• 품질경영학회지
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• 제26권2호
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• pp.51-60
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• 1998

Exponetially weighted moving average(EWMA) control chart to simultaneously monitor correlation coefficients of several correlated quality variables under multivariate normal process are proposed. Performances of the proposed control charts are measured in terms of average run length(ARL) by simulation. Numerical results show that smaller values of smoothing constant are more efficient in terms of ARL.

• 품질경영학회지
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• 제38권2호
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• pp.190-201
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• 2010

This research proposes a method for designing VSI (Variable Sampling Interval) control charts with supplementary run rules. The basic idea is to apply various run rules and the VSI scheme to a control chart in order to increase the sensitivity. The sampling process of the VSI run rules chart is constructed by Markov chain approach. A procedure for designing the VSI run rules chart is proposed based on Lorenzen and Vance's model. Sensitivity study shows that the VSI run rules charts outperform the FSI (Fixed Sampling Interval) run rules charts for wide range of process mean shifts. A major advantage of the VSI run rules chart over other charts such as CUSUM, EWMA, and adaptive charts is it's simplicity in implementation. Some useful guidelines are proposed based on the sensitivity study.

• 품질경영학회지
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• 제33권3호
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• pp.126-134
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• 2005

This paper proposes a selectively cumulative sum(S-CUSUM) control chart for detecting shifts in the process mean. The basic idea of the S-CUSUM chart is to accumulate previous samples selectively in order to increase the sensitivity. The S-CUSUM chart employs a threshold limit to determine whether to accumulate previous samples or not. Consecutive samples with control statistics out of the threshold limit are to be accumulated to calculate a standardized control statistic. If the control statistic falls within the threshold limit, only the next sample is to be used. During the whole sampling process, the S-CUSUM chart produces an 'out-of-control' signal either when any control statistic falls outside the control limit or when L -consecutive control statistics fall outside the threshold limit. The number L is a decision variable and is called a 'control length'. A Markov chain approach is employed to describe the S-CUSUM sampling process. Formulae for the steady state probabilities and the Average Run Length(ARL) during an in-control state are derived in closed forms. Some properties useful for designing statistical parameters are also derived and a statistical design procedure for the S-CUSUM chart is proposed. Comparative studies show that the proposed S-CUSUM chart is uniformly superior to the CUSUM chart or the Exponentially Weighted Moving Average(EWMA) chart with respect to the ARL performance.

• 한국의학물리학회지:의학물리
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• 제25권3호
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• pp.185-192
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• 2014

이 연구의 목적은 본원이 보유하고 있는 선형가속기들의 출력 특성을 Shewhart-type Chart, EWMA Chart, 공정능력지수 $C_p$와 $C_{pk}$을 이용한 통계적 분석으로 품질보증에 대한 결과를 평가하고자 한다. 측정값은 의학물리사에 의하여 2012년 9월부터 2014년 4월까지 매월 측정된 각각 치료기들(21EX, 21EX-S, Novalis Tx)의 출력측정값을 사용하였다. 치료기들의 출력 특성은 IAEA TRS-398의 가이드라인을 따랐으며, 측정 에너지는 광자선 6 MV, 10 MV, 15 MV와 전자선 4 MeV, 6 MeV, 9 MeV, 12 MeV, 16 MeV, 20 MeV였다. 매월 측정하여 교정한 출력특성에 대한 통계학적 분석이며, 가중인자와 측정값의 관리한계의 폭은 ${\lambda}=0.10$, L=2.703로 계산되었으며, 공정능력 $C_p$와 $C_{pk}$는 모든 선형가속기(21EX, 21EX-S, Novalis Tx)의 모든 에너지에서 1이상이었다. Shewhart-type Chart를 통하여 출력선량의 측정값의 큰 변화점을 찾을 수 있었고, EWMA Chart를 통하여 출력선량의 측정값의 미세한 변화점을 알아 볼 수 있었다. 본원의 치료기의 공정능력지수 $C_p$와 $C_{pk}$를 통하여 21EX가 2.384와 2.136, 21EX-S가 1.917과 1.682, Novalis Tx가 2.895와 2.473으로 Novalis Tx가 가장 안정적이고 정확한 출력특성을 나타내고 있었다.

• Management Science and Financial Engineering
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• 제6권1호
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• pp.1-19
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• 2000

This papeer proposes a general approach of the multivariate expontially weighted moving average(MEWMA) chart, in which the smoothing matrix has full elements instead of only diagonal elements. The average run length (ARL) properties of this scheme are examined for a diverse set of quality control environments and the information to design the chhart is provied. Performance of the scheme is measured by estmating ARL and compared to those of two group cumulative sum (CUSUM) chats. The comparison resullts show that the MEWMA chart can improve its ARL performance in detecting a small shifts out-of-control in the start-up stage, the general MEWMA chart of a full smoothing matrix appears to offer an exceptional protection aginst departures from control in the process mean.

• International Journal of Quality Innovation
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• 제7권2호
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• pp.141-156
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• 2006

This study describes a novel algorithm for optimizing the quality yield of silicon wafer slicing. 12 inch wafer slicing is the most difficult in terms of semiconductor manufacturing yield. As silicon wafer slicing directly impacts production costs, semiconductor manufacturers are especially concerned with increasing and maintaining the yield, as well as identifying why yields decline. The criteria for establishing the proposed algorithm are derived from a literature review and interviews with a group of experts in semiconductor manufacturing. The modified Delphi method is then adopted to analyze those results. The proposed algorithm also incorporates the analytic hierarchy process (AHP) to determine the weights of evaluation. Additionally, the proposed algorithm can select the evaluation outcomes to identify the worst machine of precision. Finally, results of the exponential weighted moving average (EWMA) control chart demonstrate the feasibility of the proposed AHP-based algorithm in effectively selecting the evaluation outcomes and evaluating the precision of the worst performing machines. So, through collect data (the quality and quantity) to judge the result by AHP, it is the key to help the engineer can find out the manufacturing process yield quickly effectively.

• Journal of the Korean Data and Information Science Society
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• 제28권2호
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• pp.451-459
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• 2017

There are many researches showing that when a process change has occurred, variable sampling intervals (VSI) control chart is better than the fixed sampling interval (FSI) control chart in terms of reducing the required time to signal. When the process engineers use VSI control procedure, frequent switching between different sampling intervals can be a complicating factor. However, average number of samples to signal (ANSS), which is the amount of required samples to signal, and average time to signal (ATS) do not provide any control statistics about switching performances of VSI charts. In this study, we evaluate numerical switching performances of multivariate VSI EWMA chart including average number of switches to signal (ANSW) and average switching rate (ASWR). In addition, numerical study has been carried out to examine how to improve the performance of considered chart with accumulate-combine approach under several different smoothing constant and sample size. In conclusion, process engineers, who want to manage the correlation coefficients of related quality variables, are recommended to make sample size as large and smoothing constant as small as possible under permission of process conditions.

• 응용통계연구
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• 제37권2호
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• pp.177-189
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• 2024

관리도에서 런길이는 관리 통계량이 관리한계를 벗어날 때까지 관측한 표본의 수로 정의한다. 일반적으로 런길이의 분포는 비대칭이 심하고 변동성이 크기 때문에 평균 런길이만 사용하여 관리도를 설계하고 성능을 평가하는 것은 적절하지 않을 수도 있다. 평균 런길이 기반 설계에 대한 대안으로 이 논문에서는 백분위수를 기반으로 한 관리도의 설계를 소개하고, 이를 지수가중이동평균 관리도의 설계에 적용하는 절차를 제안하고 있다. 이 절차는 백분위수 모수들이 주어진 경우, 모의실험을 통하여 적합된 함수를 사용하여 관리한계의 계수를 설정하는 것이다. 또한 모의실험을 수행하여 제안된 설계 절차를 평균 런길이 기반 설계와 비교하고 평가하였다. 모의실험 결과, 제안된 절차는 이상상태에서 탐지 능력은 거의 유지하면서 관리상태에서의 성능을 향상시킨다는 사실을 확인할 수 있었다.

• 대한안전경영과학회:학술대회논문집
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• 대한안전경영과학회 2013년 추계학술대회
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• pp.199-207
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• 2013

산업의 빠른 발전 속도에 따라 연구 개발도 함께 발전해야 한다. 따라서 현재 제조공정에 대한 품질 특성치의 분석방법으로 공정 모수의 작은 변화도 쉽게 탐지를 할 수 있는 EWMA 관리도와 Shewhart 관리도보다 공정 변화에 민감하게 탐지 가능한 CUSUM 관리도에 관한 연구가 많이 이루어지고 있다. 하지만 식스시그마 공정관리에 맞춘 평균, 불량률, 미세 분산을 동시에 감지할 수 있는 동시 관리 체계 연구는 많이 미흡하다. 본 연구에서는 기존의 CUSUM, EWMA 관리도 기법보다 빠른 이상 감지를 위해서 평균, 불량률, 분산 3가지가 동시에 관리되어질 수 있도록 Zp-s 관리도를 소개한다. Zp-s 관리도는 ARL을 통해 기존 관리도보다 민감함을 확인할 수 있다.

• 한국경영과학회:학술대회논문집
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• 한국경영과학회 2006년도 추계학술대회
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• pp.560-570
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• 2006

This paper proposes a selectively cumulative sum (S-CUSUM) control chart with variable sampling intervals (VSI) for detecting shifts in the process mean. The basic idea of the VSI S-CUSUM chart is to adjust sampling intervals and to accumulate previous samples selectively in order to increase the sensitivity. The VSI S-CUSUM chart employs a threshold limit to determine whether to increase sampling rate as well as to accumulate previous samples or not. If a standardized control statistic falls outside the threshold limit, the next sample is taken with higher sampling rate and is accumulated to calculate the next control statistic. If the control statistic falls within the threshold limit, the next sample is taken with lower sampling rate and only the sample is used to get the control statistic. The VSI S-CUSUM chart produces an 'out-of-control' signal either when any control statistic falls outside the control limit or when L-consecutive control statistics fall outside the threshold limit. The number L is a decision variable and is called a 'control length'. A Markov chain model is employed to describe the VSI S-CUSUM sampling process. Some useful formulae related to the steady state average time-to signal (ATS) for an in-control state and out-of-control state are derived in closed forms. A statistical design procedure for the VSI S-CUSUM chart is proposed. Comparative studies show that the proposed VSI S-CUSUM chart is uniformly superior to the VSI CUSUM chart or to the Exponentially Weighted Moving Average (EWMA) chart with respect to the ATS performance.