• Title/Summary/Keyword: Fault detection coverage

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The Software Reliability Evaluation of a Nuclear Controller Software Using a Fault Detection Coverage Based on the Fault Weight (가중치 기반 고장감지 커버리지 방법을 이용한 원전 제어기기 소프트웨어 신뢰도 평가)

  • Lee, Young-Jun;Lee, Jang-Soo;Kim, Young-Kuk
    • KIPS Transactions on Computer and Communication Systems
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    • v.5 no.9
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    • pp.275-284
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    • 2016
  • The software used in the nuclear safety field has been ensured through the development, validation, safety analysis, and quality assurance activities throughout the entire process life cycle from the planning phase to the installation phase. However, this evaluation through the development and validation process needs a lot of time and money, and there are limitations to ensure that the quality is improved enough. Therefore, the effort to calculate the reliability of the software continues for a quantitative evaluation instead of a qualitative evaluation. In this paper, we propose a reliability evaluation method for the software to be used for a specific operation of the digital controller in a nuclear power plant. After injecting weighted faults in the internal space of a developed controller and calculating the ability to detect the injected faults using diagnostic software, we can evaluate the software reliability of a digital controller in a nuclear power plant.

An Object-Oriented Redundant Fault Detection Scheme for Efficient Current Testing (전류 테스팅을 위한 객체 기반의 무해고장 검출 기법)

  • Bae, Sung-Hwan;Kim, Kwan-Woong;Chon, Byoung-Sil
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.27 no.1C
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    • pp.96-102
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    • 2002
  • Current testing(Iddq testing) on monitoring the quiescent power supply current is an efficient and effective method for CMOS bridging faults. The applicability of this technique, however, requires careful examination. Since cardinality of bridging fault is O($n^2$) and current testing requires much longer testing time than voltage testing, it is important to note that a bridging fault is untestable if the two bridged nodes have the same logic values at all times. Such faults should be identified by a good ATPG tool; otherwise, the fault coverage can become skewed. In this paper, we present an object-oriented redundant fault detection scheme for efficient current testing. Experimental results for ISCAS benchmark circuits show that the improved method is more effective than the previous ones.

Identifying SDC-Causing Instructions Based on Random Forests Algorithm

  • Liu, LiPing;Ci, LinLin;Liu, Wei;Yang, Hui
    • KSII Transactions on Internet and Information Systems (TIIS)
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    • v.13 no.3
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    • pp.1566-1582
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    • 2019
  • Silent Data Corruptions (SDCs) is a serious reliability issue in many domains of computer system. The identification and protection of the program instructions that cause SDCs is one of the research hotspots in computer reliability field at present. A lot of solutions have already been proposed to solve this problem. However, many of them are hard to be applied widely due to time-consuming and expensive costs. This paper proposes an intelligent approach named SDCPredictor to identify the instructions that cause SDCs. SDCPredictor identifies SDC-causing Instructions depending on analyzing the static and dynamic features of instructions rather than fault injections. The experimental results demonstrate that SDCPredictor is highly accurate in predicting the SDCs proneness. It can achieve higher fault coverage than previous similar techniques in a moderate time cost.

The method of development for enhancing reliability of missile assembly test set (유도탄 점검 장비의 신뢰성 향상을 위한 개발 방법)

  • Koh, Sang-Hoon;Han, Seok-Choo;Lee, Kye-Shin;Lee, You-Sang;Kim, Young-Kuk;Park, Dong-Hyun
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.19 no.8
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    • pp.37-43
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    • 2018
  • A developer solves problems with isolating failures if faults are detected when inspecting missiles using the missile assembly test set (MATS) and then resumes the testing. In order to identify faults, it is necessary to analyze the data coming from the equipment, but the information received may not be sufficient, depending on the inspection environment. In this case, the developer repeats the test until the problem is reproduced or checks the performance of each piece of equipment that is related to the fault. When this task is added, schedule management becomes problematic, and development costs rise. To solve this problem, we need to design a MATS in a systematic way to increase fault coverage while satisfying the required reliability. By designing the necessary processes for each procedure, it is possible to reduce the fault identification time when a fault is detected during operations. But it is not possible to guarantee 100% fault coverage, so we provide another method by comparing costs and effects. This paper describes a development method to enhance the reliability of the missile assembly test set; it describes the expected effects when it is adapted, and describes the limitations of this method.

Built-In-Test Coverage Analysis Considering Failure Mode of Electronics Components (전자부품 고장모드를 고려한 Built-In-Test 성능분석)

  • Seo, Joon-Ho;Ko, Jin-Young;Park, Han-Joon
    • Journal of the Korean Society for Aeronautical & Space Sciences
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    • v.43 no.5
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    • pp.449-455
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    • 2015
  • Built-In-Test(hereafter: BIT) is necessary functionality for aircraft flight safety and it requires a high failure detection capacity of more than 95 % in the case of avionics equipment. The BIT coverage analysis is needed to make sure that BIT meets its fault diagnosis capability. FMECA is used a lot of for the BIT coverage analysis. However, in this paper, the BIT coverage analysis based on electronic components is introduced to minimize the analytical error. Further, by applying the failure mode of the electronic components and excluding electronic components that do not affect flight safety, the BIT coverage analysis can be more accurate. Finally, BIT demo was performed and it was confirmed that the performance of the actual BIT matches the analysis of BIT performance.

A Configurable Software-based Approach for Detecting CFEs Caused by Transient Faults

  • Liu, Wei;Ci, LinLin;Liu, LiPing
    • KSII Transactions on Internet and Information Systems (TIIS)
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    • v.15 no.5
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    • pp.1829-1846
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    • 2021
  • Transient faults occur in computation units of a processor, which can cause control flow errors (CFEs) and compromise system reliability. The software-based methods perform illegal control flow detection by inserting redundant instructions and monitoring signature. However, the existing methods not only have drawbacks in terms of performance overhead, but also lack of configurability. We propose a configurable approach CCFCA for detecting CFEs. The configurability of CCFCA is implemented by analyzing the criticality of each region and tuning the detecting granularity. For critical regions, program blocks are divided according to space-time overhead and reliability constraints, so that protection intensity can be configured flexibly. For other regions, signature detection algorithms are only used in the first basic block and last basic block. This helps to improve the fault-tolerant efficiency of the CCFCA. At the same time, CCFCA also has the function of solving confusion and instruction self-detection. Our experimental results show that CCFCA incurs only 10.61% performance overhead on average for several C benchmark program and the average undetected error rate is only 9.29%. CCFCA has high error coverage and low overhead compared with similar algorithms. This helps to meet different cost requirements and reliability requirements.

Fault/Attack Management Framework for Network Survivability in Next Generation Optical Internet Backbone (차세대 광 인터넷 백본망에서 망생존성을 위한 Fault/Attack Management 프레임워크)

  • 김성운;이준원
    • Journal of the Institute of Electronics Engineers of Korea TC
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    • v.40 no.10
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    • pp.67-78
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    • 2003
  • As optical network technology advances and high bandwidth Internet is demanded for the exponential growth of internet traffic volumes, the Dense-Wavelength Division Multiplexing (DWDM) networks have been widely accepted as a promising approach to the Next Generation Optical Internet (NGOI) backbone networks for nation wide or global coverage. Important issues in the NGOI based on DWDM networks are the Routing and Wavelength Assignment(RWA) problem and survivability. Especially, fault/attack detection, localization and recovery schemes in All Optical Transport Network(AOTN) is one of the most important issues because a short service disruption in DWDM networks carrying extremely high data rates causes loss of vast traffic volumes. In this paper, we suggest a fault/attack management model for NGOI through analyzing fault/attack vulnerability of various optical backbone network devices and propose fault/attack recovery procedure considering Extended-LMP(Link Management Protocol) and RSVP-TE+(Resource Reservation Protocol-Traffic Engineering) as control protocols in IP/GMPLS over DWDM.

A Testable PLA's Design for Multiple Faults (다중 고장 테스트가 가능한 PLA의 설계)

  • Lee, Jae-Min;Kim, Eun-Sung;Lim, In-Chil
    • Journal of the Korean Institute of Telematics and Electronics
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    • v.23 no.5
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    • pp.666-673
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    • 1986
  • This paper proposes a testable design method of PLA's with low overhead and high fault coverage for multiple faults. Only a shift register and control input of 2-bit decoder are used for extra hardware. By using a control input, the bit lines are controlled effectively. As the fault model, bridging faults and multiple faults of different fault models are particularly considered. 'Fault equivalence relation' and 'dominant faults' are defined to be used for detection of multiple faults. Also, an eadily testable folded PLA by this method is described.

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A Weighted Random Pattern Testing Technique for Path Delay Fault Detection in Combinational Logic Circuits (조합 논리 회로의 경로 지연 고장 검출을 위한 가중화 임의 패턴 테스트 기법)

  • 허용민;임인칠
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.32A no.12
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    • pp.229-240
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    • 1995
  • This paper proposes a new weighted random pattern testing technique to detect path delay faults in combinational logic circuits. When computing the probability of signal transition at primitive logic elements of CUT(Circuit Under Test) by the primary input, the proposed technique uses the information on the structure of CUT for initialization vectors and vectors generated by pseudo random pattern generator for test vectors. We can sensitize many paths by allocating a weight value on signal lines considering the difference of the levels of logic elements. We show that the proposed technique outperforms existing testing method in terms of test length and fault coverage using ISCAS '85 benchmark circuits. We also show that the proposed testing technique generates more robust test vectors for the longest and near-longest paths.

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Testability of Current Testing for Open Faults Undetected by Functional Testing in TTL Combinational Circuits

  • Tsukimoto, Isao;Hashizume, Masaki;Mushiaki, Yukiko;Yotsuyanagi, Hiroyuki;Tamesada, Takeomi
    • Proceedings of the IEEK Conference
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    • 2002.07c
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    • pp.1972-1975
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    • 2002
  • A new test approach based on a supply current test method is proposed for testing open faults in bipolar logic circuits. In the approach, only the open faults are detected by the supply current test method, which are difficult to be detected by functional test methods. The effectiveness of the approach is examined experimentally on open fault detection in TTL combinational circuits. The results shows that higher fault coverage can be established by applying a small number of test input vectors of the supply current test method after test vectors of functional test methods based on stuck-at models.

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