• 한국표면공학회:학술대회논문집
• /
• 한국표면공학회 2011년도 춘계학술대회 및 Fine pattern PCB 표면 처리 기술 워크샵
• /
• pp.192-192
• /
• 2011

본 연구에서는 LED lead frame을 위한 Sn-3.5Ag 솔더의 젖음 특성과 반사율에 관하여 조사하였다. 금속기판과 액체금속간의 젖음성은 wetting balance tester를 이용하여 평가하였으며, 최대인출력, 최대인출시간 등을 측정하고 표면장력을 계산하였다. Sn-3.5Ag 솔더를 $250{\sim}290^{\circ}C$의 온도에서 젖음성을 측정하였는데 온도가 증가함에 따라 젖음성이 향상되는 것을 확인할 수 있었다. 또한 솔더가 도금된 Cu-coupon의 반사율을 측정하였는데 $270^{\circ}C$에서 가장 높은 반사율을 나타냈다.

• 한국재료학회지
• /
• 제13권2호
• /
• pp.133-136
• /
• 2003

Sn-2.5Cu alloy layers were deposited on the Alloy 42 lead-frame substrates by the electroplating method, and their microstructures, adhesion strength, and electrical resistivity were measured to evaluate the applicability of Sn-Cu alloy as a surface finishing material of electronic parts. The Sn-2.5Cu layers were electroplated in the granular form, and composed of pure Sn and Cu$_{6}$Sn$_{5}$ intermetallic compound. Surfaces of the electroplated Sn-2.5Cu layers were rather rough and also the thickness variance was large. The adhesion strength of the Sn-2.5Cu electroplated layers was highly comparable to that of the electroplated Cu alloy layer and the electrical conductivity was about 10 times higher than the pure Sn. After the 20$0^{\circ}C$ 30 min. annealing of the electroplated Sn-2.5Cu layers, the surface roughness was reduced, and adhesion strength and conductivity were improved. These results showed the Sn-Cu alloys can be used as an excellent surface finishing material.ial.

• 열처리공학회지
• /
• 제27권1호
• /
• pp.1-9
• /
• 2014

For connector material applications, the influence alloying elements of Mn, Cr, Fe, and Ti and cold rolling reduction on the mechanical property, electrical conductivity and bendiability of Cu-Ni-Si-P alloy was investigated. The hot rolled plates were solution treated at $980^{\circ}C$ for 1.5 h, quenched into water, cold rolled by 10% and 30% reduction in thickness, and then aged at $440{\sim}500^{\circ}C$ for 3, 4, 5 times. respectively. Cu-Ni-Si-P-x alloys cold rolled by 10 reduction before heat treatment have a good bendability compare to cold rolled by 30 reduction. Cu-3.4Ni-0.8Si-0.03P-0.1Ti shows the peak strength value of 759 MPa, an electrical conductivity of 39%IACS, an elongation of 10% and a hardness of 256 Hv aged at $440^{\circ}C$ for 6 hrs. Thus it is suitable for lead frame and connector.

• 열처리공학회지
• /
• 제26권5호
• /
• pp.225-232
• /
• 2013

The influence of aging treatment, addition elements and rolling reduction ratio on the microstructure, mechanical, electrical and bendability properties of Cu-Ni-Si-P-x (x = Fe, Sn, Zn) alloys for connector material application was investigated. SEM/EDS analysis exhibited that Ni2-Si precipitates with a size of 20~100 nm were distributed in grains. Fe, Sn, Zn elemnets in Cu-Ni-Si-P alloy imporved the mechanical strength but it was not favor in increasing of electrical conductivity. As higher final rolling reduction ratio, the strength and electrical conductivity is increased after aging treatment, but it indicated excellent bendability. Especially, Cu-2Ni-0.4Si-0.5Sn-0.1Fe-0.03P alloy show the tensile strength value of 700MPa and the electrical conductivity was observed to reach a maximum of 40%IACS. It is optimal for lead frame and connector.

• Tribology and Lubricants
• /
• 제24권1호
• /
• pp.27-33
• /
• 2008

A micro-impression creep machine was designed and developed, adopting a small punch in diameter of 150 um, displacement gage with an accuracy of sub-${\mu}m$ scale, and load-cell with an accuracy of mN scale in order to investigate creep behavior of small solder ball in diameter of less than 1 mm. Creep behavior of lead-free solder ball(Sn-3.0Ag-0.5Cu) in diameter of $760\;{\mu}m$ was investigated in the stress range of $8{\sim}60\;MPa$ and at $303\;K{\sim}393\;K$. The applied load became decreased slightly and continuously in the creep rate of $10^{-4}/s$ range during the current experiments. Also, the machine frame was so sensitive to the environmental temperature that nm scaled displacement recording was unstable according to the change in environmental temperature.

• 마이크로전자및패키징학회지
• /
• 제20권2호
• /
• pp.29-32
• /
• 2013

본 연구에서는 LED 리드프레임 상에 Sn-3.5wt%Ag를 무전해도금하여 표면 거칠기와 반사율을 측정하였다. Sn-3.5wt%Ag를 도금하기에 앞서 Sn-3.5wt%Ag 도금층의 반사율을 향상시키기 위하여 Cu 전해도금을 실시하였다. 도금 후 도금액의 교반속도와 온도가 도금층의 표면 거칠기와 반사율에 어떠한 영향을 미치는지 알아보기 위하여 각각의 도금인자에 대해서 표면 거칠기와 반사율을 측정하고자 하였다. 교반속도가 100~300 rpm으로 증가함에 따라 표면 거칠기는 0.513 ${\mu}m$에서 0.266 ${\mu}m$으로 감소하였으며, 반사율은 1.67 GAM에서 1.86 GAM으로 증가하였다. 또한 온도가 $25{\sim}45^{\circ}C$로 증가함에 따라 표면 거칠기는 0.507 ${\mu}m$에서 0.350 ${\mu}m$으로 감소하였으며, 반사율은 1.68 GAM에서 1.84 GAM으로 증가하였다.

• 한국재료학회지
• /
• 제34권3호
• /
• pp.170-174
• /
• 2024

In this study, we report the microstructural evolution and shear strength of an Sn-Sb alloy, used for die attach process as a solder layer of backside metal (BSM). The Sb content in the binary system was less than 1 at%. A chip with the Sn-Sb BSM was attached to a Ag plated Cu lead frame. The microstructure evolution was investigated after die bonding at 330 ℃, die bonding and isothermal heat treatment at 330 ℃ for 5 min and wire bonding at 260 ℃, respectively. At the interface between the chip and lead frame, Ni₃Sn₄ and Ag₃Sn intermetallic compounds (IMCs) layers and pure Sn regions were confirmed after die bonding. When the isothermal heat treatment is conducted, pure Sn regions disappear at the interface because the Sn is consumed to form Ni₃Sn₄ and Ag₃Sn IMCs. After the wire bonding process, the interface is composed of Ni₃Sn₄, Ag₃Sn and (Ag,Cu)₃Sn IMCs. The Sn-Sb BSM had a high maximum shear strength of 78.2 MPa, which is higher than the required specification of 6.2 MPa. In addition, it showed good wetting flow.

• E2M - 전기 전자와 첨단 소재
• /
• 제6권6호
• /
• pp.505-513
• /
• 1993

본 논문은 전자 부품의 Soldring기에 사용되는 접합제를 Flux를 포함한 Solder paste 대신에 도금막을 이용하기 위한 Sn 도금막 형성 프로세스를 검토한 것이다. 반도체 Device를 Packaging한 외부단자(lead frame)과 HIC상의 후막전극(Ag/Pd)과의 접합 및 PCB상의 Cu land와의 접합시에는 스크린 프린트에 의한 Solder Paste가 일반적으로 사용되고 있다. 본 논문은 Fluxless Soldering의 한수단으로 도금막을 lead상에 형성시켜 접합 재료로서의 형성 프로세스 및 도금막의 특성과 도금형성 Paramete와의 관련성을 실험적으로 검토한 것으로 전류밀도 200 A/m$^{2}$의 조건으로 형성한 Sn 도금막이 접합용으로 최적조건임을 밝혔다.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 1993년도 추계학술대회 논문집
• /
• pp.49-54
• /
• 1993

This paper discusses the reliability of solder joints of electronic devices on printed circuit board. Solder application is usually done by screen printing method for the bonding between outer leads of devices and thick film(Ag/Pd) pattern on Hybrid IC as wel1 as Cu lands on PCB. As result of thermal stresses generated at the solder joints due to the differences of thermal expansion coefficients between packge body and PCB, Micro cracking often occurs due to thermal fatigue failure at solder joints. The initiation and the propagate of solder joint crack depends on the environmental conditions, such as storage temperature and thermal cycling. The principal mechanisms of the cracking pheno- mana are the formation of kirkendal void caused by the differences in diffusion rate of materials, ant the thermal fatigue effect due to the differences of thermal expansion coefficient between package body and PCB. Finally, This paper experimentally shows a way to supress solder joints cracks by using low-${\alpha}$ PCB and the packages with thin lead frame, and investigates the phenomena of diffusion near the bonding interfaces.

• 박물관보존과학
• /
• 제4권
• /
• pp.1-16
• /
• 2003

용산 새 박물관에 전시될 중앙아시아 벽화의 보존처리를 위해 이들 벽화의 채색 안료 성분 분석과 벽체에 포함된 지푸라기의 식물종 식별을 위한 조사를 실시하였다. 또한 1916년 우리 박물관에 반입되기 이전에 일본에서 시행된 보존처리 재료 및 방법을 검토하기 위하여 나무 보호틀의 목재수종 및 종이의 재질을 분석하였다. 조사결과 본4075, 4078의 검은색 안료는 carbon(C), 바탕의 흰색은 gypsum[Ca(SO)₄(H₂O)₂], 적색 계통은 lead oxide(Pb₃O₄, PbO)와 hematite(Fe₂O₃), 녹색은 Cu, As, O 화합물 등을 채색 안료로 사용하였다. 또한 벽체를 조성할 때 흙벽이 갈라지는 것을 방지하기 위해 섞어 넣은 지푸라기는 밀짚 또는 귀리짚 종류인 것으로 조사되었다. 또한 현재 벽화를 둘러싸고 있는 나무 보호틀은 버드나무속, 사시나무속, 삼나무, 그리고 소나무 중 적송류로 만들어진 것으로 밝혀졌으며 벽화(본4054, 4097)의 보호틀 내부에서 발견된 종이는 뽕나무 껍질로 만든 것으로 조사되었다.