• Proceedings of the KIPE Conference
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• 1998.11a
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• pp.55-59
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• 1998

By this time, Diode Rectifier or SCR has been used to gain DC Voltage for Electrolysis Power. Generally DC Voltage is produced from rectifier shall be transformed before rectifier using step-down transformer to obtain adaptable DC Voltage, rectifier output. In the same way, rectifier using SCR shall obtain output voltage after step-down voltage through transformer and control of the SCR firing angle. Transformer shall be used for this two methods to adjust the voltage. But the size and weight of the transformer are increased in accordance with the increase of capacity, and the hardships are accompanied in workspace or transportation. Besides, only the value of input voltage is possible to be regulated, and the expectation of current control is almost impossible during Electrolysis. This study has conducted Design and Simulation to reduce the size and weight of transformer and to be enable voltage and current control of Electrolysis power through high-speed switching using Inverter, Electronics device.

• Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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• v.26 no.8
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• pp.96-101
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• 2012

A surge protection device of the metal oxide varistor(MOV) has been commonly used for preventing electrical damage in many electronic equipments. The MOV has a property that leakage current is increased and might be permanently damaged when it is exposed continuously to the electrical stresses such as lightening surges. In this paper, we propose a novel surge protection circuit adopting a silicon controlled rectifier(SCR) in the traditional protection circuits using the MOV device simultaneously. When lightning surges are injected to the proposed circuit, the MOV lets the surge pulses bypassing through the ground at first up to the level that SCR begins to operate. Above the threshold level of turning on the SCR, the SCR operates bypasses large surge currents to the ground. Proposed circuit was verified with a leakage current experiment and PSpice circuit simulations under the repeated surge injection environment.

• Journal of IKEEE
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• v.23 no.4
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• pp.1309-1313
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• 2019

In this paper, the electrical characteristics of Gate grounded NMOS(GGNMOS), Lateral insulated gate bipolar transistor(LIGBT), Silicon Controlled Rectifier(SCR), and Proposed ESD protection device were compared and analyzed. First, the trigger voltage and holding voltage were verified by simulating the I-V characteristic curve for each device. After that, the robustness was confirmed by HBM 4k simulation for each device. As a result of HBM 4k simulation, the maximum temperature of the proposed ESD protection device is lower than that of GGNMOS and GGLIGBT and SCR, which means that the robustness is improved, which means that the ESD protection device is excellent in terms of reliability.

• Proceedings of the KIEE Conference
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• 2006.07c
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• pp.1370-1371
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• 2006

An electrostatic discharge (ESD) protection device, so called, N-type extended drain silicon controlled rectifier (NEDSCR) device, was analyzed for high voltage I/O applications. A conventional NEDSCR device shows typical SCR-like characteristics with extremely low snapback holding voltage. This may cause latchup problem during normal operation. However, a modified NEDSCR device with proper junction / channel engineering demonstrates itself with both the excellent ESD protection performance and the high latchup immunity.

• Journal of Satellite, Information and Communications
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• v.9 no.3
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• pp.15-21
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• 2014

An electrostatic discharge (ESD) protection device, so called, N-type embedded silicon controlled rectifier (NESCR), was analyzed for high voltage operating I/O applications. A conventional NESCR standard device shows typical SCR-like characteristics with extremely low snapback holding voltage, which may cause latch-up problem during normal operation. However, our modified NESCR_CPS_PPW device with proper junction/channel engineering such as counter pocket source (CPS) and partial P-well structure demonstrates highly latch-up immune current-voltage characteristics with high snapback holding voltage and on-resistance.

• Korea Science and Art Forum
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• v.20
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• pp.421-428
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• 2015

Electronic/hybrid car and electroplating rectifier should have switching devices such as SCR, MOSFET, IGBT. And those switching devices should be operated by gate driver. In this paper, we propose high power gate driver that contains H-Bridge using 4 BJTs. H-Bridge and transformer generate isolate power. And gate control signal is transferred to isolated one by photo coupler and operate real switching device. We designed H-Bridge and 555-Timer by PSpice simulation and manufactured real product. Finally we succeed to operate 27V 50,000A electroplating rectifier using proposed gate driver.

• Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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• 1996.11a
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• pp.104-108
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• 1996

This paper deals with the design considerations and characteristics analysis of a SCR rectifier in pulsed over load operation. The Pulse repetition rate is one every 150 seconds and each current pulse width is 10 seconds. Therefore the characteristics of the transformer and SCR rectifier which consist the pulsed DC power supply are different from those of the conventional AC/DC power converters having continuous load. The variations of the DC output voltage drop, PF and THD versus the %Z of the transformer is analyzed through simulations and the experimental results thought to be useful in design high power pulsed DC power suppler.

• Journal of IKEEE
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• v.19 no.2
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• pp.265-270
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• 2015

In this paper, we proposed a dual-directional SCR (silicon-controlled rectifier) based ESD (electrostatic discharge) protection circuit. In comparison with conventional SCR, this ESD protection circuit can provide an effective protection against ESD pulses in the two opposite directions, so the ESD protection circuit can be discharged in two opposite direction. The proposed circuit has a higher holding voltage characteristic than conventional SCR. These characteristic enable to have latch-up immunity under normal operating conditions as well as superior full chip ESD protection. it was analyzed to figure out electrical characteristics in term of individual design parameters. They are investigated by using the Synopsys TCAD simulator. In the simulation results, it has trigger voltage of 6.5V and holding voltage increased with different design parameters. The holding voltage of the proposed circuit changes from 2.1V to 6.3V and the proposed circuit has symmetrical I-V characteristic for positive and negative ESD pulse.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2010.06a
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• pp.10-10
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• 2010

ESD (Electrostatic Discharge) phenomenon occurs in everywhere and especially it damages to semiconductor devices. For ESD protection, there are some devices such as diode, GGNMOS (Gate-Grounded NMOS), SCR (Silicon-Controlled Rectifier), etc. Among them, diode and GGNMOS are usually chosen because of their small size, even though SCR has greater current capability than GGNMOS. In this paper, a novel SCR is proposed on the SOI (Silicon-On-Insulator) structure which has $1{\mu}m$ film thickness. In order to design and confirm the proposed SCR, TSUPREM4 and MEDICI simulators are used, respectively. According to the simulation result, although the proposed SCR has more compact size, it's electrical performance is better than electrical characteristics of conventional GGNMOS.

• Journal of Satellite, Information and Communications
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• v.8 no.4
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• pp.124-129
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• 2013

An electrostatic discharge (ESD) protection device, so called, N-type SCR with P-type MOSFET pass structure (NSCR_PPS), was analyzed for high voltage I/O applications. A conventional NSCR_PPS device shows typical SCR-like characteristics with extremely low snapback holding voltage, which may cause latch-up problem during normal operation. However, a modified NSCR_PPS device with counter pocket source(CPS) and partial p-type well(PPW) structure demonstrates highly latch-up immune current-voltage characteristics.