Thickness Effect of SiOx Layer Inserted between Anti-Reflection Coating and p-n Junction on Potential-Induced Degradation (PID) of PERC Solar Cells
![]() |
Jung, Dongwook
(Department of Advanced Materials Engineering, Kyonggi University)
Oh, Kyoung-suk (New & Renewable Energy Research Center, Korea Electronics Technology Institute) Jang, Eunjin (Department of Advanced Materials Engineering, Kyonggi University) Chan, Sung-il (New & Renewable Energy Research Center, Korea Electronics Technology Institute) Ryu, Sangwoo (Department of Advanced Materials Engineering, Kyonggi University) |
1 | X. Gou, X. Li, S. Zhou, S. Wang, W. Fan, and Q. Huang, "PID Testing Method Suitable for Process Control of Solar Cells Mass Production", Int. J. Photoenergy., 2015, 863248 (2015). |
2 | D. Lausch, V. Naumann, O. Breitenstein, J. Bauer, A. Graff, J. Bagdahn, and C. Hagendorf, "Potential-Induced Degradation (PID): Introduction of a Novel Test Approach and Explanation of Increased Depletion Region Recombination", IEEE J. Photovolt., 4, 834 (2014). DOI |
3 | W. Luo, Y. S. Khoo, P. Hacke, V. Naumann, D. Lausch, S. Harvey, J. P. Singh, J. Chai, Y. Wang, A. Aberle, and S. Ramakrishna, "Potential-induced degradation in photovoltaic modules: a critical review", Energy Environ. Sci., 10(1), 43 (2017). DOI |
4 | C. -S. Jiang, C. Xiao, H. R. Moutinho, S. Johnston, M. M. Al-Jassim, X. Yang, Y. Chen, and J. Ye, "Imaging Charge Carriers in Potential-Induced Degradation Defects of c-Si Solar Cells by Scanning Capacitance Microscopy", Sol. Energy., 162, 330 (2018). DOI |
5 | K. S. Oh, S. H. Bae, K. J. Lee, D. H. Kim, and S. I. Chan, "Mitigation of potential-induced degradation (PID) based on anti-reflection coating (ARC) structures of PERC solar cells", Microelectronics Reliability, 113462 (2019). |
6 | D. L. King, B. R. Hansen, J. A. Kratochvil, and M. A. Quintana, "Dark current-voltage measurements on photovoltaic modules as a diagnostic or manufacturing tool", Proc. 26th Photovoltaic Specialists Conference 1997 (PVSC), IEEE (1997). |
7 | S. J. Jeong, S. M. Kim, Y. M. Kang, H. S. Lee, and D. H. Kim, "Use of a Transformed Diode Equation for Characterization of the Ideality Factor and Series Resistance of crystalline Silicon Solar Cells Based on Light I-V Curves", Korean J. Mater. Res., 26(8), 422 (2016). DOI |
8 | G. K. Chang, Y. K. Lim, and J. C. Jeong, "Textured Surface Epitaxial Base Silicon Solar cell", J. Microelectron. Packag. Soc., 10(2), 33 (2003). |
9 | E. L. Meyer, "Extraction of Saturation Current and Ideality Factor from Measuring Voc and Isc of Photovoltaic Modules", International Journal of Photoenergy, 2017, 8479487 (2017). DOI |
10 | I. Martil, and G. Diaz, "Determination of the dark and illuminated characteristic parameters of a solar cell from I-V characteristics", Eur. J. Phys., 13, 193 (1992). DOI |
11 | J. Zhao, A. Wang, X. Dai, M. A. Green, and S. R. Wenham, "Improvements in Silicon Solar Cell Performance", Proc. 22nd Photovoltaic Specialists Conference (PVSC), IEEE (1991). |
12 |
H. G. Hong, and J. Y. Heo, "Study on the Passivation of Si Surface by Incorporation of Nitrogen in |
13 | K. R. McIntosh, and C. B. Honsberg, "The Influence of Edge Recombination on a Solar Cell's IV Curve", Proc. 16th European Photovoltaic Solar Energy Conference (EU PVSEC), Australia, 2052 (2000). |
14 | Y. Ohno, H. Morito, K. Kutsukake, I. Yonenaga, T. Yokoi, A. Nakamura, and K. Matsunaga, "Interaction of sodium atoms with stacking faults in silicon with different Fermi levels", Appl. Phys. Express., 11(6), 061303 (2018). DOI |
15 |
J. H. Hwang, "Renewable energy supply such as solar light in the first half of this year 52% |
16 | V. Naumann, C. Brzuska, M. Werner, S. Grober, and C. Hagendorf, "Investigations on the Formation of Stacking Fault like PID-shunt", Energy Procedia, 92, 569 (2016). DOI |
17 | K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. Hähnel, S. Grosser, M. Turek, and C. Hagendorf, "Microstructural Analysis of Local Silicon Corrosion of Bifacial Solar Cells as Root Cause of Potential-Induced Degradation at the Rear Side", Phys. Status Solidi A, 1900334 (2019). |
18 | V. Naumann, D. Laush, A. Hahnel, J Bauer, O. Breitenstein, A. Graff, M. Werner, S. Swatek, S. Grosser, J. Bagdahn, and C. Hagendorf, "Explanation of potential-induced degradation of the shunting type by Na decoration of stacking faults in Si solar cell", Sol. Energ. Mat. Sol. C., 120, 383 (2014). DOI |
19 | S. S. Baik, S. Y. Baek, T. W. Jung, and J. H. Cho, "A Study on Validity of Anti-PID Technology on Solar Cell for the High Reliability of Photovoltaics System", J. Soc. Korea Ind. Syst. Eng., 36(2), 32 (2013). DOI |
20 | V. Naumann, D. Lausch, S. Grosser, M. Werner, S. Swatek, C. Hagendorf, and J. Bagdahn, "Microstructural Analysis of Crystal Defects Leading to Potential-Induced Degradation (PID) of Si Solar Cells", Energy Procedia, 33, 76 (2013). DOI |
21 | P. Saint-Cast, H. Nagel, D. Wagenmann, J. Schon, P. Schmitt, C. Reichel, S. W. Glunz, M. Hofmann, J. Rentsch, and R. Preu, "Potential-induced degradation on cell level: The inversion model", Proc. 28th European PV Solar Energy Conference and Exhibition, Paris, France (2013). |
22 | C. Taubitz, M. Schutze, and M. B. Koentopp, "Towards a kinetic model of potential-induced shunting", Proc. 27th European Photovoltaic Solar Energy Conference and Exhibition, Frankfurt, Germany, 3172 (2012). |
23 | H. B. Kim, T. H. Jung, G. H. Kang, and H. S. Chang, "The Effect of PID Generation by Components of the PV Module", J. Korean Inst. Electr. Electron. Mater. Eng., 26, 760 (2013). DOI |
24 | B. Ziebarth, M. Mrovec, C. Elsässer, and P. Gumbsch, "Potential-induced degradation in solar cells: Electronic structure and diffusion mechanism of sodium in stacking faults of silicon", J. Appl. Phys., 116, 093510 (2014). DOI |
25 | S. H. Bae, W. W. Oh, S. M. Kim, Y. D. Kim, S. G. Park, Y. M. Kang, H. S. Lee, and D. W. Kim, "Potential Induced Degradation (PID) of Crystalline Silicon Solar Modules", Korean J. Mater. Res., 24(6), 326 (2014). DOI |
26 |
J. Oh, B. Dauksher, S. Bowden, G. Tamizhmani, P. Hacke, and J. D' Amico, "Further Studies on the Effect of |
![]() |