Browse > Article
http://dx.doi.org/10.9729/AM.2014.44.3.100

Probing of Surface Potential Using Atomic Force Microscopy  

Kwon, Owoong (School of Advanced Materials Science and Engineering, Sungkyunkwan University)
Kim, Yunseok (School of Advanced Materials Science and Engineering, Sungkyunkwan University)
Publication Information
Applied Microscopy / v.44, no.3, 2014 , pp. 100-104 More about this Journal
Abstract
As decreasing device size, probing of nanoscale surface properties becomes more significant. In particular, nanoscale probing of surface potential has paid much attention for understanding various surface phenomena. In this article, we review different atomic force microscopy techniques, including electrostatic force microscopy and Kelvin probe force microscopy, for measuring surface potential at the nanoscale. The review could provide fundamental information on the probing method of surface potential using atomic force microscopy.
Keywords
Atmomic force microscopy; Electrostatic force microscopy; Kelvin probe force microscopy; Surface potential; Surface charge;
Citations & Related Records
연도 인용수 순위
  • Reference
1 Takeuchi O, Ohrai Y, Yoshida S, and Shigekawa H (2007) Kelvin probe force microscopy without bias-voltage feedback. Jpn. J. Appl. Phys. 46, 5626-5630.   DOI
2 Vasudevan R, Marincel D, Jesse S, Kim Y, Kumar A, Kalinin S, and Trolier-Mckinstry S (2013) Polarization dynamics in ferroelectric capacitors: local perspective on emergent collective behavior and memory effects. Adv. Funct. Mater. 23, 2490-2508.   DOI
3 Wu Y and Shannon M A (2006) ac driving amplitude dependent systematic error in scanning Kelvin probe microscope measurements: detection and correction. Rev. Sci. Instrum. 77, 043711.   DOI
4 Yoo H, Bae C, Yang Y, Lee S, Kim M, Kim Y, and Shin H (2014) Spatial charge separation in asymmetric nanostructure of Au nanoparticle on $TiO_2$ nanotube by light-induced surface potential imaging. Nano Lett. 14, 4413-4417.   DOI
5 Girard P (2001) Electrostatic force microscopy: principles and some applications to semiconductors. Nanotechnology 12, 485-490.   DOI   ScienceOn
6 Hong J, Kim Y, Paik H, No K, and Lukes J R (2009) The effect of nitrogen incorporation on surface properties of silicon oxynitride films. Phys. Rapid Res. Lett. 3, 25-27.
7 Jacobs H O, Knapp H F, and Stemmer A (1999) Practical aspects of Kelvin probe force microscopy. Rev. Sci. Instrum. 70, 1756-1760.   DOI   ScienceOn
8 Kalinin S V and Bonnell D A (2001) Local potential and polarization screening on ferroelectric surfaces. Phys. Rev. B 63, 125411.   DOI
9 Kalinin S V and Bonnell D A (2004) Screening phenomena on oxide surfaces and its implications for local electrostatic and transport measurements. Nano Lett. 4, 555-560.   DOI
10 Kelvin L (1898) Contact electricity of metals. Philos. Mag. 46, 82-120.   DOI
11 Kim Y, Park M, Buhlmann S, Hong S, Kim Y K, Ko H, Kim J, and No K (2010) Effect of local surface potential distribution on its relaxation in polycrystalline ferroelectric films. J. Appl. Phys. 107, 054103.   DOI
12 Li G Y, Mao B, Lan F, and Liu L M (2012) Practical aspects of single-pass scan Kelvin probe force microscopy. Rev. Sci. Instrum. 83, 113701.   DOI
13 Gady B, Schleef D, Reifenberer R, Rimai D, and DeMejo L P (1996) Identification of electrostatic and van der Waals interaction forces between a micrometer-size sphere and a flat substrate. Phys. Rev. B 53, 8065-8070.   DOI
14 Nonnenmacher M, O'Boyle M P, and Wickramasinghe H K (1991) Kelvin probe force microscopy. Appl. Phys. Lett. 58, 2921-2923.   DOI
15 Palermo V, Palma M, and Samori P (2006) Electronic characterization of organic thin films by Kelvin probe force microscopy. Adv. Mater. 18, 145-164.   DOI   ScienceOn
16 Takahashi T, Kawamukai T, Ono S, Noda T, and Sakaki H (2000) Kelvin probe force microscopy on InAs thin films on (110) GaAs substrates. Jpn. J. Appl. Phys. 39, 3721-3723.   DOI
17 Coffey D C and Ginger D S (2006) Time-resolved electrostatic force microscopy of polymer solar cells. Nat. Mater. 5, 735-740.   DOI   ScienceOn
18 Collins L, Kilpatrick J I, Weber S A L, Tselev A, Vlassiouk I V, Ivanov I N, Jesse S, Kalinin S V, and Rodriguez B J (2013) Open loop Kelvin probe force microscopy with single and multi-frequency excitation. Nanotechnology 24, 475702.   DOI
19 Sadewasser S (2012) Experimental technique and working modes. In: Kelvin Probe Force Microscopy, ed. Glatzel T, pp. 7-24, (Springer, Heidelberg).
20 Ellison D J, Lee B, Podzorov V, and Frisbie C D (2011) Surface potential mapping of SAM-functionalized organic semiconductors by Kelvin probe force microscopy. Adv. Mater. 23, 502-507.   DOI