Advanced Methodologies for Manipulating Nanoscale Features in Focused Ion Beam |
Kim, Yang-Hee
(Advanced Analysis Center, Korea Institute of Science and Technology (KIST))
Seo, Jong-Hyun (Advanced Analysis Center, Korea Institute of Science and Technology (KIST)) Lee, Ji Yeong (Advanced Analysis Center, Korea Institute of Science and Technology (KIST)) Ahn, Jae-Pyoung (Advanced Analysis Center, Korea Institute of Science and Technology (KIST)) |
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