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http://dx.doi.org/10.9725/kstle.2005.21.5.221

A New Method for Lateral Force Calibration in Atomic Force Microscope  

Yoon Eui-Sung (Tribology Research Center, KIST)
Kim Hong Joon (Tribology Research Center, KIST)
Wang Fei (Tribology Research Center, KIST)
Kong Hosung (Tribology Research Center, KIST)
Publication Information
Tribology and Lubricants / v.21, no.5, 2005 , pp. 221-226 More about this Journal
Abstract
A new calibration method for exact measurement of friction force in atomic force microscope (AFM) is presented. A new conversion factor involves a contact factor affected by tip, cantilever and contact stiffness. Especially the effect of contact stiffness on the conversion factor between lateral force and lateral signal is considered. Conventional conversion factor and a new modified conversion factor were experimentally compared. Results showed that a new calibration method could minimize the effect of normal load on friction force and improve the conventional method. A new method could be applied to the specimens with different physical properties.
Keywords
atomic force microscopy; lateral force; calibration; contact factor;
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1 Yang, X., Perry, S. and Langmuir, S., 'Friction and Molecular Order of Alkanethiol Self-Assembled Monolayers on Au(111) at Elevated Temperatures Measured by Atomic Force Microscopy', Vol. 19, pp.6135-6139, 2003   DOI   ScienceOn
2 Ruan, J. and Bhushan, B., 'Atomic scale friction measurements using friction force microscopy: part II', ASME J. Tribol', Vol. 116, pp.378-, 1994   DOI   ScienceOn
3 Klein, H., Pailharey, D. and Mathey, Y., 'Friction force studies on layered materials using an atomic force microscope', Surf. Sci., Vol.387, pp.227-235, 1997   DOI   ScienceOn
4 Attard, P., Carrambassis, A. and Ruttland, M. W., 'Dynamic surface force measurement. 2. Friction and the atomic force micros', Langmuir, Vol. 15, pp.553-563, 1999   DOI   ScienceOn
5 Franca, D. R. and Blouim, A., 'All-optical measurement of in-plane and out-of-plane Young's modulus and Poisson's ratio in silicon wafers by means of vibration modes', Meas. Sci. Technol., Vol. 15, pp.859-868, 2004   DOI   ScienceOn
6 Kogut, L. and Etsion, I., 'Adhesion in elastic-plastic spherical microcontact', J. Colloid Interface Sci., Vol. 261, pp.372-378, 2003   DOI   ScienceOn
7 Ogletree, D. F., Carpick, R. W. and Salmeron, M., 'Calibration of frictional forces in atomic force microscopy', Rev. Sci. Instrum, Vol. 67, pp.3298-3306, 1996   DOI   ScienceOn
8 Sader, J. E., 'Susceptibility of atomic force microscope cantilevers to lateral forces', Rev. Sci. Instrum, Vol. 74, pp.2438-2443, 2003   DOI   ScienceOn
9 Carpick, R. W., Ogletree, D. F. and Salmeron, M., 'Lateral stiffness: A new nanomechanical measurement for the determination of shear strengths with friction force microscopy', Appl. Phys. Lett., Vol. 70, pp.1548-1550, 1997   DOI   ScienceOn
10 Liu, E., Blanpain, B. and Celis, J. P., 'Calibration procedures for frictional measurements with a lateral force microscope', Wear, Vol. 192, pp.141-150, 1996   DOI
11 Green, C. P., Lioe, H., Cleveland, J. P., Proksch, R., Mulvaney, P. and Sader, J. E., 'Normal and torsional spring constants of atomic force microscope cantilevers', Rev. Sci. Instrum, Vol. 75, pp.1988-1996, 2004   DOI   ScienceOn
12 Kuschnereit, R., Fath, H., Kolomenskii, A. A., Szabadi, M. and Hess, P., 'Mechanical and elastic properties of amorphous hydrogenated silicon films studied by broadband surface acoustic wave spectroscopy', Appl. Phys. A: Mater. Sci. Process, Vol. 61, pp.269-276, 1995   DOI   ScienceOn
13 Jeon, S., Braiman, Y. and Thundat, T. 'Torsional spring constant obtained for an atomic force microscope cantilever', Appl. Phys. Lett., Vol. 84, pp.1795-1797, 2004   DOI   ScienceOn
14 Fujisawa, S., Kishi, E., Sugawara, Y. and Morita, S., 'Lateral force curve for atomic force/lateral force microscope calibration', Appl. Phys. Lett. Vol. 66, pp.526-528, 1995   DOI   ScienceOn
15 Mate, C. M., McClelland, G. M., Chiang, S. and Erlandsson, R., 'Atomic-scale friction of a tungsten tip on a graphite surface', Phys. Rev. Lett., Vol. 59, pp.1942-, 1987   DOI   ScienceOn
16 TGF serises from Mikromasch
17 Varenberg, M., Etsion, I. and Halperin, G., 'An improved wedge calibration method for lateral force in atomic force microscopy', Rev. Sci. Instrum, Vol. 74, pp.3362-3367, 2003   DOI   ScienceOn
18 NSC14 series from Mikromasch
19 Morel, N., Tordjeman, P. and Ramonda, M., 'Quantitative nanotribology by atomic force microscopy', Appl. Phys, Vol. 38, pp.895-899, 2005
20 Meurk, A., Larson, L. and Bergstrom, L., 'Tribological properties of iron powder subjected to various surface treatments', Mater, Res. Soc. Symp. Proc, Vol. 522, pp.427-432, 1998
21 Neumeister, J. and Ducker, W. A., 'Lateral, normal, and longitudinal spring constants of atomic force microscopy cantilevers', Rev. Sci. Instrum, Vol. 65, pp. 2527-2531, 1994   DOI   ScienceOn
22 Liu, Y., Wu, T. and Evans, D. F., 'Lateral force microscopy study on the shear properties of self-assembled monolayers of dialkylammonium surfactant on mica', Langmuir, Vol. 10, pp.2241-2245, 1994   DOI   ScienceOn