1 |
R.R. Nair, P. Blake, A.N. Grigorenko, K.S. Novoselov, T.J. Booth, T. Stauber, N.M.R. Peres, A.K. Geim, Science, 320, 1308 (2008).
DOI
|
2 |
Y. -M. Lin, C. Dimitrakopoulos, K. A. Jenkins, D. B. Farmer, H. -Y, Chiu, A. Grill, Ph. Avouris, Science, 327, 662 (2010).
DOI
|
3 |
X. Li, W. Cai, J. An, S. Kim, J. Nah, D. Yang, R. Piner, A. Velamakanni, I. Jung, E. Tutuc, S.K. Banerjee, L. Colombo, R.S. Ruoff, Science, 324, 1312 (2009).
DOI
|
4 |
H.H. Kim, S.K. Lee, S.G. Lee, E. Lee, K. Cho, Advanced Functional Materials, 26, 2070 (2016).
DOI
|
5 |
E. Lee, H. Lim, N. -S. Lee, H. H. Kim, Sen. & Actuators B. Chem, 347, 130579 (2021).
DOI
|
6 |
H.H. Kim, J.W. Yang, S.B. Jo, B. Kang, S.K. Lee, H. Bong, G. Lee, K.S. Kim, K. Cho, ACS Nano, 7, 1155 (2013).
DOI
|
7 |
A. Das, S. Pisana, B. Chakraborty, S. Piscanec, S.K. Saha, U. v. Waghmare, K.S. Novoselov, H.R. Krishnamurthy, A.K. Geim, A.C. Ferrari, A.K. Sood, Nature Nanotechnology, 3, 2105 (2008).
|
8 |
E. Lee, S.G. Lee, H.C. Lee, M. Jo, M.S. Yoo, K. Cho, Advanced Materials, 30, 1 (2018).
|
9 |
C. Lee, X. Wei, J.W. Kysar, J. Hone, Science, 321, 385 (2008) .
DOI
|
10 |
I.V.G. and A.A.F. K. S. Novoselov, A. K. Geim, S. V. Morozov, D. Jiang, Y. Zhang, S. V. Dubonos, Science, 306, 666 (2004).
DOI
|
11 |
E. Lee, S.G. Lee, W.H. Lee, H.C. Lee, N.N. Nguyen, M.S. Yoo, K. Cho, Chemistry of Materials, 32, 4544 (2020).
DOI
|
12 |
S. Park, R.S. Ruoff, Nature Nanotechnology, 4, 217 (2009).
DOI
|
13 |
K. v. Emtsev, A. Bostwick, K. Horn, J. Jobst, G.L. Kellogg, L. Ley, J.L. McChesney, T. Ohta, S.A. Reshanov, J. Rohrl, E. Rotenberg, A.K. Schmid, D. Waldmann, H.B. Weber, T. Seyller, Nature Materials, 8, 203 (2008).
DOI
|
14 |
J.H. Chen, C. Jang, S. Adam, M.S. Fuhrer, E.D. Williams, M. Ishigami, Charged-impurity scattering in graphene, Nature Physics, 4, 377 (2008).
DOI
|
15 |
H.H. Kim, Y. Chung, E. Lee, S.K. Lee, K. Cho, Advanced Materials, 26, 3213 (2014).
DOI
|