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http://dx.doi.org/10.7735/ksmte.2014.23.5.478

Analysis of Contact Resonance Frequency Characteristics for Cantilever of Ultrasonic-AFM Using Finite Element Method  

Lee, Joo Min (Graduate School of Energy & Environment, Seoul Nat'l Univ. of Science & Technology)
Han, You Ha (Korea Gas Technology Corporation)
Kwak, Dong Ryul (Dept. of Mechanical & Automotive Engineering, Seoul Nat'l Univ. of Science & Technology)
Park, Ik Keun (Dept. of Mechanical & Automotive Engineering, Seoul Nat'l Univ. of Science & Technology)
Publication Information
Journal of the Korean Society of Manufacturing Technology Engineers / v.23, no.5, 2014 , pp. 478-484 More about this Journal
Abstract
Ultrasonic atomic force microscopy(Ultrasonic-AFM) can be used to obtain images of the elastic properties of a subsurface and to evaluate the elastic properties by measuring the contact resonance frequency. When a tip is in contact with the sample, it is necessary to understand the cantilever behavior and the tip-sample interaction for the quantitative and reliable analysis. Therefore, precise analysis models that can accurately simulate the tip-sample contact are required; these can serve as good references for predicting the contact resonance frequency. In this study, modal analyses of the first four modes were performed to calculate the contact resonance frequency by using a spring model, and the deformed shapes of the cantilever were visualized at each mode. We presented the contact characteristics of the cantilever with a variety of contact conditions by applying the contact area, contact material thickness, and material properties as the parameters for the FEM analysis.
Keywords
Ultrasonic Atomic Force Microscopy; Finite element method; Contact resonance frequency; Cantilever; Contact stiffness;
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Times Cited By KSCI : 4  (Citation Analysis)
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