• Title/Summary/Keyword: N-drift

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A Study on the Forward I-V Characteristics of the Separated Shorted-Anode Lateral Insulated Gate Bipolar Transistor (분리된 단락 애노드를 이용한 수평형 SA-LIGBT 의 순방향 전류-전압 특성 연구)

  • Byeon, Dae-Seok;Chun, Jeong-Hun;Lee, Byeong-Hun;Kim, Du-Yeong;Han, Min-Ku;Choi, Yeon-Ik
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.48 no.3
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    • pp.161-166
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    • 1999
  • We investigate the device characteristics of the separated shorted-anode LIGBT (SSA-LIGBT), which suppresses effectively the negative differential resistance regime, by 2-dimensional numerical simulation. The SSA-LIGBT increases the pinch resistance by employing the highly resistive n-drift region as an electron conduction path instead of the lowly resistive n buffer region of the conventional SA-LIGBT. The negative differential resistance regime of the SSA-LIGBT is significantly suppressed as compared with that of the conventional SA-LIGBT. The SSA-LIGBT shows the lower forward voltage drop than that of the conventional SA-LIGBT.

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Experimental Evaluation of the Performance of Large-Capacity Mounts for Naval Shipboard Equipments (함정탑재장비용 대용량 마운트의 성능시험평가)

  • Moon, Seok-Jun;Kim, Heung-Sub;Park, Jin-Woo;Park, Jin-Ho;Oh, Kwang-Suk;Jeong, Jong-Ahn
    • Journal of the Society of Naval Architects of Korea
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    • v.52 no.3
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    • pp.275-281
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    • 2015
  • Mounts for shipboard equipment in naval ships play an important role for vibration and shock suppression. New large-capacity resilient mounts, SDR-D30 and SDR-D45, have been developed. This paper involves performance tests for the mount which have maximum load of 30 kN and 45 kN, respectively. The performance tests have been carried out for several mounts based on military standards, such as MIL-M-19863D(SH), MIL-M-21693C(SH), MIL-M-17508F(SH), and MIL-S-901D(NAVY). The test items consist of deflection at upper rate load test, dynamic stiffness, uniformity, static load-deflection(axial, transverse and longitudinal), drift test, fatigue test, and shock test. From these performance tests, it is confirmed that the two mounts have good performances based on military standards.

Study on Multi-Mode Monopulse Signal Processing System Providing Optimal Time Delay under High Doppler Condition (고속 도플러 편이 환경에서 최적 시간지연을 갖는 다중모드 모노펄스 신호처리에 관한 연구)

  • Lee, Jaemoon;Lim, Jaesung;Ahn, Huisoo
    • Journal of the Korea Institute of Military Science and Technology
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    • v.19 no.5
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    • pp.582-589
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    • 2016
  • Multi-mode monopulse system is widely used for satellite terminal like UAV because of high tracking accuracy and low size/weight profile. In order to calculate tracking error, Multi-mode monopulse system utilizes high-order mode signal, and it should have enough C/N(carrier to noise) level therefore tracking system needs narrow band filtering of received satellite beacon signal as much as possible. However, UAV suffers for beacon frequency drift derived from Doppler effect due to satellite figure 8 movement and UAV maneuvering. Therefore wideband signal processing needs to be considered in advance for exact doppler compensation and consequent time delay. In this paper, we propose the multi-stage Digital Signal processing system for beacon signal, which could minimize the signal delay under high Doppler and low C/N condition.

A study on the electron transport coefficients using monte carlo method in argon gas (몬테칼로법을 이용한 Ar기체의 전자수송계수에 관한 연구)

  • 하성철;전병훈
    • Electrical & Electronic Materials
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    • v.8 no.6
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    • pp.685-692
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    • 1995
  • The electron transport coefficients in argon gas is studied over the range of E/N values from 85 to 566 Td by the Monte Carlo method considering the latest cross section data. The result of the Monte Carlo method analysis shows that the value of the electron transport coefficients such as the electron drift velocity, the ratio of the longitudinal and transverse diffusion coefficients to the mobility. It is also found that the electron transport coefficients calculated by the two-term approximation analysis agree well with those by Monte Carlo calculation. The electron energy distributions function were analysed in argon at E/N=283, and 566 Td for a case of the equilibrium region in the mean electron energy. A momentum transfer cross section for the argon atom which was consistent with both of the present electron transport coefficients was derived over the range of mean electron energy from 10.3 to 14.5 eV, also suggested as a set of electron cross section for argon atom. The validity of the results obtained has been confirmed by a Monte Carlo simulation method.

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High Current Behavior and Double Snapback Mechanism Analysis of Gate Grounded Extended Drain NMOS Device for ESD Protection Device Application of DDIC Chip (DDIC 칩의 정전기 보호 소자로 적용되는 GG_EDNMOS 소자의 고전류 특성 및 더블 스냅백 메커니즘 분석)

  • Yang, Jun-Won;Kim, Hyung-Ho;Seo, Yong-Jin
    • Journal of Satellite, Information and Communications
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    • v.8 no.2
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    • pp.36-43
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    • 2013
  • In this study, the high current behaviors and double snapback mechanism of gate grounded_extended drain n-type MOSFET(GG_EDNMOS) device were analyzed in order to realize the robust electrostatic discharge(ESD) protection performances of high voltage operating display driver IC(DDIC) chips. Both the transmission line pulse(TLP) data and the thermal incorporated 2-dimensional simulation analysis as a function of ion implant conditions demonstrate a characteristic double snapback phenomenon after triggering of bipolar junction transistor(BJT) operation. Also, the background carrier density is proven to be a critical factor to affect the high current behavior of the GG_EDNMOS devices.

Enhancement of On-Resistance Characteristics Using Charge Balance Analysis Modulation in a Trench Filling Super Junction MOSFET

  • Geum, Jongmin;Jung, Eun Sik;Kim, Yong Tae;Kang, Ey Goo;Sung, Man Young
    • Journal of Electrical Engineering and Technology
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    • v.9 no.3
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    • pp.843-847
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    • 2014
  • In Super Junction (SJ) MOSFETs, charge balance is the most important issue of the SJ fabrication process. In order to achieve the best electrical characteristics, such as breakdown voltage and on-resistance, the N-type and P-type drift regions must be fully depleted when the drain bias approaches the breakdown voltage, which is known as the charge balance condition. In conventional charge balance analysis, based on multi-epi process SJ MOSFETs, analytical model has only N, P pillar width and doping concentration parameter. But applying a conventional charge balance principle to trench filling process, easier than Multi-epi process, is impossible due to the missing of the trench angle parameter. To achieve much more superior characteristics of on-resistance in trench filling SJ MOFET, the appropriate trench angle is necessary. So in this paper, modulated charge balance analysis is proposed, in which a trench angle parameter is added. The proposed method is validated using the TCAD simulation tool.

Analysis of Hot-Carrier Effects in High-Voltage LDMOSFETs (고전압 LDMOSFET의 Hot-Carreir 효과에 의한 특성분석)

  • Park, Hoon-Soo;Lee, Young-Ki;Kwon, Young-Kyu
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2005.07a
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    • pp.199-200
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    • 2005
  • In this paper, the electrical characteristics and hot-carrier induced electrical performance degradations of high-voltage LDMOSFET fabricated by the existing CMOS technology were investigated. Different from the low voltage CMOS device, the only specific on-resistance was degraded due to hot-carrier stressing in LDMOS transistor. However, other electrical parameters such as threshold voltage, transconductance, and saturated drain current were not degraded after stressing. The amount of on-resistance degradation of LDMOS transistor that was implanted n-well with $1.0\times10^{13}/cm^2$ was approximately 1.6 times more than that of LDMOS transistor implanted n-well with $1.0\times10^{12}/cm^2$. Similar to low voltage CMOS device, the peak on-resistance degradation in LDMOS device was observed at gate voltage of 2.2V while the drain applied voltage was 50V. It means that the maximum impact ionization at the drain junction occurs at the gate voltage of 2.2V applying the drain voltage of 50V.

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Investigation of depending on ion drift velocity for board surface ion angular distribution function in $Cl_2$ discharge ($Cl_2$ 방전에서의 기판 표면 이온 각 분포 함수의 유동속도 의존성 조사)

  • Yu, Dong-Hun;Kwon, D.C.;Lee, J.K.;Yoon, N.S.;Kim, J.H.;Shin, Y.H.
    • Proceedings of the KIEE Conference
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    • 2004.07c
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    • pp.1927-1929
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    • 2004
  • 현재 널리 쓰이는 고밀도 플라즈마 장치의 식각 시뮬레이션은 식각 패턴으로는 level set method이며 바이어스가 인가된 sheath model로는 Riley sheath model 이 보편적으로 받아들여지고 있다. 이러한 식각 시뮬레이션은 RF(Radio Frequency) sheath로부터 가속된 이온이 단위 입체각당 특정 지점에 이온 플럭스 분포함수, 이온 에너지 분포함수와, 중성종의 수송모델로 etch rate을 결정하는 과정과 level set method을 이용하여 식각 형태를 계산하는 과정으로 구성되어있다. 본 연구는 식각 형태 계산 이전의 단계로서 $Ar^+,\;Cl_2{^+},\;Cl^+$이온의 유동속도와 밀도를 장치의 radial방향으로 불균일하게 가정하였고, 가정한 값으로 이온 플럭스와 에너지 플럭스에 대한 영향을 알아보았다.

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Study on Thermal Characteristics of IGBT (IGBT의 열 특성에 관한 연구)

  • Kang, Ey-Goo;Ahn, Byoung-Sub;Nam, Tae-Jin
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2009.11a
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    • pp.70-70
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    • 2009
  • In this paper, we proposed 2500V Non punch-through(NPT) Insulated gate bipolar transistor(IGBT) for high voltage industry application. we carried out optimal simulation for high efficiency of 2500V NPT IGBT according to size of device. In results, we obtaind design parameter with 375um n-drift thickness, 15um gate length, and 8um emitter windows. After we simulate with optimal parameter, we obtained 2840V breakdown voltage and 3.4V Vce,sat. These design and process parameter will be used designing of more 2000V NPT IGBT devices.

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Mechanisms of $Cl_2$ Molecules Dissociation in a Gas Discharge Plasma in Mixtures with Ar, $O_2.N_2$

  • Efremov, A.M.;Kwon, Kwang-Ho
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.1 no.4
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    • pp.197-201
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    • 2001
  • The influence of argon, oxygen, and nitrogen admixtures on the dissociation of $Cl_2$ molecules in a glow discharge low-temperature plasma under the constant pressure conditions was investigated. For $Cl_2/Ar$ and $Cl_2/O_2$mixtures, the concentration of chlorine atoms was observed to be a practically constant at argon or oxygen concentrations up to 50%. This invariability is a most pro bably explained by relative increase in rate of $Cl_2$ direct electron impact dissociation due to the changes in electrophysical parameters of plasma such as EEDF, electron drift rate and mean energy. For all the considered mixtures, the contribution of stepwise dissociation involving active species from gas additives (metastable atoms and molecules, vibrationally excited molecules) was found to be negligible.

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