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http://dx.doi.org/10.5139/JKSAS.2015.43.5.449

Built-In-Test Coverage Analysis Considering Failure Mode of Electronics Components  

Seo, Joon-Ho (SAMSUNG THALES Co.)
Ko, Jin-Young (SAMSUNG THALES Co.)
Park, Han-Joon (SAMSUNG THALES Co.)
Publication Information
Journal of the Korean Society for Aeronautical & Space Sciences / v.43, no.5, 2015 , pp. 449-455 More about this Journal
Abstract
Built-In-Test(hereafter: BIT) is necessary functionality for aircraft flight safety and it requires a high failure detection capacity of more than 95 % in the case of avionics equipment. The BIT coverage analysis is needed to make sure that BIT meets its fault diagnosis capability. FMECA is used a lot of for the BIT coverage analysis. However, in this paper, the BIT coverage analysis based on electronic components is introduced to minimize the analytical error. Further, by applying the failure mode of the electronic components and excluding electronic components that do not affect flight safety, the BIT coverage analysis can be more accurate. Finally, BIT demo was performed and it was confirmed that the performance of the actual BIT matches the analysis of BIT performance.
Keywords
Built-In-Test; Failure Mode; Failure Detection Rate; Failure Isolation Rate;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
연도 인용수 순위
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