• 제목/요약/키워드: Field Effect Mobility

검색결과 517건 처리시간 0.029초

Parylene 고분자 유전체 표면제어를 통한 OFET의 소자 안정성 향상 연구 (Improvement of Operating Stabilities in Organic Field-Effect Transistors by Surface Modification on Polymeric Parylene Dielectrics)

  • 서정윤;오승택;최기헌;이화성
    • 접착 및 계면
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    • 제22권3호
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    • pp.91-97
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    • 2021
  • 본 연구는 Parylene C 유전체 표면에 유기 자기조립단분자막(self-assembled monolayer, SAM) 중간층을 도입함으로써 표면특성을 제어하고 최종적으로 유기전계효과 트랜지스터(organic field-effect transistors, OFETs)의 전기적 안정성을 향상시킨 결과를 제시하였다. 유기 중간층을 적용함으로써, Parylene C 게이트 유전체의 표면 에너지를 제어하였으며, OFET의 가장 중요한 성능변수인 전계효과 이동도(field-effect transistor, μFET)와 문턱 전압 (threshold voltage, Vth)의 성능향상과 구동 안정성을 증대시켰다. 단순히 Parylene C 유전체를 적용한 Bare OFET에서 μFET 값은 0.12 cm2V-1s-1가 측정되었으나, hexamethyldisilazane (HMDS)과 octadecyltrichlorosilane (ODTS)를 중간층으로 적용된 소자에서는 각각 0.32과 0.34 cm2V-1s-1로 μFET가 증가하였다. 또한 1000번의 transfer 특성의 반복측정을 통해 ODTS 처리한 OFET의 μFET와 Vth의 변화가 가장 작게 나타남을 확인하였다. 이 연구를 통해 유기 SAM 중간층, 특히 ODTS는 효과적으로 Parylene C 표면을 알킬 사슬로 덮어 극성도를 낮춤과 함께 전하 트래핑을 감소시켜 소자의 전기적 구동 안정성을 증가시킬 수 있음을 확인하였다.

Solution-Processed Inorganic Thin Film Transistors Fabricated from Butylamine-Capped Indium-Doped Zinc Oxide Nanocrystals

  • Pham, Hien Thu;Jeong, Hyun-Dam
    • Bulletin of the Korean Chemical Society
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    • 제35권2호
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    • pp.494-500
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    • 2014
  • Indium-doped zinc oxide nanocrystals (IZO NCs), capped with stearic acid (SA) of different sizes, were synthesized using a hot injection method in a noncoordinating solvent 1-octadecene (ODE). The ligand exchange process was employed to modify the surface of IZO NCs by replacing the longer-chain ligand of stearic acid with the shorter-chain ligand of butylamine (BA). It should be noted that the ligand-exchange percentage was observed to be 75%. The change of particle size, morphology, and crystal structures were obtained using a field emission scanning electron microscope (FE-SEM) and X-ray diffraction pattern results. In our study, the 5 nm and 10 nm IZO NCs capped with stearic acid (SA-IZO) were ligand-exchanged with butylamine (BA), and were then spin-coated on a thermal oxide ($SiO_2$) gate insulator to fabricate a thin film transistor (TFT) device. The films were then annealed at various temperatures: $350^{\circ}C$, $400^{\circ}C$, $500^{\circ}C$, and $600^{\circ}C$. All samples showed semiconducting behavior and exhibited n-channel TFT. Curing temperature dependent on mobility was observed. Interestingly, mobility decreases with the increasing size of NCs from 5 to 10 nm. Miller-Abrahams hopping formalism was employed to explain the hopping mechanism insight our IZO NC films. By focusing on the effect of size, different curing temperatures, electron coupling, tunneling rate, and inter-NC separation, we found that the decrease in electron mobility for larger NCs was due to smaller electronic coupling.

무전해 식각법으로 합성한 Si 나노와이어 Field Effect Transistor 유연소자의 특성 (Electrical Properties of Flexible Field Effect Transistor Devices Composed of Si Nanowire by Electroless Etching Method)

  • 이상훈;문경주;황성환;이태일;명재민
    • 한국재료학회지
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    • 제21권2호
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    • pp.115-119
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    • 2011
  • Si Nanowire (NW) field effect transistors (FETs) were fabricated on hard Si and flexible polyimide (PI) substrates, and their electrical characteristics were compared. Si NWs used as channels were synthesized by electroless etching method at low temperature, and these NWs were refined using a centrifugation method to get the NWs to have an optimal diameter and length for FETs. The gate insulator was poly(4-vinylphenol) (PVP), prepared using a spin-coating method on the PI substrate. Gold was used as electrodes whose gap was 8 ${\mu}m$. These gold electrodes were deposited using a thermal evaporator. Current-voltage (I-V) characteristics of the device were measured using a semiconductor analyzer, HP-4145B. The electrical properties of the device were characterized through hole mobility, $I_{on}/I_{off}$ ratio and threshold voltage. The results showed that the electrical properties of the TFTs on PVP were similar to those of TFTs on $SiO_2$. The bending durability of SiNWs TFTs on PI substrate was also studied with increasing bending times. The results showed that the electrical properties were maintained until the sample was folded about 500 times. But, after more than 1000 bending tests, drain current showed a rapid decrease due to the defects caused by the roughness of the surface of the Si NWs and mismatches of the Si NWs with electrodes.

이온성 첨가제 도입을 통한 고이동도 고분자 반도체 특성 구현과 유기전계효과트랜지스터 및 유연전자회로 응용 연구 (High-Mobility Ambipolar Polymer Semiconductors by Incorporation of Ionic Additives for Organic Field-Effect Transistors and Printed Electronic Circuits)

  • 이동현;문지훈;박준구;정지윤;조일영;김동은;백강준
    • 한국전기전자재료학회논문지
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    • 제31권3호
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    • pp.129-134
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    • 2018
  • Herein, we report the manufacture of high-performance, ambipolar organic field-effect transistors (OFETs) and complementary-like electronic circuitry based on a blended, polymeric, semiconducting film. Relatively high and well-balanced electron and hole mobilities were achieved by incorporating a small amount of ionic additives. The equivalent P-channel and N-channel properties of the ambipolar OFETs enabled the manufacture of complementary-like inverter circuits with a near-ideal switching point, high gain, and good noise margins, via a simple blanket spin-coating process with no additional patterning of each active P-type and N-type semiconductor layer.

SiO2 완충층 두께에 따른 비정질 InGaZnO Pseudo-MOS Field Effect Transistor의 신뢰성 평가 (Effect of SiO2 Buffer Layer Thickness on the Device Reliability of the Amorphous InGaZnO Pseudo-MOS Field Effect Transistor)

  • 이세원;황영현;조원주
    • 한국전기전자재료학회논문지
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    • 제25권1호
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    • pp.24-28
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    • 2012
  • In this study, we fabricated an amorphous InGaZnO pseudo-MOS transistor (a-IGZO ${\Psi}$-MOSFET) with a stacked $Si_3N_4/SiO_2$ (NO) gate dielectric and evaluated reliability of the devices with various thicknesses of a $SiO_2$ buffer layer. The roles of a $SiO_2$ buffer layer are improving the interface states and preventing degradation caused by the injection of photo-created holes because of a small valance band offset of amorphous IGZO and $Si_3N_4$. Meanwhile, excellent electrical properties were obtained for a device with 10-nm-thick $SiO_2$ buffer layer of a NO stacked dielectric. The threshold voltage shift of a device, however, was drastically increased because of its thin $SiO_2$ buffer layer which highlighted bias and light-induced hole trapping into the $Si_3N_4$ layer. As a results, the pseudo-MOS transistor with a 20-nm-thick $SiO_2$ buffer layer exhibited improved electrical characteristics and device reliability; field effective mobility(${\mu}_{FE}$) of 12.3 $cm^2/V{\cdot}s$, subthreshold slope (SS) of 148 mV/dec, trap density ($N_t$) of $4.52{\times}1011\;cm^{-2}$, negative bias illumination stress (NBIS) ${\Delta}V_{th}$ of 1.23 V, and negative bias temperature illumination stress (NBTIS) ${\Delta}V_{th}$ of 2.06 V.

역전사법을 활용한 고안정성 그래핀 기반 전계효과 트랜지스터 제작 (Highly Stable Graphene Field-effect Transistors using Inverse Transfer Method)

  • 이은호;방대석
    • 접착 및 계면
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    • 제22권4호
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    • pp.153-157
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    • 2021
  • 이차원 탄소 동소체인 그래핀은 기존 재료보다 우수한 기계적, 전기적 특성을 지니고 있다. 특히, 그래핀의 전하이동도는 실리콘 대비 100배가량 높다고 알려져 차세대 전자소자의 핵심재료로 각광을 받고 있다. 하지만, 그래핀은 외부 환경의 변화에 매우 민감하여 수분 혹은 산소에 취약하여 그래핀 기반 전자소자의 안정성이 취약하다는 단점이 존재하기에 이를 해결하기 위해 다양한 시도가 이뤄지고 있다. 본 연구에서는 그래핀 전계효과 트랜지스터의 절연막을 전사시에 사용되는 고분자 층의 표면 에너지를 조절하여 안정성을 크게 향상시키는 연구를 수행하였다. 절연층으로 쓰인 고분자의 표면 에너지가 낮아짐에 따라 물 분자 혹은 산소와 같은 대기중의 불순물 흡착을 효과적으로 제어함으로써, 안정성을 향상시킬 수 있었다.

계면 제어를 통한 그래핀 기반 전계효과 트랜지스터의 환경 안정성 향상 (Enhanced Environmental Stability of Graphene Field-Effect Transistors through Interface Control)

  • 성준호;이동화;이은호
    • 접착 및 계면
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    • 제23권3호
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    • pp.75-79
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    • 2022
  • 그래핀은 벌집 모양의 sp2 혼성 오비탈 결합으로 이루어진 이차원 탄소 동소체이다. 우수한 전기적, 기계적 특성을 보이며, 차세대 전자소자의 핵심 재료로써 각광을 받고 있다. 그러나, 소자를 구성하는 소재 간의 불안정한 계면 형성으로부터 쉬운 외부 불순물의 침투 혹은 흡착으로 인해 낮은 환경 안정성을 보이고 있다. 따라서 본 연구에서는 고체탄화수소를 그래핀의 전구체로 활용한 직성장을 통해 그래핀 기반 전계효과 트랜지스터의 낮은 환경 안정성을 해결하고자 한다. 직성장으로부터 합성된 그래핀은 이를 활용한 전자소자에서 전하 이동도 및 Dirac 전압의 변화 감소를 통해 높은 구동 안정성을 보였다. 이를 통해 차세대 전자소자의 핵심 재료로써 그래핀을 활용하기 위한 새로운 접근 방법을 제시하였다.

전기자동차 파워 인버터용 전력반도체 소자의 발전: SiC 및 GaN (Advances in Power Semiconductor Devices for Automotive Power Inverters: SiC and GaN)

  • 김동진;방정환;김민수
    • 마이크로전자및패키징학회지
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    • 제30권2호
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    • pp.43-51
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    • 2023
  • 본 논문에서는 전기차 전력변환 시스템의 근간이 되는 전력반도체 소자의 발전 방향과 차세대 전력반도체 소자인 wide bandgap (WBG)의 특징에 관해 소개하고자 한다. 현재까지의 주류인 Si insulated gate bipolar transistor (IGBT)의 특징에 관해 소개하고, 제조사 별 Si IGBT 개발 방향에 대해 다루었다. 또한 대표적인 WBG 전력반도체 소자인 SiC metal-oxide-semiconductor field-effect transistor (MOSFET)이 가지는 특징을 고찰하여 종래의 Si IGBT 소자 대비 SiC MOSFET이 가지는 효용 및 필요성에 대해 서술하였다. 또한 현 시점에서의 GaN 전력반도체 소자가 가지는 한계 및 그로 인해 전기자동차용 전력변환모듈 용으로 사용하기에 이슈인 점을 서술하였다.

대전된 입자의 영상효과에 의한 필터효율 향상에 관한 실험적 연구 (An Experimental Study on Enhancement of the Filter Efficiency by the Image Effect of Charged Particle)

  • 이창선;정해영;김상수
    • 대한기계학회논문집B
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    • 제24권6호
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    • pp.760-768
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    • 2000
  • Filter efficiency of electrically charged particle in uncharged fibrous filter was measured. In previous studies, the effect of charged particle on filter efficiency was investigated but there was difficulty in measuring of image effect that is appeared at the charged small particle. We could easily measure the image effect with charging small particles by photoelectric charging. The spark discharge aerosol generator and a differential mobility analyzer (DMA) were used to generate sub-micron monodisperse particles (${\leq}200$ nm). The generated particles were charged in photoelectric charging process using ultraviolet lamp and electric field. The filter efficiency of the charged particles, classified by another DMA, was measured in filter tester using a condensation nucleus counter (CNC) as function of particle diameter, particle charge and airflow velocity. It is shown that the filter efficiency increases with increasing charge number of the particle and is affected by particle size and flow velocity. Single fiber filter efficiency mainly depends on image force parameter and peclet number. The peclet number was not considered at previous other papers. We propose a modi fied experimental correlation as function of image force parameter and peclet number.

Photofield-Effect in Amorphous InGaZnO TFTs

  • Fung, Tze-Ching;Chuang, Chiao-Shun;Mullins, Barry G.;Nomura, Kenji;Kamiya, Toshio;Shieh, Han-Ping David;Hosono, Hideo;Kanicki, Jerzy
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2008년도 International Meeting on Information Display
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    • pp.1208-1211
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    • 2008
  • We study the amorphous In-Ga-Zn-O thin-film transistors (TFTs) properties under monochromatic illumination ($\lambda=420nm$) with different intensity. TFT off-state drain current ($I_{DS_off}$) was found to increase with the light intensity while field effect mobility ($\mu_{eff}$) is almost unchanged; only small change was observed for sub-threshold swing (S). Due to photo-generated charge trapping, a negative threshold voltage ($V_{th}$) shift is also observed. The photofield-effect analysis suggests a highly efficient UV photocurrent conversion in a-IGZO TFT. Finally, a-IGZO mid-gap density-of-states (DOS) was extracted and is more than an order lower than reported value for a-Si:H, which can explain a good switching properties of the a-IGZO TFTs.

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