• Applied Microscopy
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• v.38 no.3
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• pp.185-193
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• 2008

An experimental comparison of the detection properties between imaging plate and film for recording the electron diffraction pattern was carried out on a radiation-sensitive material, an aluminum trihydroxide(gibbsite, ${\gamma}-Al(OH)_3$), through the electron beam irradiation. Because the imaging plate has a wide dynamic range sufficient for recording extremely low- and high-electron intensities, the range of spatial frequency for the diffraction pattern acquired by the imaging plate was extended to two times larger than the range by the film, especially at a low electron dose condition(${\leq}0.1\;e^-/{\mu}m^2$). It is also demonstrated that the imaging plate showed better resolving power for discriminating fine intensity levels even in saturated transmitted beam. Hence, in the respect of investigating the structures of radiation-sensitive materials and cryo-biological specimens, our experimental demonstrations suggest that the imaging plate technique may be a good choice for those studies, which have to use an extremely low electron intensity for recording.

• Bulletin of the Korean Chemical Society
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• v.5 no.4
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• pp.135-140
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• 1984

The reduction of vacuum-dehydrated $Na_xAg_{12-x}-A, 0 {\le} x {\le} 9.2$, and its reoxidation by O$_2$, have been studied by X-ray powder diffraction. Also, the structure of $Na_6Na_6-A$ treated with hydrogen at room temperature has been studied by single crystal methods in the cubic space group Pm3m at $24{\circ}C (a = 12.221(2) {\AA})$. The diffraction pattern of dehydrated Ag$_{12}$-A reduced by H$_2$ contains only the (111) and (200) reflections of silver metal, indicationg that the zeolite structure has been lost, but the zeolite's diffraction pattern and structural integrity can be fully restored by oxidation with O$_2$ at 100 or 200${\circ}C$. In contrast, the structures of $Na_xAg_{12-x}-A$, x = 4.5 and 9.2, were not destroyed by treatment with hydrogen. Dehydrated Na$_6Ag_6$-A treated with 50 Torr of hydrogen gas at 24${\circ}C$ for 30 minutes has $6\; Na^+\;and\;1.27\;Ag^+$ ions at 6-ring sites. These $Ag^+ ions are associated with 2.54 Ag${\circ}$ atoms to form 1.27 $Ag_3^+$ clusters per unit cell. Also found were 0.7 $Ag_3^{2+}$ clusters per unit cell near the 8-rings. The structure was refined to the final error indices R$_1$ = 0.134 and R$_2$ (weighted) = 0.147, using 168 independent reflections for which $I_0 >3{\sigma}(I_0)$.

• Korean Journal of Mineralogy and Petrology
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• v.34 no.4
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• pp.227-239
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• 2021

A practical and effective method of X-ray powder diffraction analysis was investigated for quantitative analysis of the mineral content of natural samples. Sample mounting experiments were conducted to select the best randomly oriented powder sample mount. A comparative experiment was also made between a reference intensity ratio (RIR) method, which compares a single peak intensity with standard material, and the Rietveld method, which calculates a full X-ray diffraction pattern, to search for the effective method of mineral quantification. In addition, samples containing amorphous minerals were quantitatively analyzed by the Rietveld method and the efficiency was reviewed. As a result of the study, the optimal random orientation could be reached by the side mounting method. The Rietveld method using the full pattern of X-ray diffraction was more suitable for mineral quantitative analysis, rather than the RIR method using a specific peak. However, either method could depend on the analyst's experience in addition to analytical technique. Moreover, amorphous minerals can be quantitatively analyzed by the Rietveld method, and the analysis results make the geological analysis possible.

• Analytical Science and Technology
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• v.20 no.6
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• pp.502-507
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• 2007

X-ray diffraction method has been widely used for qualitative and quantitative analysis of a mixture of materials since every crystalline material gives a unique X-ray diffraction pattern independently of others, with the intensity of each pattern proportional to that material's concentration in a mixture. For determination of mixing ratios, extracting source spectra correctly is important and crucial. Based on the source spectra extracted, a regression model with non-negativity constraint is applied for determining mixing ratios. In some mixtures, however, X-ray diffraction spectrum has sharp and narrow peaks, which may result in partial negative source spectrum from independent component analysis. We propose several procedures of extracting non-negative source spectra and determining mixing ratios. The proposed method is validated with experimental data on powder mixtures.

• Journal of the Mineralogical Society of Korea
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• v.26 no.1
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• pp.27-34
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• 2013

X-ray powder diffraction is one of the most powerful techniques for qualitative and quantitative analysis of crystalline compounds. Thus, there exist a number of different methods for quantifying mineral mixtures using X-ray diffraction pattern. We present here the use of Rietveld and PONKCS (partial or no known crystal structure) methods for quantification of amorphous and crystallized mineral phases in synthetic mixtures of standard minerals (amorphous silica, quartz, mullite and corundum). Pawley phase model of amorphous silica was successfully built from the pattern of 100 wt% amorphous silica and internal standard-spiked samples by PONKCS approach. The average of absolute bias for quantities of amorphous silica was 1.85 wt%. The larger bias observed for lower quantities of amorphous silica is probably explained by low intensities of diffraction pattern. Averages of absolute bias for minerals were 0.53 wt% for quartz, 0.87 wt% for mullite and 0.57 wt% for corundum, respectively. The PONKCS approach achieved improved quantitative results compared with classical Rietveld method by using an internal standard.

• Journal of the Mineralogical Society of Korea
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• v.32 no.4
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• pp.287-301
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• 2019

Preservation of the original form is the principle for conservation, management and utilization of cultural heritages. Thus, non-destructive analysis of these samples are important field of the conservation science. In this study, examined the applicability of nondestructive surface X-ray diffraction analysis (ND-XRD) for cultural heritage by materials (rock specimen, jade stone, pigment painted specimen, earthen artifact, metal artifact). In result, all type of sample is recorded suitable X-ray diffraction patterns for identifying mineral composition in case of surface condition with adequate particle size and arrangement. And diffraction pattern is reflected surface information than matrix. Therefore, ND-XRD is thought to be applicable not only mineral identification but also interpretation of manufacturing technique and alteration trend about layered sample (in horizontally or vertically). Whereas some exceptional diffraction patterns were recorded due to overlapping information on specific crystal planes. It caused by skip the sample treatment (powdering and randomly orientation). It could be advantageously used for mineral identification, such as preferred orientation of clay minerals. In contrast, irregular diffraction pattern caused by single crystalline effect is required careful evaluation.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2018.05a
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• pp.435-436
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• 2018

In this paper, diffraction efficiency for computer-generated hologram (CGH) generated under various conditions was measured. This paper discusses the generation conditions that should be considered in hologram reconstruction. We compared each condition by measuring the intensity of the 1st order diffraction pattern of the fringe generated under the Fresnel condition for the phase and complex hologram.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2014.11a
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• pp.176-177
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• 2014

The new algorithm was proposed to quantify symmetry recorded in convergent beam electron diffraction (CBED) patterns and symmetry mapping. The proposed algorithm is based on the normalized cross-correlation coefficient (${\gamma}$) for quantifying the amount of symmetry in a CBED pattern. The quantification and mapping procedures are automatically controlled by the script implemented in Gatan Digital Micrograph$^{(c)}$. We apply the quantitative CBED measurement to a strained Si sample to test the sensitivity to defects.

• Journal of the Korean Institute of Telematics and Electronics
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• v.25 no.9
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• pp.1027-1038
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• 1988

This paper, the last part of these three companion papers treated the electromagnetic diffraction by a dielectric wedge, presents the correction to the physical optics approcomation by the sheet currents of the Neumann expansion. Those expansion coefficients obtained by solving dual series equation amenable to simple numerical calculation may provide the asymprotically corrected solution. The validity of this result, satisfying both the edge condition near the tip of the dielectric wedge and the boundary condition along dielectric interfaces, is assured by approach of the corrected diffraction pattern to that of a perfectly conducting wedge for large permittivity of dielectric wedge.

• The Korean Journal of Ceramics
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• v.6 no.3
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• pp.236-239
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• 2000

Both the X-ray diffraction data of the normal direction in the sample orientation and the pole figure data of three reflections, (111), (200) and (220), were used to do the Rietveld refinement for the copper sheet prepared by a cold rolling process. The agreement between calculated and observed patterns was not satisfactory, which was attributed to the preferred orientation effect of the copper sheet. The Rietveld refinement for the copper sheet could be done successfully by applying the pole density of each reflection obtained from the corresponding inverse pole figure to the X-ray diffraction data of the normal direction. The R-weighted pattern, $R_{wp}$ was 12.99% and the goodness-of-fit indicator, S, was 3.68.