• 제어로봇시스템학회:학술대회논문집
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• 제어로봇시스템학회 2005년도 ICCAS
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• pp.1423-1426
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• 2005

Map building is the most important thing for the mobile robots navigation. It requires specific vision system such as CCD camera, range finding system, and many other things. Laser range finder has highly collimated beams can be obtained easily, thus achieving lateral resolution. Laser Diode is used for a continuous laser source. The Automatic Current Control Circuit and the Bias-T is used for mix AC signal with DC bias. This signal is used for driving Laser Diode. The main idea of the calculating distance is detecting phase shift between reference signal and detected signal by photo detector. For the signal processing, the Lock-in amplifier system is addressed in this paper. We used a diffused reflected beam to detect phase shift in this system. But this beam is minuteness signal so it can be easily buried in nose. Lock-in amplifier is used to measure the amplitude and phase of signals which are buried in noise.

• 대한기계학회논문집B
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• 제27권7호
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• pp.829-836
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• 2003

Understanding of heat generation in semiconductor devices is important in the thermal management of integrated circuits and in the analysis of the device physics. Scanning thermal microscope was used to measure the temperature and the electric potential distribution on the cross-section of an operating metal-oxide-semiconductor field-effect transistor (MOSFET). The temperature distributions were measured both in DC and AC modes in order to take account of the leakage current. The measurement results showed that as the drain bias was increased the hot spot moved to the drain. The density of the iso-potential lines near the drain increased with the increase in the drain bias.

• 대한전자공학회논문지
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• 제25권2호
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• pp.182-187
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• 1988

Hot carrier induced device degradation characteristics under DC bias stress have been investigated in n-MOSFETs with channel length of 1.2,1.8 um, and compared with those of LDD structure device with same channel length. Based on these results, the device lifetime in normal operating bias(Vgs=Vds=5V) is evaluated. The lifetimes of conventional and LDD n-MOSFET with channel length of 1.2 um are estimated about for 17 days and for 12 years, respectively. The degradation rate of LDD n-MOSFET under the same stress is the lowest at n-region implnatation dose of 2.5E15 cm-\ulcorner while the substrate current is the lowest at the dose of 1E13cm-\ulcorner Thses results show that the device degradation characteristics are basic measurement parameter to find optimum process conditions in LDD devices and evaluate a reliability of sub-micron device.

• 한국전자파학회논문지
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• 제12권1호
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• pp.65-70
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• 2001

본 연구에서는 CDMA 단말기요 Receiver MMIC를 설계하였다. 전체회로는 저잡음 증폭기, 하향 주파수 혼합기, 중간주파수 증폭기 그리고 바이어스 회로로 구성된다. 바이어스회로는 문턱전압과 전원접압의 변화에 대해 보상동작을 한다. 제안된 토폴리지는 높은 선형성과 저잡음 특성을 가진다. 설계결과는 다음과 같다. 전체 변환이득은 28.5 dB, 저잡음 증폭기의 압력은 IP3는 8 dBM, 하향주파수 혼합기의 압력 IP3는 0 dBm 이며 전체회로의 소모전류는 22.1 mA이다.

• 한국전기전자재료학회논문지
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• 제11권5호
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• pp.347-352
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• 1998

In this paper, the extraction and optimization of SPICE parameters on SONOSFET for NVSM circuit design were discussed. SONOSFET devices with different channel widths and lengths were fabricated using conventional 1.2 um n-well CMOS process. And, electric properties for dc parameters and capacitance parameters were measured on wafer. SPICE parameters for the SONOSFET were extracted from the UC Berkeley level 3 model for the MOSFET. And, local optimization of Ids-Vgs curves has carried out in the bias region of subthreshold, linear, saturation respectively. Finally, the extracted SPICE parameters were optimized globally by comparing drain current (Ids), output conductance(gds), transconductance(gm) curves with theoretical curves in whole region of bias conditions. It is shown that the conventional model for the MOSFET can be applied to the SONOSFET modeling except sidewalk effect.

• 한국전기전자재료학회논문지
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• 제21권10호
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• pp.885-888
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• 2008

We present simulation results on DC characteristics of AlGaN/GaN HEMTs having trench shaped source/drain Ohmic electrodes. In order to reduce the contact resistance in the source and drain region of the conventional AlGaN/GaN HEMTs and thereby to increase their DC output power, we applied narrow-shaped-trench electrode schemes whose size varies from $0.5{\mu}m$ to $1{\mu}m$ to the standard AlGaN/GaN HEMT structure. As a result, we found that the drain current was increased by 13 % at the same gate bias condition and the transconductance (gm) was improved by 11 % for the proposed AlGaN/GaN HEMT, compared with those of the conventional AlGaN/GaN HEMTs.

• Journal of Electrical Engineering and Technology
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• 제6권4호
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• pp.505-512
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• 2011

A novel passive boost power converter forsingle-phaseswitched reluctance motor is presented. A simple passive circuit is proposed comprisingthree diodes and one capacitor. The passive circuitis added in the front-end of a conventional asymmetric converter to obtain high negative bias. Based on this passive network, the terminal voltage of the converter side is a general DC-link voltage level in parallel mode up to a double DC-link voltage level in series mode. Thus,it can suppress the negative torque generation from the tail current and improve the output power. The results of the comparative simulation and experiments forthe conventional and proposed converter verify the performance of the proposed converter.

• 전자공학회논문지A
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• 제31A권1호
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• pp.93-102
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• 1994

This paper, presents SECRET(SEC REliability Tool), which predicts reliability problems related to the hot-carrier and electromigration effects on the submicron MOSFETs and interconnections. To simulate DC and AC lifetime for hot-carrier damaged devices, we have developed an accurate substrate current model with the geometric sensitivity, which has been verified over the wide ranges of transistor geometries. A guideline can be provided to design hot-carrier resistant circuits by the analysis of HOREL(HOT-carrier RFsistant Logic) effect, and circuit degradation with respect to physical parameter degradation such as the threshold voltage and the mobility can also be expected. In SECRET, DC and AC MTTF values of metal lines are calculated based on lossy transmission line analysis, and parasitic resistances, inductances and capacitances of metal lines are accurately considered when they operate in the condition of high speed. Also, circuit-level reliability simulation can be applied to the determination of metal line width and-that of optimal capacitor size in substrate bias generation circuit. Experimental results obtained from the several real circuits show that SECERT is very useful to estimate and analyze reliability problems.

• E2M - 전기 전자와 첨단 소재
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• 제10권10호
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• pp.1000-1004
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• 1997

In this paper the current-voltage characteristics of a submicron GaAs MESFET is simulated by using the self-consistent ensemble Monte Carlo method. The numerical algorithm employed in solving the two-dimensional Poisson equation is the successive over-relaxation(SOR) method. The total number of employed superparticles is about 1000 and the field adjusting time is 10fs. To obtain the steady-state results the simulation is performed for 10ps at each bias condition. The simulation results show the average electron velocity is modified by the gate voltage.

• 대한전기학회:학술대회논문집
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• 대한전기학회 1996년도 하계학술대회 논문집 C
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• pp.1572-1575
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• 1996

A new type $Cu_{x}N/Cu/Cu_{x}N$ thin film electrode material with high adhesion to glass was developed by the dc reactive planar magnetron sputtering system for the PDP(Plasma Display Panel). The adhesive force of the $Cu_{x}N$ thin film was in the range of $20{\sim}40(N)$ under the conditions of the $N_2$ partial pressure of 15%, discharge current of 70mA, discharge voltage of 450V and substrate bias voltage of -100V. The adhesive force was depended on the $N_2$ partial pressure, discharge current and substrate bias voltage.