• Journal of Welding and Joining
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• 제30권6호
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• pp.1-5
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• 2012

• 보존과학회지
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• 제1권1호
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• pp.27-39
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• 1992

Metallurgical studies of the bronze artifacts excavated from Miruksa Temple were performed by chemical analysis and metallographic observation. Alloy systems of the bronze artifacts were classified into two groups of Cu-Sn and Cu-Sn-Pb, according to the items. The contents of impurities such as Sb, As, Ni and Fe in bronze artifacts are within the limiting range of the mod ern standard bronze castings. Chemical compositions of the kitchen utensils such as bronze vessels and dishes in the Unified Silla dynasty, are in the follow ing range, Cu : 74.8-79.4% and Sn : 18.6-21.1%. Chemical composition of the Buddha-image in Koryo dynasty are 820Cu-7.0Sn-10.3Pb, showing increased Pb content and decreased Sn content. The results of chemical analysis suggest that the chemical compositions were good controlled. Any casting defects such as voids and shrinkage holes are not found microscopically, indicating high casting skill. Zinc atoms are not contained in the all bronze artifacts of Miruksa Temple site. This is the common facts founded in the east asian bronze artifacts of Korea, China and Japan. It is comparable with the European bronze of Cu-Sn-Pb-Zn system, after the Middle Age.

• Transactions on Electrical and Electronic Materials
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• 제16권3호
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• pp.112-116
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• 2015

This work studied the thickness and contact angle of solder joints between SAC 305 lead-free solder alloy and a Copper (Cu) substrate. Intermetallic compound (IMC) thickness and contact angle of 3Sn-Ag-0.5Cu (SAC 305) leadfree solder were measured using varying aging times, at a fixed temperature at 30℃. The thickness of IMC and contact angle depend on the aging time. IMC thickness increases as the aging increases. The contact angle gradually decreased from 39.49° to 27.59° as aging time increased from zero to 24 hours for big solder sample. Meanwhile, for small solder sample, the contact angle increased from 32.00° to 40.53° from zero to 24 hours. The IMC thickness sharply increased from 0.007 mm to 0.011 mm from zero to 24 hours aging time for big solder. In spite of that, for small solder the IMC thickness gradually increased from 0.009 mm to 0.017 mm. XRD analysis was used to confirm the intermetallic formation inside the sample. Cu₆Sn₅, Cu₃Sn, Ni₃Sn and Ni₃Sn₂ IMC layers were formed between the solder and the copper substrate. As the aging time increased, the strength of the solder joint mproved due to reduced contact angle.

• 대한용접접합학회:학술대회논문집
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• 대한용접접합학회 2006년도 춘계 학술대회 개요집
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• pp.36-38
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• 2006

We investigated that the metallurgical, mechanical and electrical properties of the Sn-3.SAg/Cu ball grid array (BGA) solder joints at a reflow temperature of $255^{\circ}C$ for different reflow times of 10, 60, 300 and 1800 s. Two different intermetallic compound (IMC) layers, consisting of scallop-shaped $Cu_6Sn_5$ and very thin $Cu_3Sn$, formed at the solder/substrate interface, and their thicknesses increased with increasing reflow time. The shear force peaked after reflow for 60 s, and then significantly decreased with increasing reflow time. The fracture occurred along the solder ball in the initial reflow, but the fraction of the brittle fracture increased with increasing reflow time. The IMC growth and the volume of Cu dissolved in the solder balls affected the electrical property.

• 한국표면공학회지
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• 제38권6호
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• pp.216-226
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• 2005

Pb-Free Technology was born with environmental problems of electronic component, Being connected by big and small project of every country. Also, in each country environment is connected and various standards of IEC, ISO, MIL, JIS, KS, JEDEC, EIAJ etc. All products can divide at solder part and finishing part These can tested each and synthetically divide. This research is reliability evaluation for three kind of ph-free SnCu solder plating solution and it's deposit. First, executed analysis about Pure Sn, SnCu solutions and plating surface by way similar to other plating solution analysis. Next, executed reliability about test method and equipment for reliable analyzer system construction. Next, data comparison and estimation, main estimation test method and item's choice. In this paper the systematic surface analysis and reliability for plating solutions and it's deposit in metal surface finishing processes could be shown.

• 마이크로전자및패키징학회지
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• 제17권1호
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• pp.81-88
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• 2010

Sn-3.0Ag-0.5Cu 솔더범프의 금속간화합물 성장거동에 미치는 PCB 표면처리의 영향을 알아보기 위해서 PCB 패드 표면에 각각 OSP, immersion Sn, 그리고 ENIG를 처리하였고, 열처리는 $150^{\circ}C$ 조건에서 실험을 실시하였다. 또한, 전류인가시 Sn-3.0Ag-0.5Cu 솔더범프의 접합부 계면반응에 미치는 표면처리의 영향을 알아보기 위해서 $150^{\circ}C$, $4{\times}10^3\;A/cm^2$ 조건에서 electromigration특성을 비교 평가하였다. 열처리시 OSP와 immersion Sn의 금속간화합물 성장거동은 서로 비슷한 경향을 보인 반면, ENIG는 다른 표면처리에 비해 훨씬 느린 성장거동을 보였다. electromigration특성 평가결과 열처리에 비해 금속간화합물의 성장이 가속화되나 표면처리별 경향은 유사하였고, 전자 이동 방향에 따른 음극-양극에서 금속간화합물 형성의 차이를 보이는 극성효과(polarity effect)가 나타나는 것을 알 수 있었다.

• Journal of Welding and Joining
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• 제25권3호
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• pp.57-63
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• 2007

Electrochemical migration characteristics of Pb-free solder alloys are quantitatively correlated with corrosion characteristics in harsh environment conditions. In-situ water drop test and corrosion resistance test for Sn-3.0Ag-0.5Cu solder alloys were carried out in NaBr and NaF solutions to obtain the electrochemical migration lifetime and pitting potential, respectively. Sn-3.0Ag-0.5Cu solder alloy shows similar ionization and electrochemical migration behavior with pure Sn because of Ag and Cu do not migrate due to the formation of resistant intermetallic compounds inside solder itself. Electrochemical migration lifetime in NaBr is longer than in NaF, which seems to be closely related to higher pitting potential in NaBr than NaF solution. Therefore, it was revealed that electrochemical migration lifetime of Sn-3.0Ag-0.5Cu solder alloys showed good correlation to the corrosion resistance, and also the initial ionization step at anode side is believed to be the rate-determining step during electrochemical migration of Pb-free solders in these environments.

• 마이크로전자및패키징학회지
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• 제29권2호
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• pp.81-89
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• 2022

비전도성 필름(non-conductive film, NCF)의 적용이 Cu/Ni/Sn-2.5Ag 미세범프의 금속간화합물(intermetallic compound, IMC) 성장 거동에 미치는 영향을 분석하기 위해 110, 130, 150℃의 온도 조건과 1.3×10⁵ A/cm²의 전류밀도 조건에서 실시간 열처리 및 electromigration(EM) 실험을 진행하였다. 그 결과, NCF 적용 유무와 열처리 및 EM 실험과 관계없이 Ni₃Sn₄ IMC 성장에 필요한 활성화에너지는 약 0.52 eV로 큰 차이는 보이지 않았다. 이는 Ni-Sn IMC의 성장속도가 Cu-Sn IMC 성장 속도보다 매우 느리며, 또한 Ni-Sn IMC의 성장 거동은 시간의 제곱근에 선형적으로 증가하므로 확산이 지배하는 동일한 반응기구를 가지며 NCF 적용에 따른 역응력(back stress)의 EM 억제 효과가 크지 않기 때문에 Ni₃Sn₄ IMC 성장에 필요한 활성화에너지는 차이가 나지 않는 것으로 판단된다.

• Journal of Welding and Joining
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• 제35권3호
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• pp.7-14
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• 2017

The effect of high temperature-moisture on corrosion and mechanical properties for Sn-0.7Cu, Sn-3.0Ag-0.5Cu (SAC305) solders on flexible substrate was studied using Highly Accelerated Temperature/Humidity Stress Test (HAST) followed by three-point bending test. Both Sn-0.7Cu and SAC305 solders produced the internal $SnO_2$ oxides. Corrosion occurred between the solder and water film near flexible circuit board/copper component. For the SAC305 solder with Ag content, furthermore, octahedral corrosion products were formed near Ag3Sn. For the SAC305 and Sn-0.7Cu solders, the amount of internal oxide increased with the HAST time and the amount of internal oxides was mostly constant regardless of Ag content. The size of the internal oxide was larger for the Sn-0.7Cu solder. Despite of different size of the internal oxide, the fracture time during three-point bending test was not significantly changed. It was because the bending crack was always initiated from the three-point corner of the chip. However, the crack propagation depended on the oxides between the flexible circuit board and the Cu chip. The fracture time of the three-point bending test was dependent more on the crack initiation than on the crack propagation.

• 박물관보존과학
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• 제2권
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• pp.57-68
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• 2000

청주 사뇌사지에서 출토된 청동기 12점에 대한 과학 분석을 실시하였다. 이들 각 시료의 금속조직에 나타난 결정 입자의 형태, 크기, 분포와 관련하여 검토한 결과 식기류, 제기류, 타명기류로 나타났는데 성분조성에 따른 분류 결과와도 일치하였다. 식기류는 주로 단조품으로서 성분조성비는 Cu:Sn:Pb≃8:2:0, 제기류는 주조품으로서 Cu:Sn:Pb≃7:1:2, 타명기류는 Cu:Sn:Pb≃85:10:5/9:1:0이었다. 즉, 원료의 배합비는 제품의 용도 및 제작방볍과 밀접한 관계가 있다는 것을 알 수 있었다. Cu와 상관계수가 높은 원소는 Co, Fe, As이었는데 이는 Cu 광물에 불순물로 함께 분포한다는 것을 의미하며 As 함량은 식기류, 제기류, 타명기류 순으로 증가한다는 것을 알 수 있었다. 또한 납 함유량이 높은 청동기 3점의 납동위원소비를 분석하고 원료의 산지를 추정한 결과 일본·중국산 납을 사용한 것으로 나타났다. 땜납의 성분조성은 Cu:Sn:Pb≃83:12:5이었으며 Pb의 결정이 작고 고르게 분포하고 있었다.