Physical Characterization of $GaAs/Al_{x}Ga_{1-x}As/GaAs$ Heterostructures by Deep Level Transient Spectroscopy
(DLTS 방법에 의한 $GaAs/Al_{x}Ga_{1-x}As/GaAs$ 이종구조의 물성분석에 관한 연구)
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- Proceedings of the Materials Research Society of Korea Conference
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- 1995.11a
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- pp.11-12
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- 1995