. As a result, A variation caused by voltage by an effect on the efficiency of solar PV cell. Hence, it is an important variable when a designer plan to make a solar cell.