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http://dx.doi.org/10.5515/JKIEES.2009.9.2.105

A Study on the Coupling of a Flanged Parallel-Plate Waveguide to a Slit In a Nearby Conducting Screen for Near-Field Scanning Microscopy  

Lee, Jong-Ig (Department of Electronics Engineering, Dongseo University)
Cho, Young-Ki (School of Electrical Engineering and Computer Science, Kyungpook National University)
Publication Information
Journal of electromagnetic engineering and science / v.9, no.2, 2009 , pp. 105-109 More about this Journal
Abstract
The problem of electromagnetic coupling between a slit fed by a flanged parallel-plate waveguide(PPW) and a slit in an infinite nearby conducting screen parallel to the flanged ground conductor is studied as a simplified problem for a near-field scanning microscopy(NSM). The method of moments isused to solve the coupled integral equations for the electric field distributions over the slits. The performance of the proposed apparatus as an NSM is tested by examining the effects of some geometrical parameters on the equivalent slit admittance and coupled powers through the slits.
Keywords
Coupling; Slit; Near-Field Scanning Microscopy(NSM); Parallel-Plate Waveguide(PPW);
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