Thickness Effect of SiOx Layer Inserted between Anti-Reflection Coating and p-n Junction on Potential-Induced Degradation (PID) of PERC Solar Cells |
Jung, Dongwook
(Department of Advanced Materials Engineering, Kyonggi University)
Oh, Kyoung-suk (New & Renewable Energy Research Center, Korea Electronics Technology Institute) Jang, Eunjin (Department of Advanced Materials Engineering, Kyonggi University) Chan, Sung-il (New & Renewable Energy Research Center, Korea Electronics Technology Institute) Ryu, Sangwoo (Department of Advanced Materials Engineering, Kyonggi University) |
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