• Title/Summary/Keyword: MEMS resonator

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Wafer-Level Packaged MEMS Resonators with a Highly Vacuum-Sensitive Quality Factor

  • Kang, Seok Jin;Moon, Young Soon;Son, Won Ho;Choi, Sie Young
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.14 no.5
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    • pp.632-639
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    • 2014
  • Mechanical stress and the vacuum level are the two main factors dominating the quality factor of a resonator operated in the vacuum range 1 mTorr to 10 Torr. This means that if the quality factor of a resonator is very insensitive to the mechanical stress in the vacuum range, it is sensitive to mainly the ambient vacuum level. In this paper, a wafer-level packaged MEMS resonator with a highly vacuum-sensitive quality factor is presented. The proposed device is characterized by a package with out-of-plane symmetry and a suspending structure with only a single anchor. Out-of-plane symmetry helps prevent deformation of the packaged device due to thermal mismatch, and a single-clamped structure facilitates constraint-free displacement. As a result, the proposed device is very insensitive to mechanical stress and is sensitive to mainly the ambient vacuum level. The average quality factors of the devices packaged under pressures of 50, 100, and 200 mTorr were 4987, 3415, and 2127, respectively. The results demonstrated the high controllability of the quality factor by vacuum adjustment. The mechanical robustness of the quality factor was confirmed by comparing the quality factors before and after high-temperature storage. Furthermore, through more than 50 days of monitoring, the stability of the quality factor was also certified.

Frequency Response Analysis of Array-Type MEMS Resonators by Model Order Reduction Using Krylov Subspace Method (크리로프 부공간법에 근거한 모델차수축소기법을 통한 배열형 MEMS 공진기의 주파수응답해석)

  • Han, Jeong-Sam;Ko, Jin-Hwan
    • Transactions of the Korean Society of Mechanical Engineers A
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    • v.33 no.9
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    • pp.878-885
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    • 2009
  • One of important factors in designing MEMS resonators for RF filters is obtaining a desired frequency response function (FRF) within a specific frequency range of interest. Because various array-type MEMS resonators have been recently introduced to improve the filter characteristics such as bandwidth, pass-band, and shape factor, the degrees of freedom (DOF) of finite elements for their FRF calculation dramatically increases and therefore raises computational difficulties. In this paper the Krylov subspace-based model order reduction using moment-matching with non-zero expansion points is represented as a numerical solution to perform the frequency response analyses of those array-type MEMS resonators in an efficient way. By matching moments at a frequency around the specific operation range of the array-type resonators, the required FRF can be efficiently calculated regardless of their operating frequency from significantly reduced systems. In addition, because of the characteristics of the moment-matching method, a minimal order of reduced system with a prearranged accuracy can be determined through an error indicator using successive reduced models, which is very useful to automate the order reduction process and FRF calculation for structural optimization iterations. We also found out that the presented method could obtain the FRF of a $6\times6$ array-type resonator within a seventieth of the computational time necessary for the direct method and in addition FRF calculation by the mode superposition method could not even be completed because of a data overflow with a half after calculation of 9,722 eigenmodes.

Design of a Planar Cavity Resonator for 12.5 GHz Low Phase Noise SiGe HBT Oscillator

  • Lee Jae-Woo;Kim Yong-Hoon
    • Journal of electromagnetic engineering and science
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    • v.5 no.4
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    • pp.153-160
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    • 2005
  • In this paper, the novel microwave oscillator incorporating a planar cavity resonator(PCR) is presented to reduce the phase noise of the oscillator in a planar environment. Compared to the conventional planar( $\lambda$/4 open stub resonator), the phase noise is improved about 16 dBc/Hz @100 kHz. The design of the oscillator is based on a reflection type configuration using the low 1/f SiGe HBT transistor(LPT16ED). The output power is measured 2.76 dBm at 12.5 GHz. In this paper, the oscillator used to the PCR can be expected to provide a solution for low phase noise oscillator in microwave circuits.

Investigation of Pyrolyzed Polyimide Thin Film as MEMS Material

  • Naka, Keisuke;Nagae, Hideki;Ichiyanagi, Masao;Jeong, Ok-Chan;Konishi, Satoshi
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.5 no.1
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    • pp.38-44
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    • 2005
  • Pyrolyzed polyimide is explored in terms of MEMS material. This paper describes chemical, electrical, mechanical properties of pyrolyzed polyimide (PIX-1400) thin film as MEMS material. When polyimide thin film was pyrolyzed at $800^{\circ}C$ for 60 minutes in $N_{2}$ ambient, the residual ratio of pyrolyzed film thickness measured with a surface profiler is about 49 %, and the resistivity is about $2.17{\times}10^{-2}\;{Omega}cm$. From the result of the load-deflection test, the estimated Young's modulus and initial average stress of pyrolyzed polyimide are 67 GPa and 30 MPa, respectively. As one demonstration of MEMS structures of pyrolyzed polyimide, the fabrication method of the microbridge structure is proposed for a micro heater and a resonator.

Model Order Reduction Using Moment-Matching Method Based on Krylov Subspace and Its Application to FRF Calculation for Array-Type MEMS Resonators (Krylov 부공간에 근거한 모멘트일치법을 이용한 모델차수축소법 및 배열형 MEMS 공진기 주파수응답함수 계산에의 응용)

  • Han, Jeong-Sam;Ko, Jin-Hwan
    • Proceedings of the KSME Conference
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    • 2008.11a
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    • pp.436-441
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    • 2008
  • One of important factors in designing array-type MEMS resonators is obtaining a desired frequency response function (FRF) within a specific range. In this paper Krylov subspace-based model order reduction using moment-matching with non-zero expansion points is represented to calculate the FRF of array-type resonators. By matching moments at a frequency around a specific range of the array-type resonators, required FRFs can be efficiently calculated with significantly reduced systems regardless of their operating frequencies. In addition, because of the characteristics of moment-matching method, a minimal order of reduced system with a specified accuracy can be determined through an error indicator using successive reduced models, which is very useful to automate the order reduction process and FRF calculation for structural optimization iterations.

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Model Order Reduction for Mid-Frequency Response Analysis (중주파수 응답해석을 위한 축소 기법)

  • Ko, Jin-Hwan
    • Proceedings of the Computational Structural Engineering Institute Conference
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    • 2009.04a
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    • pp.135-138
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    • 2009
  • Most of the studies use model order reduction for low frequency (LF) response analysis due to their high computational efficiency. In LF response analysis, one of model order reduction, algebraic substructuring (AS) retains all LF modes when using the modal superposition. However, in mid-frequency (MF) response analysis, the LF modes make very little contribution and also increase the number of retained modes, which leads to loss of computational efficiency. Therefore, MF response analysis should consider low truncated modes to improve the computational efficiency. The current work is focused on improving the computational efficiency using a AS and a frequency sweep algorithm. Finite element simulation for a MEMS resonator array showed that the performance of the presented method is superior to a conventional method.

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Wafer Level Package Using Glass Cap and Wafer with Groove-Shaped Via (유리 기판과 패인 홈 모양의 홀을 갖는 웨이퍼를 이용한 웨이퍼 레벨 패키지)

  • Lee, Joo-Ho;Park, Hae-Seok;Shin, Jea-Sik;Kwon, Jong-Oh;Shin, Kwang-Jae;Song, In-Sang;Lee, Sang-Hun
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.56 no.12
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    • pp.2217-2220
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    • 2007
  • In this paper, we propose a new wafer level package (WLP) for the RF MEMS applications. The Film Bulk Acoustic Resonator (FBAR) are fabricated and hermetically packaged in a new wafer level packaging process. With the use of Au-Sn eutectic bonding method, we bonded glass cap and FBAR device wafer which has groove-shaped via formed in the backside. The device wafer includes a electrical bonding pad and groove-shaped via for connecting to the external bonding pad on the device wafer backside and a peripheral pad placed around the perimeter of the device for bonding the glass wafer and device wafer. The glass cap prevents the device from being exposed and ensures excellent mechanical and environmental protection. The frequency characteristics show that the change of bandwidth and frequency shift before and after bonding is less than 0.5 MHz. Two packaged devices, Tx and Rx filters, are attached to a printed circuit board, wire bonded, and encapsulated in plastic to form the duplexer. We have designed and built a low-cost, high performance, duplexer based on the FBARs and presented the results of performance and reliability test.

Frequency and Amplitude Control of Micro Resonant Sensors (마이크로 공진형 센서의 주파수 및 진폭 제어)

  • Park, Sung-Su
    • Journal of Institute of Control, Robotics and Systems
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    • v.15 no.3
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    • pp.258-264
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    • 2009
  • This paper presents two control algorithms for the frequency and amplitude of the resonator of a micro sensor. One algorithm excites the resonator at its a priori unknown resonant frequency, and the other algorithm alters the resonator dynamics to place the resonant frequency at a fixed frequency, chosen by the designer. Both algorithms maintain a specified amplitude of oscillations. The control system behavior is analyzed using an averaging method, and a quantitative criterion is provided for the selecting the control gain to achieve stability. Tracking and estimation accuracy of the natural frequency under the presence of measurement noise is also analyzed. The proposed control algorithms are applied to the MEMS dual-mass gyroscope without mechanical connecting beam between two proof-masses. Simulation results show the effectiveness of the proposed control algorithms which guarantee the proof-masses of the gyroscope to move in opposite directions with the same resonant frequency and oscillation amplitude.

A Study on Wafer Level Vacuum Packaging using Epi poly for MEMS Applications (Epi poly를 이용한 MEMS 소자용 웨이퍼 단위의 진공 패키징에 대한 연구)

  • 석선호;이병렬;전국진
    • Journal of the Semiconductor & Display Technology
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    • v.1 no.1
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    • pp.15-19
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    • 2002
  • A new vacuum packaging process in wafer level is developed for the surface micromachining devices using glass silicon anodic bonding technology. The inside pressure of the packaged device was measured indirectly by the quality factor of the mechanical resonator. The measured Q factor was about 5$\times10^4$ and the estimated inner pressure was about 1 mTorr. And it is also possible to change the inside pressure of the packaged devices from 2 Torr to 1 mTorr by varying the amount of the Ti gettering material. The long-term stability test is still on the way, but in initial characterization, the yield is about 80% and the vacuum degradation with time was not observed.

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