• 대한전기학회논문지
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• 제43권6호
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• pp.951-957
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• 1994

We present a new model for the series resistance of inverted-staggered amorphous silicon (a-Si) thin film transistors (TFT's) by employing the current spreading under the source and the drain contacts as well as the space charge limited current model. The calculated results based on our model have been in good agreements with the measured data over a wide range of applied voltage, gate-to-source and gate-to-drain overlap length, channel length, and operating temperature. Our model shows that the contribution of the series resistances to the current-voltage (I-V) characteristics of the a-Si TFT in the linear regime is more significant at low drain and high gate voltages, for short channel and small overlap length, and at low operating temperature, which have been verified successfully by the experimental measurements.

• ETRI Journal
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• 제33권3호
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• pp.462-465
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• 2011

A millimeter-wave (mm-wave) high-linear low-noise amplifier (LNA) is presented using a 0.18 ${\mu}m$ standard CMOS process. To improve the linearity of mm-wave LNAs, we adopted the multiple-gate transistor (MGTR) topology used in the low frequency range. By using an MGTR having a different gate-source bias at the last stage of LNAs, third-order input intercept point (IIP3) and 1-dB gain compression point ($P_{1dB}$) increase by 4.85 dBm and 4 dBm, respectively, without noise figure (NF) degradation. At 33 GHz, the proposed LNAs represent 9.5 dB gain, 7.13 dB NF, and 6.25 dBm IIP3.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 2006년도 하계종합학술대회
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• pp.557-558
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• 2006

In this paper, the hysteresis characteristics by bias stress in organic thin film transistors using inkjet printing were investigated. Electron trapping increased threshold voltage for positive gate bias stress and hole trapping decreased threshold voltage for negative gate bias stress. From these phenomena, highly reproducible measurement method which minimized threshold voltage shift by choosing the proper range of gate voltage was suggested. Using this measurement method, we found that electron trapping as well as hole trapping had important influence on hysteresis characteristics.

• 유공압시스템학회논문집
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• 제1권4호
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• pp.1-8
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• 2004

The optimum design parameters of several hydraulic systems are obtained using the complex method that is one kind of constrained direct search method. First, the parameters of lead-lag controller of the direct drive servovalve is designed using the complex method to satisfy the steady-state error requirement. Second, the optimum locating point of hydraulic cylinder Is determined to minimize the cylinder force in the operation range of rotational sluice gate. For the third application case, the optimum piston area of hydraulic cylinder is determined to minimize the man power to elevate the manually operated sluice gate.

• Advances in nano research
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• 제15권3호
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• pp.263-275
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• 2023

The electron transport properties of Y-type zigzag branched carbon nanotubes (CNTs) are of great significance for micro and nano carbon-based electronic devices and their interconnection. Based on the semi-empirical method combining tight-binding density functional theory and non-equilibrium Green's function, the electron transport properties between the branches of Y-type zigzag branched CNT are studied. The results show that the drain-source current of semiconducting Y-type zigzag branched CNT (8, 0)-(4, 0)-(4, 0) is cut-off and not affected by the gate voltage in a bias voltage range [-0.5 V, 0.5 V]. The current presents a nonlinear change in a bias voltage range [-1.5 V, -0.5 V] and [0.5 V, 1.5 V]. The tangent slope of the current-voltage curve can be changed by the gate voltage to realize the regulation of the current. The regulation effect under negative bias voltage is more significant. For the larger diameter semiconducting Y-type zigzag branched CNT (10, 0)-(5, 0)-(5, 0), only the value of drain-source current increases due to the larger diameter. For metallic Y-type zigzag branched CNT (12, 0)-(6, 0)-(6, 0), the drain-source current presents a linear change in a bias voltage range [-1.5 V, 1.5 V] and is symmetrical about (0, 0). The slope of current-voltage line can be changed by the gate voltage to realize the regulation of the current. For three kinds of Y-type zigzag branched CNT with different diameters and different conductivity, the current-voltage curve trend changes from decline to rise when the branch of drain-source is exchanged. The current regulation effect of semiconducting Y-type zigzag branched CNT under negative bias voltage is also more significant.

• 전자공학회논문지
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• 제52권4호
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• pp.88-95
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• 2015

본 논문에서는 부성저항을 생성하는 회로로 알려진 RFNR 회로에 대한 새로운 분석을 소개한다. 새로운 분석에서는 RFNR 회로에 대한 수식분석의 정확성을 높이기 위해 트랜지스터의 게이트 저항과 소스 커패시턴스에 의한 영향을 고려하였다. 기존의 분석에서는 트랜지스터의 소스를 통하여 수식을 분석하였지만 제안된 수식에서는 회로의 공진부인 트랜지스터의 게이트를 통하여 회로를 분석했다. 그 결과, 제안하는 분석은 고주파수에서 기존의 분석보다 정확도를 향상시킬 수 있었다. 본 논문에서는 시뮬레이션을 통해 고주파수에서 분석의 정확도를 검증하였다.

• 전자공학회논문지
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• 제52권6호
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• pp.137-143
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• 2015

Field-programmable gate array (FPGA) 기반 시간-디지털 변환기 (time-to-digital converter: TDC)는 구조가 단순하고, 빠른 변환속도를 갖는 딜레이 라인 (delay-line) 방식을 주로 사용한다. 하지만 딜레이 라인 방식 TDC의 시간 측정범위를 늘리기 위해서는 딜레이 라인의 길이가 길어지므로 사용되는 소자가 많아지고, 비선형성으로 인한 오차가 증가하는 단점이 있다. 따라서 본 논문은 동일한 길이의 딜레이 라인에 펄스 트레인 (pulse-train)을 입력하여 시간 측정범위를 향상시키고, 리소스를 효율적으로 사용하는 방식을 제안한다. 펄스 트레인 입력 방식의 TDC는 긴 시간을 측정하기 위하여 시작신호의 입력과 동시에 4-천이 (transition) 펄스 트레인이 딜레이 라인에 입력된다. 그리고 동기회로 (synchronizer) 대신 천이 상태 검출부를 설계하여 중지신호 입력 시 사용된 천이를 판별하고, 준안정 상태 (meta-stable state)를 피하면서 딜레이 라인의 길이를 줄이는 구조를 갖는다. 제안한 TDC는 72개의 딜레이 셀 (delay cell)을 사용하였고, 파인부 (fine interpolator)의 성능 측정 결과, 시간 측정범위는 5070 ps, 평균 분해능은 20.53 ps, 최대 비선형성은 1.46 LSB였으며, 시간 측정범위는 계단 (step) 파형을 입력신호로 사용하는 기존 방식 대비 약 343 % 향상되었다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2000년도 춘계학술대회 논문집 전자세라믹스 센서 및 박막재료 반도체재료 일렉트렛트 및 응용기술
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• pp.10-13
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• 2000

The notching effect in etching of un doped amorphous silicon gate had different characteristics and mechanism comparing with reported ones. The undoped amorphous silicon was etched by using HBr gas plasma, First, in the region of small line width, the potential was increased as a result of ions in the exposed surface of oxide, and the incident ions between the small line width were deflected more wide range, therefore the depth of notching was shallow and wide, Second, in the region of large line width of gate, electrons were charged on the top of photoresist and the side of gate, a part of ions deflected, The deflected ions were locally charged positive on the side of gate, and then the potential difference was produced, therefore, ions stored up more at independent line than at dense line, and nothing became deeper by Br ion bombardment.

• JSTS:Journal of Semiconductor Technology and Science
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• 제15권4호
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• pp.462-470
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• 2015

In this study, we analyze the impacts of the trapezoidal fin shape of a double-gate FinFET on the electrical characteristics of circuits. The trapezoidal nature of a fin body is generated by varying the angle of the sidewall of the FinFET. A technology computer-aided-design (TCAD) simulation shows that the on-state current increases, and the capacitance becomes larger, as the bottom fin width increases. Several circuit performance metrics for both digital and analog circuits, such as the fan-out 4 (FO4) delay, ring oscillator (RO) frequency, and cut-off frequency, are evaluated with mixed-mode simulations using the 3D TCAD tool. The trapezoidal nature of the FinFET results in different effects on the driving current and gate capacitance. As a result, the propagation delay of an inverter decreases as the angle increases because of the higher on-current, and the FO4 speed and RO frequency increase as the angle increases but decrease for wider angles because of the higher impact on the capacitance rather than the driving strength. Finally, the simulation reveals that the trapezoidal angle range from $10^{\circ}$ to $20^{\circ}$ is a good tradeoff between larger on-current and higher capacitance for an optimum trapezoidal FinFET shape.

• 한국정보통신학회논문지
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• 제16권10호
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• pp.2267-2272
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• 2012

본 연구에서는 이중게이트 MOSFET에서 스켈링 이론에 대한 문턱전압이하 스윙을 분석하였다. 포아송방정식의 해석학적 전위분포를 구하기 위하여 가우스 전하분포를 이용하였다. 문턱전압이하 스윙의 저하와 같은 단채널 효과를 분석하기 위하여 스켈링이론이 사용되었으며 이중게이트 MOSFET의 특성상 두 개의 게이트 효과를 포함하기 위하여 일반적인 스켈링 이론을 수정하였다. 게이트길이에 대한 스켈링인자가 일반적인 스켈링인자의 1/2일 때 문턱전압이하 스윙의 저하현상이 매우 빠르게 감소하였으며 가우스함수의 이온주입범위 및 분포편차도 문턱전압이하 스윙에 영향을 미치는 것을 알았다.