• Title/Summary/Keyword: Electronic devices

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Fabrications and Characterizations of InGaN/GaN Quantum Well Light Emitting Devices Including Photonic Crystal Nanocavity Structures (광결정 Nanocavity를 갖는 InGaN/GaN 양자우물구조의 청색 광소자 공정 및 특성평가)

  • Choi, Jae-Ho;Lee, Jung-Tack;Kim, Keun-Joo
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.22 no.12
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    • pp.1045-1057
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    • 2009
  • The authors investigated the InGaN/GaN multi-quantum well blue light emitting devices with the implementation of the photonic crystals fabricated at the top surface of p-GaN layer and the bottom interface of n-GaN layer. The top photonic crystals result in the lattice-dependent photoluminescence spectra at the wavelength of 450 nm and however, the bottom photonic crystal shows a big shift of the photoluminescence peak from 444 nm to 394 nm. The sample with the bottom photonic crystal structure also shows the lasing effect at the wavelength of 468 nm. Furthermore, the quality enhancement for the crystal growth of GaN thin film on the bottom photonic crystal comes from the modulated compressive stress which was measured by the micro-Raman spectroscopy.

A Study on the Development of Chalcogenide-based ReRAM{Resistance RAM) Device with Holographic Lithography Method (Holographic Lithography 방법을 적용한 Chalcogenide-based ReRAM(Resistance RAM) 소자의 개발에 관한 연구)

  • Nam, Ki-Hyun;Chung, Hong-Bay
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.22 no.12
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    • pp.1014-1017
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    • 2009
  • In this study, we studied the nature of thin films formed by holographic photodoping chalcogenide thin films with for use in programmable metallization cell devices(PMC), a type of ReRAM. We formatted straight conduction pathway from the internal interferences of the diffraction gratings which is builded by the holographic lithography method. We investigated the resistance change of solid-electrolyte chalcogenide thin films varied in the applied voltage bias direction from about $1\;M{\Omega}$ to several hundreds of $\Omega$. The switching characteristics of the devices applied holographic lithography method was more improved than ultraviolet exposure condition. As a result of improved resistance change effects, we can analogize that the diffraction gratings is a kind of pattern for straight conduction pathway formation inside the chalcogenide thin films.

A Study on the Molecular Orientation of Po1yamic Acid Alkylamine Salt Langmuir-Blodgett Films (Polyamic Acid 알킬아민 염 랭뮤어-블로젯막의 분자 배향에 관한 연구)

  • 정순욱;임현성
    • Proceedings of the Korean Institute of Navigation and Port Research Conference
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    • 2000.11a
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    • pp.53.1-56
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    • 2000
  • Langmuir-Blodgett(LB) technique is the best candidate for the future molecular electronic devices. But, these molecular thin film devices require the bulk properties that are influenced by the molecular orientations. So, this is of current interest in molecular electronic device fabrications of new materials. In this study, quantitative evaluation of molecular orientation in LB films of PAAS was performed by comparing the absorption intensities of the FT-IR transmission and reflection-absorption spectra and the polarized UV/visible absorption spectra. It was found that the polar angle($\theta$) of the dipole moment is about 68$^{\circ}$and the tilting angle of the alkyl chain is about $11.5^{\circ}$ .

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Structure-Dependent Subthreshold Swings for Double-gate MOSFETs

  • Han, Ji-Hyeong;Jung, Hak-Kee;Park, Choon-Shik
    • Journal of information and communication convergence engineering
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    • v.9 no.5
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    • pp.583-586
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    • 2011
  • In this paper, subthreshold swing characteristics have been presented for double-gate MOSFETs, using the analytical model based on series form of potential distribution. Subthreshold swing is very important factor for digital devices because of determination of ON and OFF. In general, subthreshold swings have to be under 100mV/dec. The channel length $L_g$ is varied from 30nm to 100nm, and channel thickness $t_{si}$ from 15 to 20nm according to channel length, and oxide thickness 5nm to investigate subthreshold swing. The doping of channel is fixed with $10^{16}cm^{-3}$ p-type. The results show good agreement with numerical simulations, confirming this model.

Protection Effects Associated with Installation Conditions of SPD (SPD의 설치조건이 보호효과에 미치는 영향)

  • Lee, Bok-Hee;Lee, Dong-Moon;Jeong, Dong-Cheol;Lee, Seung-Chil
    • Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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    • 2005.05a
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    • pp.298-302
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    • 2005
  • This paper presents the protection effect of SPDs according to installation conditions. To develop the effective protection countermeasures of information and communication equipments against lightning surges, actual-sized experiments in relation to the protection effects on the installation positions of surge protective devices(SPDs), the length of branch circuit the materials and long of conduit were conducted. The best method for protecting the electronic equipments from surges is to install the SPD at the front point of the devices to be protected. The installation method of the metal conduit bonded with common ground conductor were more effective than that of the PVC conduit.

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High Voltage IGBT Improvement of Electrical Characteristics (고내압 IGBT의 전기적 특성 향상에 관한 연구)

  • Ahn, Byoung-Sup;Chung, Hun-Suk;Jung, Eun-Sik;Kim, Seong-Jong;Kang, Ey-Goo
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.25 no.3
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    • pp.187-192
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    • 2012
  • Development of new efficient, high voltage switching devices with wide safe operating area and low on-state losses has received considerable attention in recent years. One of those structures with a very effective geometrical design is the trench gate Insulated Gate Bipolar Transistor(IGBT).power IGBT devices are optimized for high-voltage low-power design, decided to aim. Class 1,200 V NPT Planer IGBT, 1,200 V NPT Trench IGBT for class has been studied.

Metal-Oxide-Semiconductor Photoelectric Devices (Metal-Oxide-Semiconductor 광전소자)

  • Kang, Kilmo;Yun, Ju-Hyung;Park, Yun Chang;Kim, Joondong
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.27 no.5
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    • pp.276-281
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    • 2014
  • A high-responsive Schottky device has been achieved by forming a thin metal deposition on a Si substrate. Two-different metals of Ni and Ag were used as a Schottky metal contact with a thickness about 10 nm. The barrier height formation between metal and Si determines the rectifying current profiles. Ag-embedding Schottky device gave an extremely high response of 17,881 at a wavelength of 900 nm. An efficient design of Schottky device may applied for photoelectric devices, including photodetectors and solar cells.

Optimization of Reverse Engineering Processes for Cu Interconnected Devices

  • Koh, Jin Won;Yang, Jun Mo;Lee, Hyung Gyoo;Park, Keun Hyung
    • Transactions on Electrical and Electronic Materials
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    • v.14 no.6
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    • pp.304-307
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    • 2013
  • Reverse engineering of semiconductor devices utilizes delayering processes, in order to identify how the interconnection lines are stacked over transistor gates. Cu metal has been used in recent fabrication technologies, and de-processes becomes more difficult with the shrinking device dimensions. In this article, reverse engineering technologies to reveal the Cu interconnection lines and Cu via-plugs embedded in dielectric layers are investigated. Stacked dielectric layers are removed by $CF_4$ plasma etching, then the exposed planar Cu metal lines and via-plugs are selectively delineated by wet chemical solution, instead of the commonly used plasma-based dry etch. As a result, we have been successful in extracting the layouts of multiple layers within a system IC, and this technique can be applicable to other logic IC, analog IC, and CMOS IC, etc.

Some Device Design Considerations to Enhance the Performance of DG-MOSFETs

  • Mohapatra, S.K.;Pradhan, K.P.;Sahu, P.K.
    • Transactions on Electrical and Electronic Materials
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    • v.14 no.6
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    • pp.291-294
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    • 2013
  • When subjected to a change in dimensions, the device performance decreases. Multi-gate SOI devices, viz. the Double Gate MOSFET (DG-MOSFET), are expected to make inroads into integrated circuit applications previously dominated exclusively by planar MOSFETs. The primary focus of attention is how channel engineering (i.e. Graded Channel (GC)) and gate engineering (i.e. Dual Insulator (DI)) as gate oxide) creates an effect on the device performance, specifically, leakage current ($I_{off}$), on current ($I_{on}$), and DIBL. This study examines the performance of the devices, by virtue of a simulation analysis, in conjunction with N-channel DG-MOSFETs. The important parameters for improvement in circuit speed and power consumption are discussed. From the analysis, DG-DI MOSFET is the most suitable candidate for high speed switching application, simultaneously providing better performance as an amplifier.

Radiator Cooling Fan System by Switched Reluctance Motor for Automobiles (SRM을 이용한 자동차용 Radiator 냉각팬 구동시스템)

  • Yoon, Yong-Ho;Kim, Jae-Moon;Park, Sang-Hoon;Won, Chung-Yuen
    • The Transactions of the Korean Institute of Electrical Engineers P
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    • v.58 no.3
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    • pp.235-240
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    • 2009
  • In automobile, the introduction of electronically commutated motors has been accompanied by a proliferation of electronic devices. With this proliferation of electronic devices, an emphasis has been placed on EMC issues. This paper is proposed to use SRM as a radiator cooling fan in automotive applications. To drive SRM, Energy efficient C-dump converter is applied. Energy efficient C-dump converter, derived from the conventional C-dump converter, is proposed as a switched reluctance motor (SRM) drive for automotive engine cooling application. It is verified more efficient than other converters through simulation and experiments. And also SRM is valid for automotive applications that have strict EMC standards. Simulation and experimental results obtained on a laboratory prototype are finally presented to evaluate the performance.