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http://dx.doi.org/10.5757/JKVS.2007.16.1.033

Modification and Repair of a Carbon Nanotube-based Device Using an Atomic Force Microscope  

Park, Ji-Yong (Division of Energy Systems Research, Ajou University)
Kim, Yong-Sun (Division of Energy Systems Research, Ajou University)
Oh, Young-Mu (Division of Energy Systems Research, Ajou University)
Publication Information
Journal of the Korean Vacuum Society / v.16, no.1, 2007 , pp. 33-39 More about this Journal
Abstract
Electrical and mechanical modifications of devices based on carbon nanotubes(CNTs) using an atomic force microscope(AFM) in the forms of cutting and reconnection of CNTs are demonstrated. In addition to the modifications, electrostatic force microscopy is used to visualize the cutting and reconnection of CNTs. In this way, AFM is shown to be a useful tool in local modifications and manipulations of CNT-based devices.
Keywords
Carbon nanotube; Molecular control; Molecular manipulation; Atomic force microscopy;
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