• Journal of Welding and Joining
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• 제33권5호
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• pp.41-46
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• 2015

The snap cure NCP(non-conducive paste) adhesive material is essentially required for the high productivity flip chip bonding process. In this study, the accessibility of DEA(dielectric analysis) method for the evaluation of snap cure behavior was investigated with comparison to the isothermal DSC(differential scanning calorimetry) method. NCP adhesive was mainly formulated with epoxy resin and imidazole curing agent. Even though there were some noise in the dielectric loss factor curve measured by DEA, the cure start and completion points could be specified clearly through the data processing of cumulation and deviation method. Degree of cure by DEA method which was measured from the variation of the dielectric loss factor of adhesive material was corresponded to about 80% of the degree of cure by DSC method which was measured from the heat of curing reaction. Because the adhesive joint cured to the degree of 80% in the view point of chemical reaction reveals the sufficient mechanical strength, DEA method is expected to be used effectively in the estimation of the high speed curing behavior of snap cure type NCP adhesive material for flip chip bonding.

• 마이크로전자및패키징학회지
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• 제21권2호
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• pp.37-41
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• 2014

차세대 전자 소자 기술에서 전력전달은 소자의 전력을 낮추고 발열로 인한 문제 해결을 위해서 매우 중요한 기술로 대두되고 있다. 본 연구에서는 직사각형 ABL 전력 범프를 이용한, Cu-to-Cu 플립 칩 본딩 공정의 신뢰성 문제에 대해 살펴보았다. 다이 내 범프 높이 차이는 전기도금 후 CMP 공정을 진행했을 경우 약 $0.3{\sim}0.5{\mu}m$ 이었고, CMP 공정을 진행하지 않았을 경우는 약 $1.1{\sim}1.4{\mu}m$으로 나타났다. 또한 면적이 큰 ABL 전력 범프가 입출력 범프 보다 높이가 높게 나타났다. 다이 내 범프 높이 차이로 인해 플립 칩 본딩 공정 시 misalignment 문제가 발생하였고, 이는 본딩 quality 에도 영향을 미쳤다. Cu-to-Cu 플립 칩 공정을 위해선 다이 내 범프 높이 균일도와 Cu 범프의 평탄도 조절이 매우 중요한 요소라 하겠다.

• 한국마이크로전자및패키징학회:학술대회논문집
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• 한국마이크로전자및패키징학회 2000년도 Proceedings of 5th International Joint Symposium on Microeletronics and Packaging
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• pp.9-15
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• 2000

Flip chip assembly on organic substrates using ACAs have received much attentions due to many advantages such as easier processing, good electrical performance, lower cost, and low temperature processing compatible with organic substrates. ACAs are generally composed of epoxy polymer resin and small amount of conductive fillers (less than 10 wt. %). As a result, ACAs have almost the same CTE values as an epoxy material itself which are higher than conventional underfill materials which contains lots of fillers. Therefore, it is necessary to lower the CTE value of ACAs to obtain more reliable flip chip assembly on organic substrates using ACAs. To modify the ACA composite materials with some amount of conductive fillers, non-conductive fillers were incorporated into ACAs. In this paper, we investigated the effect of fillers on the thermo-mechanical properties of modified ACA composite materials and the reliability of flip chip assembly on organic substrates using modified ACA composite materials. For the characterization of modified ACAs composites with different content of non-conducting fillers, dynamic scanning calorimeter (DSC), and thermo-gravimetric analyzer (TGA), dynamic mechanical analyzer (DMA), and thermo-mechanical analyzer (TMA) were utilized. As the non-conducting filler content increased, CTE values decreased and storage modulus at room temperature increased. In addition, the increase in tile content of filler brought about the increase of Tg$^{DSC}$ and Tg$^{TMA}$. However, the TGA behaviors stayed almost the same. Contact resistance changes were measured during reliability tests such as thermal cycling, high humidity and temperature, and high temperature at dry condition. It was observed that reliability results were significant affected by CTEs of ACA materials especially at the thermal cycling test. Results showed that flip chip assembly using modified ACA composites with lower CTEs and higher modulus by loading non-conducting fillers exhibited better contact resistance behavior than conventional ACAs without non-conducting fillers.ers.

• 마이크로전자및패키징학회지
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• 제7권1호
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• pp.41-49
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• 2000

Flip chip assembly on organic substrates using ACAs have received much attentions due to many advantages such as easier processing, good electrical performance, lower cost, and low temperature processing compatible with organic substrates. ACAs are generally composed of epoxy polymer resin and small amount of conductive fillers (less than 10 wt.%). As a result, ACAs have almost the same CTE values as an epoxy material itself which are higher than conventional underfill materials which contains lots of fillers. Therefore, it is necessary to lower the CTE value of ACAs to obtain more reliable flip chip assembly on organic substrates using ACAs. To modify the ACA composite materials with some amount of conductive fillers, non-conductive fillers were incorporated into ACAs. In this paper, we investigated the effect of fillers on the thermo-mechanical properties of modified ACA composite materials and the reliability of flip chip assembly on organic substrates using modified ACA composite materials. For the characterization of modified ACAs composites with different content of non-conducting fillers, dynamic scanning calorimeter (DSC), and thermo-gravimetric analyser (TGA), dynamic mechanical analyzer (DMA), and thermo-mechanical analyzer (TMA) were utilized. As the non-conducting filler content increased, CTE values decreased and storage modulus at room temperature increased. In addition, the increase in the content of filler brought about the increase of $Tg^{DSC}$ and $Tg^{TMA}$. However, the TGA behaviors stayed almost the same. Contact resistance changes were measured during reliability tests such as thermal cycling, high humidity and temperature, and high temperature at dry condition. It was observed that reliability results were significantly affected by CTEs of ACA materials especially at the thermal cycling test. Results showed that flip chip assembly using modified ACA composites with lower CTEs and higher modulus by loading non-conducting fillers exhibited better contact resistance behavior than conventional ACAs without non-conducting fillers.

• 한국전기전자재료학회논문지
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• 제29권4호
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• pp.237-240
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• 2016

The improvement of irradiation intensity and irradiation uniformity is essential for large area and high power UVA light source application. In this study, large number of chips bonded by micro soldering technique were driven by low current, and current limiting diodes were configured to supply constant current to parallel circuits consisting of large number of series strings. The dimension of light source module circuit board was $350{\times}90mm^2$ and 16,650 numbers of 385 nm flip chip LEDs were used with a configuration of 90 parallel and 185 series strings. The space between LEDs in parallel and series strings were maintained at 1.9 mm and 1.0 mm distance, respectively. The size of the flip chip was $750{\times}750{\mu}m^2$ were used with contact pads of $260{\times}669{\mu}m^2$ size, and SAC (96.5 Sn/3.0 Ag/0.5 Cu) solder was used for flip chip bonding. The fabricated light source module with 7.5 m A supply current showed temperature rise of $66^{\circ}C$, whereas irradiation was measured to be $300mW/cm^2$. Inaddition, 0.23% variation of the constant current in each series string was demonstrated.

• 한국재료학회지
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• 제9권11호
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• pp.1095-1101
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• 1999

무전해 니켈 도금을 이용하여 플립칩 공정에 응용하기 위한 범프와 UBM층을 형성하고 특성을 조사하였다. 도금전 zincate 처리를 해석하고 도금 변수인 온도, pH 등에 따른 도금층의 특성 변화, 공정 후의 열처리 효과들을 관찰하였다. 이를 통해 각 변수들이 도금층의 특성에 미치는 영향과 전자패키지 응용시 요구되는 무전해 니켈 도금 조건을 제시하였다. 도금직후의 니켈은 P가 10wt% 포함되며, $60\mu\Omega$-cm의 비저항, 500HV의 경도의 비정질 결정구조를 갖으며 열처리후 결정질 변태와 동시에 경도가 증가한다. 무전해 범프를 실제 테스트 칩에 형성한 후, ACF 플립칩 접속하여 무전해 니켈 범프의 장점과 미세 전자 패키징응용의 가능성을 확인하였다.

• 한국통신학회논문지
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• 제35권1B호
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• pp.62-67
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• 2010

본 연구는 다양한 산업 환경에 적용되는 RFID 태그 개발에 있어 RFID 태그 패키징 개발과 RFID 태그 플립칩(flip chip) 접합 방법이 산업 환경 맞춤형 RFID 태그 개발에 미치는 영향에 대해 분석하였다. RFID 태그 플립칩(flip chip) 접합은 와이어 접합(wire bonding), 초음파 접합(ultrasonic bonding), 열융착 접합(heat plate bonding), 레이저 접합(laser bonding)으로 구분되어 있으며, 이런 접합 방법은 다양한 RFID 태그 개발의 적용 환경에 따라 적합한 접합 방법이 있음을 본 연구를 통해서 알 수 있었다. 극고온, 극저온, 다습, 고내구성 등 다양한 산업 환경 중 극고온 환경에서의 RFID 태그 개발은 빛 에너지를 흡수하여 열 에너지로 전환하는 레이저 접합 방법과 직접적인 열 전달 방식인 열융착 접합 방법은 접속 재료인 ACF의 손상으로 인해 부적합하고, 와이어를 이용하여 직접 범프와 패턴을 연결하는 와이어 접합 방법이 적합함을 알 수 있었다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2007년도 하계학술대회 논문집 Vol.8
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• pp.183-184
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• 2007

A 40 Gb/s transimpedance amplifier IC was designed and fabricated with a InP/InGaAs HBTs technology. In this study, we interconnect 40Gbps trans impedance amplifier IC to a duroid substrate by a flip chip bonding instead of conventional wire bonding for interconnection. For flip chip bonding, we developed fine pitch bump with the $70{\mu}m$ diameter and $150{\mu}m$ pitch using WLP process. To study the effect of WLP, electrical performance was measured and analyzed in wafer and package module using WLP. The Small signal gains in wafer and package module were 7.24 dB and 6.93dB respectively. The difference of small signal gain in wafer and package module was 0.3dB. This small difference of gain is due to the short interconnection length by bump. The characteristics of return loss was under -10dB in both wafer and module. So, WLP process can be used for millimeter wave GaAs MMIC with the fine pitch pad and duroid substrate can be used in flip chip bonding process.

• 마이크로전자및패키징학회지
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• 제28권2호
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• pp.45-50
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• 2021

Flip chip 제품의 난이도 증가에 따라 solder wetting 및 신뢰성 관점에서 강점을 갖는 flux 소재에 대한 관심이 높아지고 있다. 지용성 flux의 경우 별도의 세정 공정이 없기 때문에 공정 효율화 측면에서 유리하나, 리플로우 공정이후 반응을 마친 잔여물이 잔존하게 되는 경우 Cu migration 및 delamination을 발생시킬 수 있다. 본 연구에서는 저잔사 flux 구현을 위해 신규 resin에 적합한 solvent 및 activator를 변경 하였으며, package 환경에서 non-wet 및 신뢰성 개선 유무를 확인하였다. 저장 안정성 평가를 통해 신규 소재에 대한 안정성을 확보하였으며, boiling point가 상이한 solvent와 activator 2종 적용 및 activator 함량 증대를 통해 non-wet 미 발생 flux 소재를 확보하였다. 해당 소재에 대한 신뢰성 검증 이후 평면 분석 결과 flux residue 기인성 delamination 현상은 발견되지 않았으며, 이를 통해 저잔사 flux에 대한 최종 조성을 확보하였다.

• 반도체디스플레이기술학회지
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• 제4권2호
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• pp.33-37
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• 2005

Bare-chip packaging becomes more popular along with the miniaturization of IT components. In this paper, we have studied flip-chip process, and developed automated bonding system. Among the several bonding method, NCP bonding is chosen and batch-type equipment is manufactured. The dual optics and vision system aligns the chip with the substrate. The bonding head equipped with temperature and force controllers bonds the chip. The system can be easily modified fer other bonding methods such as ACF.