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A New Method for Lateral Force Calibration in Atomic Force Microscope

원자현미경(AFM)에서 마찰력 측정을 위한 새로운 보정 기술 연구

  • 윤의성 (한국과학기술연구원 트라이볼로지연구센터) ;
  • 김홍준 (한국과학기술연구원 트라이볼로지연구센터) ;
  • ;
  • 공호성 (한국과학기술연구원 트라이볼로지연구센터)
  • Published : 2005.10.01

Abstract

A new calibration method for exact measurement of friction force in atomic force microscope (AFM) is presented. A new conversion factor involves a contact factor affected by tip, cantilever and contact stiffness. Especially the effect of contact stiffness on the conversion factor between lateral force and lateral signal is considered. Conventional conversion factor and a new modified conversion factor were experimentally compared. Results showed that a new calibration method could minimize the effect of normal load on friction force and improve the conventional method. A new method could be applied to the specimens with different physical properties.

Keywords

References

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