• 한국마이크로전자및패키징학회:학술대회논문집
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• 한국마이크로전자및패키징학회 2000년도 추계 기술심포지움 논문집
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• pp.57-57
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• 2000

본 논문에서는 MCM 및 패키지의 Lid로 사용되는 합금인 Kovar (Fe-Ni-Co alloy) 와 LTCC (Low Temperature Co-fired Ceramics) 간의 Brazing 특성을 연구하였다. 기존에 사용되고 있는 알루미나 패키지의 경우, 주로 80$0^{\circ}C$ 이상의 온도에서 Brazing을 실시하고 있으며, 조성은 Ag-Cu 계열을 사용하고 있다. 하지만, LTCC 의 경우, 소결온도가 85$0^{\circ}C$ 내외로서 기존의 방법을 그대로 적용하기는 어려움이 있다. 또한 Brazing 특성에 따른 접착 강도는 Brazing Alloy 의 영향뿐만 아니라 LTCC 와 전도체 전극사이의 Metallization 에 크게 영향을 받는다. 따라서, 본 논문에서는 Brazing Alloy의 종류 (Ag-Cu, Au-Sn) 및 Brazing 조건에 따른 Brazing 특성뿐만 아니라, 전도체 전극내 유리질 함량에 따른 Brazing 특성을 평가하여 LTCC/Kovar 간의 최적의 Brazing 조건을 구현하고자 하였다.

• 반도체디스플레이기술학회지
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• 제20권4호
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• pp.167-170
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• 2021

Integrated passive device (IPD) technology has emerged with the need for 5G. In order to integrate and miniaturize capacitors inside IPD, various studies are actively performed using high-k materials and trench structures. In this paper, an EM(Electromagnetic) simulation study was performed by applying an oxide dielectric to the capacitors having a various trench type structures. Commercially available materials HfO₂, Al₂O₃, and Ta₂O₅ are applied to non, circle, trefoil, and quatrefoil type trench structures to confirm changes in each material or structure. As a result, the bigger the capacitor area and the higher dielectric constant of the oxide dielectric, the insertion loss tended to decrease.

• 한국생산제조학회지
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• 제21권2호
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• pp.297-304
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• 2012

Recently RFID (Radio Frequency Identification) technology advances in wireless communication technologies are bringing new challenges. But RFID tag packaging technology has been lagging compared to the demand, so this technology is being required to improve reliability. In this paper, reliability comparison among 11 types of most commonly used epoxy molding in electrical/electronic components packaging has been made through analysis of confidentiality using a humidity sensor. Consequently, the variation of moisture penetration time causes has been verified by the changes in molding thickness for 3 types of epoxy, and from the result, the best experimental results were observed in terms of confidentiality. Moreover we have been confirmed the relationship between confidentiality, the molding thickness, and thermal property of epoxy through thermal analysis.

• 마이크로전자및패키징학회지
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• 제26권3호
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• pp.63-69
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• 2019

전자부품에 대한 보드실장은 아직까지 솔더를 이용한 접합기술을 주로 이용하고 있다. 그러나, 솔더의 크? 및 피로특성으로 인한 접합부 내구한계로, 자동차 전장모듈에서는 반영구적인 접합기술인 프레스 핏(Press-fit) 접합기술 적용을 확대하고 있다. 프레스 핏 접합은 프레스 핏 금속단자를 보드내 쓰루 홀(Through hole)에 기계적으로 삽입하여 체결하는 접합기술로써, 적절한 금속단자의 소성변형으로 쓰루 홀 내부 표면접합을 밀착시킴으로써 강건한 접합을 유도한다. 본 논문에서는 보드내 쓰루 홀 크기 및 표면처리에 따른 프레스 핏 접합 특성 및 신뢰성을 솔더링과 함께 비교하기 위해, 보드 쓰루 홀 크기에 따른 삽입강도 및 삽발강도를 평가하였으며, 열충격 시험을 통한 실시간 저항변화를 통해 프레스 핏 및 솔더링 접합부의 저항변화를 관찰하였다. 또한, 각 접합부위 분석을 통한 프레스 핏 및 솔더링 접합열화를 분석하여 주요 파손모드를 고찰하고자 하였다.

• 마이크로전자및패키징학회지
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• 제27권2호
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• pp.1-10
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• 2020

The technology and market size of image sensors continue to develop thanks to the release of image sensors that exceed 100 million pixels in 2019 and expansion of black box camera markets for vehicles in addition to existing mobile applications. We review the technology flow of image sensors that have been constantly evolving for 40 years since Hitachi launched a 200,000-pixel image sensor in 1979. Although CCD has made inroads into image sensor market for a while based on good picture quality, CMOS image sensor (CIS) with active pixels has made inroads into the market as semiconductor technology continues to develop, since the electrons generated by the incident light are converted to the electric signals in the pixel, and the power consumption is low. CIS image sensors with superior characteristics such as high resolution, high sensitivity, low power consumption, low noise and vivid color continue to be released as the new technologies are incorporated. At present, new types of structures such as Backside Illumination and Isolation Cell have been adopted, with better sensitivity and high S/N ratio. In the future, new photoconductive materials are expected to be adopted as a light absorption part in place of the pn junction.

• 마이크로전자및패키징학회지
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• 제12권1호
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• pp.9-16
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• 2005

This paper presents the development of new anisotropic conductive adhesives with enhanced thermal conductivity for the wide use of adhesive flip chip technology with improved reliability under high current density condition. The continuing downscaling of structural profiles and increase in inter-connection density in flip chip packaging using ACAs has given rise to reliability problem under high current density. In detail, as the bump size is reduced, the current density through bump is also increased. This increased current density also causes new failure mechanism such as interface degradation due to inter-metallic compound formation and adhesive swelling due to high current stressing, especially in high current density interconnection, in which high junction temperature enhances such failure mechanism. Therefore, it is necessary for the ACA to become thermal transfer medium to improve the lifetime of ACA flip chip joint under high current stressing condition. We developed thermally conductive ACA of 0.63 W/m$\cdot$K thermal conductivity using the formulation incorporating $5 {\mu}m$ Ni and $0.2{\mu}m$ SiC-filled epoxy-bated binder system to achieve acceptable viscosity, curing property, and other thermo-mechanical properties such as low CTE and high modulus. The current carrying capability of ACA flip chip joints was improved up to 6.7 A by use of thermally conductive ACA compared to conventional ACA. Electrical reliability of thermally conductive ACA flip chip joint under current stressing condition was also improved showing stable electrical conductivity of flip chip joints. The high current carrying capability and improved electrical reliability of thermally conductive ACA flip chip joint under current stressing test is mainly due to the effective heat dissipation by thermally conductive adhesive around Au stud bumps/ACA/PCB pads structure.

• 마이크로전자및패키징학회지
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• 제23권2호
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• pp.11-18
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• 2016

This study focused on examining the possibility for recycling of Fe-Si electric sheet. We manufactured Fe-6.5Si mother alloy using by Fe-Si electric sheet scrap for transformer core materials. And then, soft magnetic alloy powder which diameter and shape were $45{\sim}150{\mu}m$ and sphere type was prepared by gas atomization process. As we compared to commercial Fe-6.5Si powder, its diameter distribution and microstructure of recycled powder was a similar. To investigate the possibility of reusing the soft magnetic composite sheet for electronics, recycled powder was treated to have a high aspect ratio (AR), and we finally obtained the 65~66 AR and $2.3{\mu}m$ thickness powder. To release the residual stress of powder, heat treatment was conducted under $300{\sim}400^{\circ}C$, $N_2$ gas. And then, soft magnetic sheet was made by tape casting process using by those powders. After the density and permeability of tape was measured, and we confirmed that the recycled Fe-Si electric sheet scrap was possible to reuse the soft magnetic materials of electronics.

• 한국마이크로전자및패키징학회:학술대회논문집
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• 한국마이크로전자및패키징학회 2000년도 추계 기술심포지움 논문집
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• pp.61-64
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• 2000

IMT 2000 단말기용 2.14 GHz 대역의 저잡음 증폭기 (Low Noise Amplifier, LNA)를 MCM-C 기술을 이용하여 제작하고 그 특성을 측정하였다. 먼저 저잡음 증폭기 회로를 설계한 후, 각 소자들의 고주파 library를 이용한 회로 시뮬레이션으로과 특성을 확인하였다. 시뮬레이션 상에서 이득(Gain)은 17 dB 였으며, 잡음지수 (Noise Figure)는 1.4 dB 였다. MCM-C 저잡음 증폭기는 LTCC 기판과 전극 및 저항체의 동시소성에 의해 코일(L), 콘덴서(C), 저항(R)을 기판 내부에 넣었으며, 마이크로 스트립 라인과 SMD 부품의 실장을 위한 Pad를 최상부에 제작하였다. 기판은 총 6 층으로 구성하였으며, 내부에 포함된 수동소자는 코일 2개, 콘덴서 2개, 저항 3개 등 총 7 개 였다. 시작품의 특성 측정 결과, 2.14 GHz에서 이득은 14.7 dB 였으며, 잡음지수는 1.5 dB 정도의 값을 가졌다.

• 대한전자공학회논문지SD
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• 제43권9호
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• pp.64-68
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• 2006

본 연구에서는 Si bump를 이용해 기판의 기계적, 열적 특성을 개선한 MCM-D 기판공정을 개발하였고, 이를 system-on-package(SOP)-D개념의 system 구현에 적용하고자 하였다. 이 과정에서 밀리미터파 대역에 적용될 수 있는 필터를 설계하고 구현하여 그 특성을 관찰하였다. 두 가지 형태의 필터를 구현하였는데 첫 번째는 공진기간의 커플링을 이용한 구조로서 2층의 금속층과 3층의 유전체(BCB)를 이용하였다. 구현된 필터 특성은 중심주파수 55 GHz에서의 삽입손실이 2.6 dB이고 군지연이 0.06 ns정도로 우수한 특성을 나타내었다. 또한 일반적으로 알려진coupled line 형태의 필터를 구현하였는데 삽입손실이 3 dB, 군지연이 0.1 ns정도의 특성을 나타내었다. 이렇게 내장형 필터를 포함한 MCM-D 기판은 MMIC를 flip-chip 방법으로 실장 할 수 있어서 집적화된 밀리미터파 대역 초소형 system 구현에 적용되어 우수한 특성을 나타낼 것으로 기대된다.

• 마이크로전자및패키징학회지
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• 제20권4호
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• pp.53-58
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• 2013

An innovative packaging solution, Flip Chip with Copper (Cu) Column bond on lead (BOL) Enhanced Process (fcCuBE$^{(R)}$) delivers a cost effective, high performance packaging solution over typical bond on capture pad (BOC) technology. These advantages include improved routing efficiency on the substrate top layer thus allowing conversion functionality; furthermore, package cost is lowered by means of reduced substrate layer count and removal of solder on pad (SOP). On the other hand, as electronic packaging technology develops to meet the miniaturization trend from consumer demand, reliability testing will become an important issue in advanced technology area. In particular, electromigration (EM) of flip chip bumps is an increasing reliability concern in the manufacturing of integrated circuit (IC) components and electronic systems. This paper presents the results on EM characteristics on BOL and BOC structures under electrical current stressing in order to investigate the comparison between two different typed structures. EM data was collected for over 7000 hours under accelerated conditions (temperatures: $125^{\circ}C$, $135^{\circ}C$, and $150^{\circ}C$ and stress current: 300 mA, 400 mA, and 500 mA). All samples have been tested without any failures, however, we attempted to find morphologies induced by EM effects through cross-sectional analysis and investigated the interfacial reaction characteristics between BOL and BOC structures under current stressing. EM damage was observed at the solder joint of BOC structure but the BOL structure did not show any damage from the effects of EM. The EM data indicates that the fcCuBE$^{(R)}$ BOL Cu column bump provides a significantly better EM reliability.