• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2004.07b
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• pp.1042-1045
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• 2004

ITO thin films ($\sim150nm$) are deposited on glass substrates by different deposition condition. The sheet resistance of ITO thin films measured by using a four probe station. The microstructure of these films is determined using a X-ray diffractometer (XRD) and a scanning electron microscope (SEM) and a atomic force microscope (AEM). The sheet resistance of ITO thin films compared $s_11$ values by using a near field scanning microwave microscope.

• Journal of IKEEE
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• v.22 no.2
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• pp.510-513
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• 2018

Recently, EMC (electromagnetic compatibility) becomes very important, which demands the measurement of EMI (electromagnetic interference) in the chip level. NFS (near-field scanning) systems defined in IEC 61967 and IEC 62508 are typical methods to analyze EMI in the chip level. As chips becomes faster, frequency measurement of NFS system should become wideband, but it degrades SNR (singal-to-noise ratio) of the NFP (near-field probe). This paper surveys SNR enhancement technologies of the NFS while maintaining wideband characteristics.

• Korean Journal of Optics and Photonics
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• v.10 no.4
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• pp.267-272
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• 1999

We attached a fiber tip on the branch of a quartz crystal oscillator in order to make a feedback control system for near field optical microscope. The electrical impedance of the quartz crystal oscillator depends on the distance between the surface of the sample and the tip caused by the surface damping. Using this method, we can directly monitor the distance between the sample and the tip without inserting extra beam which might give extra optical noise. We characterize the XY scanning resolution and the amplitude of the vibrating tip and the Z-dependent decay of the evanescent wave.

• ETRI Journal
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• v.26 no.3
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• pp.189-194
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• 2004

We demonstrate a high-speed recording based on field-induced manipulation in combination with an optical reading of recorded bits on Au cluster films using the atomic force microscope (AFM) and the near-field scanning optical microscope (NSOM). We reproduced 50 nm-sized mounds by applying short electrical pulses to conducting tips in a non-contact mode as a writing process. The recorded marks were then optically read using bent fiber probes in a transmission mode. A strong enhancement of light transmission is attributed to the local surface plasmon excitation on the protruded dots.

• Journal of electromagnetic engineering and science
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• v.9 no.2
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• pp.105-109
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• 2009

The problem of electromagnetic coupling between a slit fed by a flanged parallel-plate waveguide(PPW) and a slit in an infinite nearby conducting screen parallel to the flanged ground conductor is studied as a simplified problem for a near-field scanning microscopy(NSM). The method of moments isused to solve the coupled integral equations for the electric field distributions over the slits. The performance of the proposed apparatus as an NSM is tested by examining the effects of some geometrical parameters on the equivalent slit admittance and coupled powers through the slits.

• The Journal of the Korea Contents Association
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• v.4 no.2
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• pp.28-35
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• 2004

The improvement of a near-field measurement for an antenna is investigated. We propose the formula of a circular cylindrical scanning based on the Cartesian coordinate. Proposed algorithm for the circular cylindrical Scanning is compared with the exact solution for a Hertzian dipole antenna, thus confirming that our approach is useful for most practice measurements.

• Journal of the Korean Society for Precision Engineering
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• v.22 no.12 s.177
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• pp.7-15
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• 2005

• Proceedings of the Optical Society of Korea Conference
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• 2001.02a
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• pp.122-123
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• 2001

본 연구에서는 주사 근접장 광학 현미경(Near-field Scanning Optical Microscope, 이하 NSOM이라 한다)을 이용하여 빛이 전파되고 있는 광 도파로 주변에 형성되는 evanescent field를 측정함으로써 광도파로 내부에서의 빛의 전파특성을 알아보았다. 광소자의 설계에 있어서 광도파로 내부에서의 빛이 어떻게 전파되어지는 가는 매우 중요한 인자가 된다. (중략)

• Journal of Electrical Engineering and Technology
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• v.13 no.1
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• pp.406-412
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• 2018

In this paper, we propose a narrow resonant waveguide probe that can improve the measurement sensitivity in near-field scanning microwave microscopy. The probe consists of a metal waveguide incorporating the following two sections: a straight section at the tip of the probe whose cross-section is a double-ridged rectangle, and whose height is much smaller than the waveguide width; and a standard waveguide section. The advantage of the narrow waveguide is the same as that of the quarter-wave transformer section i.e., it achieves impedance-matching between the sample under test (SUT) and the standard waveguide. The design procedure used for the probe is presented in detail and the performance of the designed resonant probe is evaluated theoretically by using an equivalent circuit. The calculated results are compared with those obtained using the finite element method (Ansoft HFSS), and consistency between the results is demonstrated. Furthermore, the performance of the fabricated resonant probe is evaluated experimentally. At X-band frequencies, we have measured the one-dimensional scanning reflection coefficient of the SUT using the probe. The sensitivity of the proposed resonant probe is improved by more than two times as compared to a conventional waveguide cavity type probe.

• Korean Journal of Optics and Photonics
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• v.13 no.4
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• pp.301-307
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• 2002

The propagation characteristic of an optical waveguide was investigated by measuring with a near-field scanning optical microscope (NSOM) the evanescent field formed at the neighbor of its core-cladding interface. For this purpose, the NSOM system was developed specially as a form of Photon scanning tunneling microscope. The evanescent field distributions of several channel waveguides were measured at the wavelength of 1550 ㎚, and the usefulness of the system was verified by comparing experimental results with simulation results. In particular, the interference phenomena of the guided modes during their propagation along a multimode channel waveguide could be observed directly from the measured evanescent field distribution.