• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2008.11a
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• pp.151-151
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• 2008

바이폴러 트랜지스터(이하 BJT)의 고온 콜렉터-베이스 역전압 수명시험을 실시하였고, 수영시험 전후의 특성평가를 통해 BJT의 고장모드를 분석하였다. 시험조건은 주위온도 $150^{\circ}C$에서 콜렉터-베이스 정격 역전압의 80%를 인가한 상태에서 실시하였으며, 시료수는 57개이고 최종 목표 시험시간은 2,000시간이다. 중간측정을 통해 BJT의 특성열화를 관찰하였으며, 1,500시간 경과 후 1개 시료에서 제품규격을 벗어나는 데이터가 측정되었다. 해당 시료를 분석한 결과 콜렉터-베이스 누설전류 및 전류이득($\beta$)이 증가하였고, 저주파에서의 junction capacitance 가 정상품 대비 크게 관찰되었다. 측정결과를 통해 누설전류 증가 및 이득이 증가한 원인을 추정하였다.

• IEIE Transactions on Smart Processing and Computing
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• v.3 no.6
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• pp.410-415
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• 2014

This paper presents a new rectifier with a bootstrapping technique to reduce the effective drop voltage. An all-digital delay locked loop (ADDLL) circuit was also applied to prevent the reverse leakage current. The proposed rectifier uses NMOS diode connected instead of PMOS to reduce the design size and improve the frequency respond. All the sub-circuits of ADDLL were designed with low power consumption to reduce the total power of the rectifier. The rectifier was implemented in CMOS $0.35{\mu}m$ technology. The peak power conversion efficiency was 76 % at an input frequency of 6.78MHz and a power level of 5W.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.20 no.5
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• pp.415-420
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• 2007

Generally, a diode package consists of the synthetic resin that has good durability but low thermal conductivity. The surface mounted type fast recovery diode was fabricated by using ceramic package. Its main manufacture processes are composed of soldering, sillicon coating and side termination. And it has various advantages that diode is small, easy manufacture and fast cooling. The electric characteristics of the diode such as reverse recovery time, breakdown voltage, forward voltage, and leakage current were 5.28 ns, 1322 V, 1.08 V, $0.45\;{\mu}A$, respectively.

• Transactions on Electrical and Electronic Materials
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• v.12 no.4
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• pp.148-151
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• 2011

We designed and fabricated aluminium gallium nitride (AlGaN)/GaN high electron mobility transistors (HEMTs) with stable reverse blocking characteristics established by employing a selective fluoride plasma treatment on the drainside gate edge region where the electric field is concentrated. Implanted fluoride ions caused a depolarization in the AlGaN layer and introduced an extra depletion region. The overall contour of the depletion region was expanded along the drift region. The expanded depletion region distributed the field more uniformly and reduced the field intensity peak. Through this field modulation, the leakage current was reduced to 9.3 nA and the breakdown voltage ($V_{BR}$) improved from 900 V to 1,400 V.

• Journal of Power Electronics
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• v.16 no.1
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• pp.74-83
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• 2016

A new family of zero-voltage-transition converters with synchronous rectification is introduced in this study. Soft switching condition for all the converter operating points is provided in the proposed converters. The reverse recovery losses of the rectifier switch body diode are also eliminated. In comparison with the main switch voltage stress, the auxiliary switch voltage stress is reduced significantly. The auxiliary switch does not need the floating gate drive. The auxiliary inductor is coupled with the main converter inductor, and the leakage inductor is used as the resonance inductor. Thus, all inductors of the proposed converter can be implemented on a single core. The other features of the proposed converters include no extra voltage and current stresses on the main converter semiconductor elements. Theoretical analysis for a synchronous buck converter is presented in detail, and the validity of the theoretical analysis is justified with the experimental results of a prototype buck converter with 180 W and 80 V to 30 V.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.24 no.11
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• pp.1091-1097
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• 2013

This paper presents a rectifier with comparator using unbalanced body biasing in $0.11{\mu}m$ RF CMOS process. It is composed of MOSFETs and two comparators. The comparator is used to reduce reverse leakage current which occurs when the load voltage is higher than input voltage. For the comparator, unbalanced body biasing is devised. By using unbalanced body biasing, reference voltage for comparator changing from high state to low state is increased, and it reduces time interval for leakage current to flow. 13.56 MHz 2 Vpp signal is used for input and $1k{\Omega}$ resistor and 1 nF capacitor are used for output load for simulation and experimental environment. In simulation environment, voltage conversion efficiency(VCE) is 87.5 % and Power conversion efficiency(PCE) is 50 %. When the rectifier is measured, VCE shows 90.203 % and PCE shows 45 %.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.31A no.8
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• pp.80-90
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• 1994

The ultra shallow junction was formed by 2-step RTP. Phosphorus solid source(P$_{2}O_{5}$) was transfered on wafer surface during RTG(Rapid Thermal Glass Transfer) of which process condition was 80$0^{\circ}C$ and 60sec. The process temperature and time of the RTD(Rapid Thermal Diffusion) were 950~105$0^{\circ}C$ during 5~15sec respectively sheet resistances were measured as 175~320$\Omega$/m and junction depth and dopth and dopant surface concentration were measured as 0.075~0.18$\mu$m and 5${\times}10^{19}cm^{4}$ respectively. Ti-silicide was formed by 2-step RTA after 300$\AA$ Titanium was deposited. The 1st RTA (2nd RTA) was carried out at the temperature of $600^{\circ}C$(700~80$0^{\circ}C$) for 30 seconds (10~60 seconds) under N$_2$ ambient. Sheet resistances after 2nd RTA were measured as 46~63$\Omega$/D. Si/Ti component ratio was evaulated as 1.6~1.9 from Auger depth profile. Ti-Silicided n-p junction diode (pattern size : 400$\times$400$\mu$m) was fabricated under the RTD(the process was carried out at the temperature of 100$0^{\circ}C$ for 10seconds) and 2nd RTA(theprocess was carried out at the temperature of 750$^{\circ}C$ for 60 seconds). Leakage current was measured 1.8${\times}10^{7}A/mm^{2}$ at 5V reverse voltage. Whent the RTD process condition is at the temperature of 100$0^{\circ}C$ for 10seconds and the 2nd RTA process condition is at the temperature of 75$0^{\circ}C$ for 60 seconds leakage current was 29.15${\times}10^{9}A$(at 5V).

• Journal of Power Electronics
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• v.16 no.5
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• pp.1639-1649
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• 2016

This paper presents a family of soft-switching DC-DC converters with a simple auxiliary circuit consisting of a coupled winding and a pair of auxiliary switch and diode. The auxiliary circuit is activated in a short interval and thus the circulating conduction losses are small. With the auxiliary circuit, zero-voltage-switching (ZVS) and zero-current-switching are achieved for the main and auxiliary switches respectively, over wide input voltage range and load variation. In addition, the reverse-recovery problem of diodes is significantly alleviated because of the leakage inductor. Furthermore, the coupled inductor simultaneously serves as the main and auxiliary inductors, contributing to reduced magnetic component in comparison with the conventional zero-voltage-transition (ZVT) converters. Experimental results based on a 500 W prototype buck circuit validate the advantages and effectiveness of the proposed magnetic coupling ZVS converter.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1994.05a
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• pp.152-153
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• 1994

A recessed $n^{+}$-p junction diode with the serf-aligned structure is proposed and fabricated by using the polysilicon as an $n^{+}$ diffusion source. The diode structure can be applicable to the emitter-base formation of high performance bipolar device and the $n^{+}$ polysilicon emitter has an important effect on the device characteristics. The considered parameters for the polysilicon formation are the deposition condition $As^{+}$ dose for the doping of the polysilicon, and the annealing using RTP system. The vertical depth profiles of the fabricated diode are obtained by SIMS. The eleotrical characteristics are analyzed in trims of the ideality factor of diode (n), contact resistance arid reverse leakage current. The $As_{+}$ dose for the formation of good junction is current. The $As^{+}$ dose for the formation of goodjunctions is about 1∼2${\times}$$10^{16}$$cm^{-2}$ at given RTA condition ($1100^{\circ}C$, 10 sec). The $n^{+}$-p structure is successfully applied to the self-aligned bipolar device adopting a single polysilicon technology.

• Journal of Power Electronics
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• v.19 no.2
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• pp.363-379
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• 2019

Resonant converters have attracted a lot of attention because of their high efficiency due to the soft-switching performance. An isolated high step-up converter with secondary-side resonant loops is proposed and analyzed in this paper. By placing the resonant loops on the secondary side, the current stress for the resonant capacitors is greatly reduced. The power loss caused by the equivalent series resistance of the resonant capacitor is also decreased. Clamp diodes in parallel with the resonant capacitors ensure a unique discontinuous current mode in the converter. Under this mode, the active switches can realize soft-switching during both turn-on and turn-off transitions. Meanwhile, the reverse-recovery problems of diodes are also alleviated by the leakage inductor. The converter is essentially a step-up converter. Therefore, it is helpful for decreasing the transformer turn-ratio when it is applied as a high step-up converter. The steady-state operation principle is analyzed in detail and design considerations are presented in this paper. Theoretical conclusions are verified by experimental results obtained from a 500W prototype with a 35V-42V input and a 400V output.