• Proceedings of the Korean Society For Composite Materials Conference
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• 2005.11a
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• pp.129-132
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• 2005

This study analyzes the behavior of adhesion and friction according to the pore size of nanohoneycomb structures in atomic force microscope (AFM). Anodic aluminum oxide (AAO) films are fabricated as nanohoneycomb structures. According to the pore diameters of the nanohoneycomb structures, the adhesive forces and the frictional coefficients arc obtained in AFM, and the behaviors are analyzed in the view of the contact area between the sphere particle and nanohoneycomb substrate. The effective Young's moduli of the nanohoneycomb structures are measured from the nanoindentation tests, and the contact areas at zero applied load are calculated by combining the porosity of the nanohoneycomb structures and the contact radius determined from JKR and DMT theory.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2012.05a
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• pp.505-506
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• 2012

• Journal of the Korean Society of Manufacturing Technology Engineers
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• v.24 no.5
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• pp.475-480
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• 2015

Ultrasonic atomic force microscopy (Ultrasonic-AFM) has been used to investigate the elastic property of the ultra-thin coating layer in a thin-film system. The modified Hertzian theory was applied to predict the contact resonance frequency through accurate theoretical analysis of the dynamic characteristics of the cantilever. We coat 200 nm thick Aluminum and Titanium thin films on the substrate using the DC Magnetron sputtering method. The amplitude and phase of the contact resonance frequency of a vibrating cantilever varies in response to the local stiffness constant. Ultrasonic-AFM images were obtained using the variations in the elastic property of the materials. The morphology of the surface was clearly observed in the Ultrasonic-AFM images, but was barely visible in the topography. This research demonstrates that Ultrasonic-AFM is a promising technique for visualizing the distribution of local stiffness in the nano-scale thin coatings.

• Journal of the Korean Society of Manufacturing Technology Engineers
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• v.23 no.5
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• pp.478-484
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• 2014

Ultrasonic atomic force microscopy(Ultrasonic-AFM) can be used to obtain images of the elastic properties of a subsurface and to evaluate the elastic properties by measuring the contact resonance frequency. When a tip is in contact with the sample, it is necessary to understand the cantilever behavior and the tip-sample interaction for the quantitative and reliable analysis. Therefore, precise analysis models that can accurately simulate the tip-sample contact are required; these can serve as good references for predicting the contact resonance frequency. In this study, modal analyses of the first four modes were performed to calculate the contact resonance frequency by using a spring model, and the deformed shapes of the cantilever were visualized at each mode. We presented the contact characteristics of the cantilever with a variety of contact conditions by applying the contact area, contact material thickness, and material properties as the parameters for the FEM analysis.

• Journal of the Korean Society for Precision Engineering
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• v.21 no.12
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• pp.167-173
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• 2004

Recently, it has been reported that frictional behavior at nanometer scale can be different from that at macro scale. In this article, friction and wear tests were conducted using an AFM to investigate the effect of real contact area on the coefficient of friction and wear property. SiO$_2$, Hica, and SiGe were used in friction test and the AFM tip was Si$_3$N$_4$. The real contact area between an AFM tip and flat surface was calculated by the Johnson-Kendall-Roberts (JKR) theory. Wear specimen was Mica, and the diamond tip was used. We found that the coefficient of friction is constant below a critical area, but it is degraded over the area. Moreover, it is found that wear depth increased rapidly from a certain load and was degraded as a function of the number of the scanning cycles. Also, the range of scanning velocity used in this study had little effect on the wear depth.

• Journal of the Korean Society for Precision Engineering
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• v.15 no.3
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• pp.99-106
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• 1998

Recently, scientists introduced a new type of microscope capable of investigating nonconducting surfaces in an atomic scale, which is called AFM (Atomic Force Microscope). It was an innovative attempt to overcome the limitation of STM (Scanning Tunnelling Microscope) which has been able to obtain the image of conducting surfaces. Surfaces of samples are imaged with atomic resolution. The AFM is an imaging tool or a profiler with unprecedented 3-D resolution for various surface types. The AFM technology, however, leaves a lot of room for improvement due to its delicate and fragile probing mechanism. One of the room for improvements is gap control between probe tip and sample surface. Distance between probe tip and sample surface must be kept in below one Angtrom in order to measure the sample surface in Angstrom resolution. In this paper, AFM system modeling, experimental system identification and control scheme based on system identification are performed and finally sample surface is measured by home-built AFM with such a control scheme.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2005.06a
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• pp.641-644
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• 2005

The study on the interaction forces of some biological materials is important to understanding biological phenomena and their application to practical purpose. This paper introduces a measuring technique for biological adhesive forces using the AFM(Atomic Force Microscope). Since no standardized thesis on adhesive forces exist, the adhesive forces is defined as adhesive forces against a hardened surface of biological materials. To grant the results are meaningful, which is based on the understanding the surface characteristics of biological materials using the AFM, a nominal value of average adhesive force per unit area should be measured. Therefore the modified AFM probe with small micro glass bead was proposed so that it can guarantee the required contact area for measuring the average adhesive forces. A pyrex glass substrate with circular patterns, which was fabricated by micromachining technique, is introduced in order to controll the contact area. The two types of mussel adhesive proteins, Celltak and recombinant-MGFP5, were tested by the proposed measuring method. The test results show that the adhesive force of the mussel adhesive proteins can be reliably measured by use of this method.

• Journal of Adhesion and Interface
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• v.19 no.4
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• pp.163-166
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• 2018

Dip-pen nanolithography(DPN) is an atomic force microscope (AFM) based method of generating nano- or micro-patterns. This technique has been used to transfer various ink materials on the substrate through water meniscus formed between AFM tip and the substrate surface. In this study, the heptadecafluoro-1,1,2,2-tetrahydrodecyltrimethoxysilane (HDFDTMS) ink materials were coated on the pre-coated AFM tip surface with the HDFDTMS molecules. When the tip brought into contact with the hydroxyl-functionalized silicon surface, HDFDTMS ink molecules have been successfully transported from the tip onto the surface via water meniscus. The created array and passivation area showed stable structures on the surface, and the transport of ink materials from the AFM tip to the surface followed linear increase in pattern size with contact time.

• Tribology and Lubricants
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• v.21 no.5
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• pp.221-226
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• 2005

A new calibration method for exact measurement of friction force in atomic force microscope (AFM) is presented. A new conversion factor involves a contact factor affected by tip, cantilever and contact stiffness. Especially the effect of contact stiffness on the conversion factor between lateral force and lateral signal is considered. Conventional conversion factor and a new modified conversion factor were experimentally compared. Results showed that a new calibration method could minimize the effect of normal load on friction force and improve the conventional method. A new method could be applied to the specimens with different physical properties.

• Journal of the Korean Society of Manufacturing Technology Engineers
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• v.20 no.4
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• pp.395-400
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• 2011

Scanning Probe Lithography is a method to localized oxidation on single crystal silicon wafer surface. This study demonstrates nanometer scale non contact lithography process on (100) silicon (p-type) wafer surface using AFM(Atomic force microscope) apparatuses and pulse controlling methods. AFM-based experimental apparatuses are connected the DC pulse generator that supplies ultra short pulses between conductive tip and single crystal silicon wafer surface maintaining constant humidity during processes. Then ultra short pulse durations are controlled according to various experimental conditions. Non contact lithography of using ultra short pulse induces electrochemical reaction between micro-scale tip and silicon wafer surface. Various growths of oxides can be created by ultra short pulse non contact lithography modification according to various pulse durations and applied constant humidity environment.