Journal of IKEEE (전기전자학회논문지)

Institute of Korean Electrical and Electronics Engineers (한국전기전자학회)
권호 표지
DOI QR코드

DOI QR Code

Enhancement Technologies of Signal-to-Noise Ratio in the Near-Field Scanning Systems

근거리 전자장 스캐닝 시스템의 잡음 대 성능 비 향상 기술

  • Shin, Youngsan (School of Electronic Engineering and Research Institute of Future Automobile, Soongsil University) ;
  • Lee, Seongsoo (School of Electronic Engineering and Research Institute of Future Automobile, Soongsil University)
  • Received : 2018.04.29
  • Accepted : 2018.05.29
  • Published : 2018.06.30
Download PDF
⟨ Previous Next ⟩

Abstract

Recently, EMC (electromagnetic compatibility) becomes very important, which demands the measurement of EMI (electromagnetic interference) in the chip level. NFS (near-field scanning) systems defined in IEC 61967 and IEC 62508 are typical methods to analyze EMI in the chip level. As chips becomes faster, frequency measurement of NFS system should become wideband, but it degrades SNR (singal-to-noise ratio) of the NFP (near-field probe). This paper surveys SNR enhancement technologies of the NFS while maintaining wideband characteristics.

최근 전자파 적합성(EMC: electromagnetic compatibility)의 중요성이 매우 높아짐에 따라 칩 수준에서의 전자파 간섭(EMI: electromagnetic interference) 측정이 자주 요구되고 있다. IEC 61967 및 IEC 62508에서 규정된 근거리 전자장 스캐닝(NFS: near-field scanning) 시스템은 칩 레벨에서의 전자파 간섭을 분석하는 대표적인 방법이다. 칩이 점점 고속화되면서 근거리 전자장 스캐닝 시스템의 측정 주파수는 광대역화되어야 하지만 근거리 전자장 탐침(NFP: near-field probe)의 신호 대 잡음 비(SNR: signal-to-noise ratio)가 저하된다는 문제가 있다. 본 논문에서는 근거리 전자장 스캐닝 시스템에서 광대역 특성을 가지면서도 잡음 대 성능 비를 향상시키는 기술에 대해 살펴본다.

Keywords

References

  1. T. Park, J. Wee, and S. Lee, "A Low EMI Spread Spectrum Clock Generator Using TIE-Limited Frequency Modulation Technique," j.inst.Korean.electr.electron.eng, vol. 17, no. 4, pp. 537-543, 2013.DOI : 10.7471/ikeee.2013.17.4.537
  2. M. Choi, Y. Shin, and S. Lee, "Effects of PCB Patterns on EMI Measurement in TEM Cell and Proposal of PCB Design Guidelines", j.inst.Korean.electr.electron.eng, vol. 21, no. 3, pp. 272-275, 2017.
  3. J. Park, I. Song, B. Kim, and E. Kim, "A Study on the Evaluation Method of Shielding Effectiveness Using NFS in Near-Field Tests", Journal of IEIE, vol. 53, no. 8, pp. 76-82, 2016.DOI :10.5573/ieie.2016.53.8.076
  4. IEC 61967-1:2002, "Integrated Circuits - Measurement of Electromagnetic Emissions, 150KHz to 1GHz - Part 1: General Conditions and Definitions," https://webstore.iec.ch/publication/6193
  5. IEC 62132-1:2015, "Integrated Circuits - Measurement of Electromagnetic Immunity - Part 1: General Conditions and Definitions," https://webstore.iec.ch/publication/23626
  6. P. Lee, J. Wee, B. Kim, J. Choi, and S. Yeo, "Chip-level NFP Calibration and Verification Using Improved Probe for NFS Standardization," Journal of IEEK, vol. 49-SD, no. 6, pp. 25-34, 2012.
  7. H. Funato and T. Suga, "Magnetic Near Field Probe for GHz Band and Spatial Resolution Improvement Technique", in Proc. of IEEE International Symposium on Electromagnetic Compatibility, pp. 284-287, 2006. DOI: 10.1109/EMCZUR.2006.214926
  8. S. Lin, S. Yen, W. Chen and P. Cheng, "Printed Magnetic Field Probe with Enhanced Performances," in Proc. of Asia Pacific Microwave Conference, pp. 649-652, 2009.DOI: 10.1109/APMC.2009.5384134
  9. S. Shinde, S. Marathe, G. Li, R. Zoughi, and D. Pommerenke, "A Frequency Tunable High Sensitivity H-Field Probe Using Varactor Diodes and Parasitic Inductance," IEEE Transactions on Electromagnetic Compatibility, vol. 58, no. 1, pp. 331-334, 2016.DOI: 10.1109/TEMC.2015.2508898
  10. G. Maghlakelidze, X. Yan, L. Guan, S. Marathe, Q. Huang, B. Bae, C. Hwang, V. Khilkevich, J. Fan, and D. Pommerenke, "SNR Analysis and Optimization in Near-Field Scanning and EMI Applications," IEEE Transactions on Electromagnetic Compatibility, vol. 60, no. 4, pp. 1087-1094, 2018.DOI: 10.1109/TEMC.2018.2792778
  11. G. Li, W. Huang and D. Pommerenke, "Effect of Cooling on the Probe System Sensitivity for Low Signal Strength RFI Problems," in Proc. of IEEE International Symposium on Electromagnetic Compatibility, pp. 134-137, 2013. DOI: 10.1109/ISEMC.2013.6670396
  12. N. Mai-Khanh, T. Iizuka, M. Yamada, O. Morita and K. Asada, "An Integrated High-Precision Probe System for Near-Field Magnetic Measurements on Cryptographic LSIs," IEEE Sensors, pp. 1-4., 2012. DOI: 10.1109/ICSENS.2012.6411173