• Title/Summary/Keyword: Distribution Plans

Search Result 627, Processing Time 0.025 seconds

Design of Accelerated Life Tests and Small Sample Study under Continuous and Intermittent Inspections for Lognormal Failure Distribution (수명이 대수정규분포를 따를 때 연속 및 간헐적 검사하에서 가속수명시험의 설계와 소표본 연구)

  • Seo, Sun-Keun;Chung, Won-Kee
    • Journal of Korean Institute of Industrial Engineers
    • /
    • v.23 no.1
    • /
    • pp.177-196
    • /
    • 1997
  • In this paper, statistically optimal accelerated life test(ALT) plans considering statistical efficiency only and new compromise ALT plans to sacrifice some statistical efficiency in return for improved overall properties including estimobility probability and robustness for the model assumptions are developed under the assumptions of constant stress, intermittent inspection, Type I censoring and lognormal failure distribution which has been one of the popular choices of failure distributions in the extensive engineering applications of ALT. Computational experiments are conducted to compare with four ALT plans including two proposed ones under continuous and intermittent inspections over a range of parameter values in terms of asymptotic variance, sensitivities for guessed input values, and proportion of estimable samples, etc. The small and moderate sample properties for the proposed ALT plans designed under asymptotic criterion are also investigated by Monte Carlo simulation.

  • PDF

Comparisons of Two-Stage Acceptance Life Test Sampling Plans for Exponential Lifetime Distribution

  • Cho, Ho Sung;Seo, Sun Keun
    • Journal of Korean Society for Quality Management
    • /
    • v.20 no.1
    • /
    • pp.22-32
    • /
    • 1992
  • This thesis compares life test acceptance sampling plans under lifetime has an exponential distribution. Various practical considerations may lead a user adopt a two-stage, or double sampling, test procedure. Hewett and Spurrier(1983) provided a survey of two-stage methods, as well as examples of experiments for which a two-stage procedure would be appropriate. The plans are compared in terms of the expected number of failures, and the expected time required to reach a dicision. Computational experiments are conducted and the results are tabulated to provide guidelines for selecting an appropriate plan for a given situation.

  • PDF

Design of Accelerated Life Test Sampling Plans for Exponential Distribution under Type II Censoring (지수수명분포에 대한 가속수명시험 샘플링검사방식의 설계: 제II종 관측중단의 경우)

  • Chun, Young Rok
    • Journal of Korean Society for Quality Management
    • /
    • v.23 no.4
    • /
    • pp.13-27
    • /
    • 1995
  • This paper considers the design of life test sampling plans based on Type II censored accelerated life tests. The lifetime distribution of products is assumed to be exponential. An estimator of acceleration factor between use condition stress and an accelerated level of stress higher than use condition stress is assumed to be known. The critical value for lot acceptance and the number of failure before censoring which satisfy the producer's and consumer's risk requirements are determined. The properties of the proposed life test sampling plans are investigated.

  • PDF

Design of Optimal Accelerated Life Tests for the Exponential Failure Distribution under Intermittent Inspection (지수고장분포(指數故障分布) 및 단속검사하(斷續檢査下)의 최적(最適) 가속수명시험(加速壽命侍險)의 설계(設計))

  • Seo, Sun-Keun;Choi, Jong-Deuk
    • Journal of Korean Institute of Industrial Engineers
    • /
    • v.17 no.1
    • /
    • pp.95-108
    • /
    • 1991
  • For the case where the lifetime at a constant stress level has exponential distribution, optimal accelerated life test plans are developed under the assumptions of intermittent inspection and Type I censoring. In a optimal plan, the low and high stress levels, the proportion of test units allocated and the inspection times at each stress are determined such that the asymptotic variance of the maximum likelihood estimator of logarithmic transformed mean at the use condition is minimized. In addition to the optimal plan in which numerical technique to solve the set of nonlinear equations must be employed to determine inspection times at each stress level, we also propose another plans which employ equally-spaced or equal probability inspection schemes at two overstress levels of corresponding optimal one. For both optimal and proposed plans, computational results indicate that the asymptotic variance of the estimated mean at the use stress is insensitive to number of inspections at overstress levels for the range of parameter values considered.

  • PDF

Sampling Plans Based on Truncated Life Test for a Generalized Inverted Exponential Distribution

  • Singh, Sukhdev;Tripathi, Yogesh Mani;Jun, Chi-Hyuck
    • Industrial Engineering and Management Systems
    • /
    • v.14 no.2
    • /
    • pp.183-195
    • /
    • 2015
  • In this paper, we propose a two-stage group acceptance sampling plan for generalized inverted exponential distribution under truncated life test. Median life is considered as a quality parameter. Design parameters are obtained to ensure that true median life is longer than a given specified life at certain level of consumer's risk and producer's risk. We also explore situations under which design parameters based on median lifetime can be used for other percentile points. Tables and specific examples are reported to explain the proposed plans. Finally a real data set is analyzed to implement the plans in practical situations and some suggestions are given.

A Study on Optimal sampling acceptance plans with respect to a linear loss function and a beta-binomial distribution

  • Kim, Woo-chul;Kim, Sung-ho
    • Journal of Korean Society for Quality Management
    • /
    • v.10 no.2
    • /
    • pp.25-33
    • /
    • 1982
  • We discuss a model for acceptance/rejection decision regarding finite populations. The model is based on a beta-binomial prior distribution and additive costs -- relative sampling costs, relative sorting costs and costs of accepted defectives. A substantial part of the paper is devoted to constructing a Bayes sequential sampling acceptance plan (BSSAP) for attributes under the model. It is shown that the Bayes fixed size sampling acceptance plans (BFSAP) are better than the Hald's (1960) single sampling acceptance plans based on a uniform prior. Some tables and examples are provided for comprisons of the minimum Bayes risks of the BSSAP and those of the BFSAP based on a uniform prior and the model.

  • PDF

Design of Accelerated Life Test Plans for the Lognormal Failure Distribution under Intermittent Inspection (대수정규분포와 간헐적 검사하에서 가속수명시험방식의 설계)

  • Seo, Sun-Keun;Cho, Ho-Sung
    • Journal of Korean Society for Quality Management
    • /
    • v.24 no.2
    • /
    • pp.25-43
    • /
    • 1996
  • This paper presents the optimal and practical constant-stress accelerated life test plans for the lognormal lifetime distribution tinder assumptions of intermittent inspection and Type-I censoring. In an optimal plan, the low stress level and the proportions of test units allocated at each stress are determined under given inspection scheme and number of inspections such that the asymptotic variance of the maximum likelihood estimator of a certain quantile at use condition is minimized. Although the practical plan adopts the same design criterion, it involves three rather than two overstress levels in order to compromise the practical deficiencies of the optimal plan. Computational experiments are conducted to choose an allocation plan and a inspection scheme of the practical plan and to compare with test plans over a range of parameter values.

  • PDF

Statistical Design of Two-Stage Reliability Demonstration Tests (2단계 신뢰성 실증시험의 통계적 설계)

  • Seo, Sun-Keun
    • Journal of Korean Society for Quality Management
    • /
    • v.39 no.2
    • /
    • pp.313-319
    • /
    • 2011
  • In design verification and process validation stages, reliability demonstration tests(RDT's) are common practice in industry, A new two-stage RDT that is known to be more efficient than a corresponding single-stage one in terms of expected test duration for Weibull distribution is proposed. Zero or one failure two-stage plans to minimize expected test duration under Type I and hybrid censoring subject to satisfying consumer's risk at a specified reliability target are developed and a numerical example is provided to illustrate the proposed two-stage RDT plans and compared with other one- and two-stage plans.

Development of Reliability Acceptance Sampling Plan for the Case where the Degradation Quantity of the Performance Characteristic follows Weibull Distribution based on the Accelerated Degradation Test (성능특성치의 열화가 와이블 분포를 따를 때 가속열화시험을 활용한 신뢰성 샘플링검사계획의 개발)

  • Lim, Heonsang;Park, Jaehun;Sung, Si-Il
    • Journal of Applied Reliability
    • /
    • v.18 no.2
    • /
    • pp.122-129
    • /
    • 2018
  • Purpose: This article develops an optimal reliability acceptance sampling plan for the case where the degradation quantity of the performance characteristic follows Weibull distribution. Method: For developing reliability acceptance sampling plans, the sample size and the acceptance constant are determined based on the accelerated characteristic of the test condition and the product. Results: The sample size and the acceptance constant are provided such that the constraints of the producer and the consumer risks are satisfied. Conclusion: Reliability acceptance sampling plans based on the accelerated degradation test method can be used for the quality control within a resonable amount of cost and time. In this article. an optimal reliability sampling plans are newly developed for this purpose.

Accelerated Life Test Plans Based on Small Sample Property

  • Yun, Won Young
    • Journal of Korean Society for Quality Management
    • /
    • v.23 no.1
    • /
    • pp.41-49
    • /
    • 1995
  • This paper suggests optimal accelerated constant stress life tests in Exponential distribution. The relationship between the log-mean life and the loaded stress is assumed to be linear. Optimal plans considering mean square errors of maximum likelihood estimators of the log mean life and test costs are obtained. We consider accelerated life tests with two stress levels, and as data types, failure censoring( type II) and time censoring(type I) data are used. We propose the procedure to obtain the optimal plans for each case. Some examples are also included.

  • PDF