• Applied Microscopy
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• v.44 no.3
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• pp.100-104
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• 2014

As decreasing device size, probing of nanoscale surface properties becomes more significant. In particular, nanoscale probing of surface potential has paid much attention for understanding various surface phenomena. In this article, we review different atomic force microscopy techniques, including electrostatic force microscopy and Kelvin probe force microscopy, for measuring surface potential at the nanoscale. The review could provide fundamental information on the probing method of surface potential using atomic force microscopy.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.6 no.1
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• pp.12-16
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• 2005

We used electrostatic force microscopy to probe carbon nanotubes. There is a linear relationship between the phase shift (${\Delta}{\phi}^{-l/2}$) and the inverse tube length ($L^{-1}$) of carbon nanotubes. When the distance(h) between the tip and the carbon nanotubes increase, the phase shift on EFM image decrease by a factor of $1/h^2$

• Applied Microscopy
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• v.51
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• pp.7.1-7.9
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• 2021

Neuromorphic systems require integrated structures with high-density memory and selector devices to avoid interference and recognition errors between neighboring memory cells. To improve the performance of a selector device, it is important to understand the characteristics of the switching process. As changes by switching cycle occur at local nanoscale areas, a high-resolution analysis method is needed to investigate this phenomenon. Atomic force microscopy (AFM) is used to analyze the local changes because it offers nanoscale detection with high-resolution capabilities. This review introduces various types of AFM such as conductive AFM (C-AFM), electrostatic force microscopy (EFM), and Kelvin probe force microscopy (KPFM) to study switching behaviors.

• Proceedings of the Korean Fiber Society Conference
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• 2007.11a
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• pp.10-12
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• 2007

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• New Physics: Sae Mulli
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• v.68 no.11
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• pp.1173-1182
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• 2018

Mesoporous silica allows proper hydration of an ion exchange membrane under low relative humidity due to its strong hydrophilicity and structural characteristic. A mesoporous silica and Nafion composite membrane shows good proton conductivity under low relative humidity. An understanding of ion-channel formation and proton transfer through an ion-channel network in mesoporous silica and Nafion composite membranes is essential for the development and the optimization of ion exchange membranes. In this study, a mesoporous cellular foam $SiO_2/Nafion$ composite membrane is fabricated, and its proton conductivity and performance are measured. Also, the ion-channel distribution is analyzed by using electrostatic force microscopy to measure the surface charge density of the mesoporous cellular foam $SiO_2/Nafion$ composite membrane. The research reveals a few remarkable results. First, the composite membrane shows excellent proton conductivity and performance under low relative humidity. Second, the composite membrane is observed to form ion-channel-rich and ion-channel-poor region locally.

• Applied Microscopy
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• v.51
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• pp.8.1-8.7
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• 2021

Growing demands for comprehending complicated nano-scale phenomena in atomic resolution has attracted in-situ transmission electron microscopy (TEM) techniques for understanding their dynamics. However, simple to safe TEM sample preparation for in-situ observation has been limited. Here, we suggested the optical microscopy based micro-manipulating system for transferring TEM samples. By adopting our manipulator system, several types of samples from nano-wires to plate-like thin samples were transferred on micro-electro mechanical systems (MEMS) chip in a single step. Furthermore, the control of electrostatic force between the sample and the probe tip is found to be a key role in transferring process.

• Proceedings of the KIEE Conference
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• 2004.11a
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• pp.95-97
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• 2004

본 연구에서는 Scanning Capacitance Microscopy (SCM)와 Electrostatic Force Microscopy (EFM)을 이용하여 국소영역에서 실리콘나노 크리스탈의 전기적 특성을 분석하였다. 실리콘 나노 크리스탈은 에어로솔 방식으로 P-type 실리콘웨이퍼 위에 $10{\sim}40\;nm$의 크기와 약 $10^{11}/cm^2$의 밀도를 갖도록 제작하였다. 실리콘 나노 크리스탈에서 전자와 정공의 trapping 현상은 EFM, SCM 이미지를 통하여 관찰하였고 이러한 나노 크리스탈의 국소영역 특성을 MOS 캐패시터 구조의 C-V 특성을 비교 분석하였다. 또한, 나노 크리스탈에 trapping된 전하의 detrapping 과정을 스트레스 조건에 따라 분석하였다.

• Journal of the Korean Society for Precision Engineering
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• v.21 no.9
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• pp.12-19
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• 2004

수십 MN(10/sup 6/ N) 이상의 하중을 다루는 건설산업 및 중공업으로부터 수십 kN- 수 MN의 힘을 사용하는 재료시험기, 프레스, 및 공장 자동화설비 그리고 수십 N-수 kN 용량의 상업용 저울까지 힘 측정은 산업의 근간이 되는 기술이며 우리 실생활에 폭 넓게 이용되고 있다. 제품을 생산하고 대형 구조물을 건설하는 공장이나 건축현장에서 힘을 정확히 측정한다는 것은 공정을 일정하게 유지 관리하고 있다는 표시이므로 제품의 품질관리나 건축물의 안전관리의 척도가 된다. (중략)

• Journal of the Korean Vacuum Society
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• v.16 no.1
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• pp.33-39
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• 2007

Electrical and mechanical modifications of devices based on carbon nanotubes(CNTs) using an atomic force microscope(AFM) in the forms of cutting and reconnection of CNTs are demonstrated. In addition to the modifications, electrostatic force microscopy is used to visualize the cutting and reconnection of CNTs. In this way, AFM is shown to be a useful tool in local modifications and manipulations of CNT-based devices.

• Applied Microscopy
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• v.45 no.4
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• pp.208-213
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• 2015

Nanomanipulators installed in focused ion beam (FIB), which is used in the lift-out of lamella when preparing transmission electron microscopy specimens, have recently been employed for electrical resistance measurements, tensile and compression tests, and in situ reactions. During the pick-up process of a single nanowire (NW), there are crucial problems such as Pt, C and Ga contaminations, damage by ion beam, and adhesion force by electrostatic attraction and residual solvent. On the other hand, many empirical techniques should be considered for successful pick-up process, because NWs have the diverse size, shape, and angle on the growth substrate. The most important one in the in-situ precedence, therefore, is to select the optimum pick-up process of a single NW. Here we provide the advanced methodologies when manipulating NWs for in-situ mechanical and electrical measurements in FIB.