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http://dx.doi.org/10.5762/KAIS.2018.19.8.37

The method of development for enhancing reliability of missile assembly test set  

Koh, Sang-Hoon (PGM Research and Development Lab, LIGNex1 Co., Ltd.)
Han, Seok-Choo (The 1st Research and Development Institute, Agency for Defense Development)
Lee, Kye-Shin (PGM Research and Development Lab, LIGNex1 Co., Ltd.)
Lee, You-Sang (PGM Research and Development Lab, LIGNex1 Co., Ltd.)
Kim, Young-Kuk (PGM Research and Development Lab, LIGNex1 Co., Ltd.)
Park, Dong-Hyun (The 1st Research and Development Institute, Agency for Defense Development)
Publication Information
Journal of the Korea Academia-Industrial cooperation Society / v.19, no.8, 2018 , pp. 37-43 More about this Journal
Abstract
A developer solves problems with isolating failures if faults are detected when inspecting missiles using the missile assembly test set (MATS) and then resumes the testing. In order to identify faults, it is necessary to analyze the data coming from the equipment, but the information received may not be sufficient, depending on the inspection environment. In this case, the developer repeats the test until the problem is reproduced or checks the performance of each piece of equipment that is related to the fault. When this task is added, schedule management becomes problematic, and development costs rise. To solve this problem, we need to design a MATS in a systematic way to increase fault coverage while satisfying the required reliability. By designing the necessary processes for each procedure, it is possible to reduce the fault identification time when a fault is detected during operations. But it is not possible to guarantee 100% fault coverage, so we provide another method by comparing costs and effects. This paper describes a development method to enhance the reliability of the missile assembly test set; it describes the expected effects when it is adapted, and describes the limitations of this method.
Keywords
MATS(Missile Assembly Test Set); Fault Detection; Failure Isolation; Fault coverage; BIT(Built In Test);
Citations & Related Records
Times Cited By KSCI : 2  (Citation Analysis)
연도 인용수 순위
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