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http://dx.doi.org/10.3807/KJOP.2002.13.4.301

Characterization of optical waveguides with near - field scanning optical microscope  

Ji, Won-Soo (School of Information and Communication Engineering, Inha University)
Kim, Dae-Chan (School of Information and Communication Engineering, Inha University)
Lee, Seung-Gol (School of Information and Communication Engineering, Inha University)
O, Beom-Hoan (School of Information and Communication Engineering, Inha University)
Lee, El-Hang (School of Information and Communication Engineering, Inha University)
Publication Information
Korean Journal of Optics and Photonics / v.13, no.4, 2002 , pp. 301-307 More about this Journal
Abstract
The propagation characteristic of an optical waveguide was investigated by measuring with a near-field scanning optical microscope (NSOM) the evanescent field formed at the neighbor of its core-cladding interface. For this purpose, the NSOM system was developed specially as a form of Photon scanning tunneling microscope. The evanescent field distributions of several channel waveguides were measured at the wavelength of 1550 ㎚, and the usefulness of the system was verified by comparing experimental results with simulation results. In particular, the interference phenomena of the guided modes during their propagation along a multimode channel waveguide could be observed directly from the measured evanescent field distribution.
Keywords
NSOM; Photonic device; Waveguide; evanescent field;
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