• 제목/요약/키워드: Field effect transistor

검색결과 794건 처리시간 0.036초

이중게이트 구조의 Junctionless FET 의 성능 개선에 대한 연구 (Development of Gate Structure in Junctionless Double Gate Field Effect Transistors)

  • 조일환;서동선
    • 전기전자학회논문지
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    • 제19권4호
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    • pp.514-519
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    • 2015
  • 본 논문에서는 이중 게이트 junctionless MOSFET 의 성능 최적화를 위하여 다중 게이트 형태를 적용하여 평가한다. 금속 게이트들 사이의 일함수가 서로 다르므로 다중 게이트 구조를 적용할 경우 금속게이트 길이에 따라 소스와 드레인 주변의 전위를 조절할 수 있다. 동작 전류와 누설 전류 그리고 동작 전압은 게이트 구조에 의해 조절이 가능하며 이로 인한 동작 특성 최적화가 가능하다. 본 연구에서는 반도체 소자 시뮬레이션을 통하여 junctionless MOSFET 의 최적화를 구현하고 분석하는 연구를 수행 한다.

Structure Modeling of 100 V Class Super-junction Trench MOSFET with Specific Low On-resistance

  • Lho, Young Hwan
    • 전기전자학회논문지
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    • 제17권2호
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    • pp.129-134
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    • 2013
  • For the conventional power metal-oxide semiconductor field-effect transistor (MOSFET) device structure, there exists a tradeoff relationship between specific on-resistance ($R_{ON.SP}$) and breakdown voltage ($V_{BR}$). In order to overcome the tradeoff relationship, a uniform super-junction (SJ) trench metal-oxide semiconductor field-effect transistor (TMOSFET) structure is studied and designed. The structure modeling considering doping concentrations is performed, and the distributions at breakdown voltages and the electric fields in a SJ TMOSFET are analyzed. The simulations are successfully optimized by the using of the SILVACO TCAD 2D device simulator, Atlas. In this paper, the specific on-resistance of the SJ TMOSFET is successfully obtained 0.96 $m{\Omega}{\cdot}cm^2$, which is of lesser value than the required one of 1.2 $m{\Omega}{\cdot}cm^2$ at the class of 100 V and 100 A for BLDC motor.

공핍 모드 N형 나노선 전계효과 트랜지스터의 전류 전도 모델 (Current Conduction Model of Depletion-Mode N-type Nanowire Field-Effect Transistors (NWFETS))

  • 유윤섭;김한정
    • 대한전자공학회논문지SD
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    • 제45권4호
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    • pp.49-56
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    • 2008
  • 본 논문은 효율적인 회로 시뮬레이션을 위한 긴 채널 공핍 모드 n형 나노선 전계효과트랜지스터(nanowire field-effect transistor: NWFET)의 간단한 해석적 전류 전도 모델을 소개한다. 본 연구에서 사용된 NWFET는 bottom-up 방식으로 제작되었으며 게이트가 채널의 아래에 존재하는 구조를 가진다. 이 모델은 다양한 바이어스 조건에서 동작하는 NWFET의 모든 전류 전도 메카니즘을 포함한다. 새롭게 개발된 NWFET 모델로 계산된 결과는 이전에 발표된 NWFET 실험 데이터와 비교할 때 10% 오차범위 안에서 서로 일치한다.

Sub-10 nm Ge/GaAs Heterojunction-Based Tunneling Field-Effect Transistor with Vertical Tunneling Operation for Ultra-Low-Power Applications

  • Yoon, Young Jun;Seo, Jae Hwa;Cho, Seongjae;Kwon, Hyuck-In;Lee, Jung-Hee;Kang, In Man
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제16권2호
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    • pp.172-178
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    • 2016
  • In this paper, we propose a sub-10 nm Ge/GaAs heterojunction-based tunneling field-effect transistor (TFET) with vertical band-to-band tunneling (BBT) operation for ultra-low-power (LP) applications. We design a stack structure that is based on the Ge/GaAs heterojunction to realize the vertical BBT operation. The use of vertical BBT operations in devices results in excellent subthreshold characteristics with a reduction in the drain-induced barrier thinning (DIBT) phenomenon. The proposed device with a channel length ($L_{ch}$) of 5 nm exhibits outstanding LP performance with a subthreshold swing (S) of 29.1 mV/dec and an off-state current ($I_{off}$) of $1.12{\times}10^{-11}A/{\mu}m$. In addition, the use of the highk spacer dielectric $HfO_2$ improves the on-state current ($I_{on}$) with an intrinsic delay time (${\tau}$) because of a higher fringing field. We demonstrate a sub-10 nm LP switching device that realizes a good S and lower $I_{off}$ at a lower supply voltage ($V_{DD}$) of 0.2 V.

VT-Modulation of Planar Tunnel Field-Effect Transistors with Ground-Plane under Ultrathin Body and Bottom Oxide

  • Sun, Min-Chul;Kim, Hyun Woo;Kim, Hyungjin;Kim, Sang Wan;Kim, Garam;Lee, Jong-Ho;Shin, Hyungcheol;Park, Byung-Gook
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제14권2호
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    • pp.139-145
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    • 2014
  • Control of threshold voltage ($V_T$) by ground-plane (GP) technique for planar tunnel field-effect transistor (TFET) is studied for the first time using TCAD simulation method. Although GP technique appears to be similarly useful for the TFET as for the metal-oxide-semiconductor field-effect transistor (MOSFET), some unique behaviors such as the small controllability under weak ground doping and dependence on the dopant polarity are also observed. For $V_T$-modulation larger than 100 mV, heavy ground doping over $1{\times}10^{20}cm^{-3}$ or back biasing scheme is preferred in case of TFETs. Polarity dependence is explained with a mechanism similar to the punch-through of MOSFETs. In spite of some minor differences, this result shows that both MOSFETs and TFETs can share common $V_T$-control scheme when these devices are co-integrated.