Deep Level Trap Analysis of 4H-SiC PiN and SBD Diode
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Shin, Myeong-Cheol
(Department of Electronic Materials Engineering, Kwangwoon University)
Byun, Dong-Wook (Department of Electronic Materials Engineering, Kwangwoon University) Lee, Geon-Hee (Department of Electronic Materials Engineering, Kwangwoon University) Shin, Hoon-Kyu (National Institute for Nanomaterials Technology (NINT), Pohang University of Science and Technology (POSTECH)) Lee, Nam-Suk (National Institute for Nanomaterials Technology (NINT), Pohang University of Science and Technology (POSTECH)) Kim, Seong Jun (National Institute for Nanomaterials Technology (NINT), Pohang University of Science and Technology (POSTECH)) Koo, Sang-Mo (Department of Electronic Materials Engineering, Kwangwoon University) |
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