• Title/Summary/Keyword: Charge migration

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The Analysis of Lateral Charge Migration at 3D-NAND Flash Memory by Tapering and Ferroelectric Polarization (Tapering과 Ferroelectric Polarization에 의한 3D NAND Flash Memory의 Lateral Charge Migration 분석)

  • Lee, Jaewoo;Lee, Jongwon;Kang, Myounggon
    • Journal of IKEEE
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    • v.25 no.4
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    • pp.770-773
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    • 2021
  • In this paper, the retention characteristics of 3D NAND flash memory applied with tapering and ferroelectric (HfO2) structure were analyzed after programming operation. Electrons trapped in nitride are affected by lateral charge migration over time. It was confirmed that more lateral charge migration occurred in the channel thickened by tapering of the trapped electrons. In addition, the Oxide-Nitride-Ferroelectric (ONF) structure has better lateral charge migration due to polarization, so the change in threshold voltage (Vth) is reduced compared to the Oxide-Nitride-Oxide (ONO) structure.

Reliability Analysis by Lateral Charge Migration in Charge Trapping Layer of SONOS NAND Flash Memory Devices (SONOS NAND 플래시 메모리 소자에서의 Lateral Charge Migration에 의한 소자 안정성 연구)

  • Sung, Jae Young;Jeong, Jun Kyo;Lee, Ga Won
    • Journal of the Semiconductor & Display Technology
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    • v.18 no.4
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    • pp.138-142
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    • 2019
  • As the NAND flash memory goes to 3D vertical Silicon-Oxide-Nitride-Oxide-Silicon (SONOS) structure, the lateral charge migration can be critical in the reliability performance. Even more, with miniaturization of flash memory cell device, just a little movement of trapped charge can cause reliability problems. In this paper, we propose a method of predicting the trapped charge profile in the retention mode. Charge diffusivity in the charge trapping layer (Si3N4) was extracted experimentally, and the effect on the trapped charge profile was demonstrated by the simulation and experiment.

Study on the Activation Energy of Charge Migration for 3D NAND Flash Memory Application (3차원 플래시 메모리의 전하 손실 원인 규명을 위한 Activation Energy 분석)

  • Yang, Hee Hun;Sung, Jae Young;Lee, Hwee Yeon;Jeong, Jun Kyo;Lee, Ga won
    • Journal of the Semiconductor & Display Technology
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    • v.18 no.2
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    • pp.82-86
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    • 2019
  • The reliability of 3D NAND flash memory cell is affected by the charge migration which can be divided into the vertical migration and the lateral migration. To clarify the difference of two migrations, the activation energy of the charge loss is extracted and compared in a conventional square device pattern and a new test pattern where the perimeter of the gate is exaggerated but the area is same. The charge loss is larger in the suggested test pattern and the activation energy is extracted to be 0.058 eV while the activation energy is 0.28 eV in the square pattern.

The Analysis of Retention Characteristic according to Remnant Polarization(Pr) and Saturated Polarization(Ps) in 3D NAND Flash Memory (3D NAND Flash Memory의 Remnant Polarization(Pr)과 Saturated Polarization(Ps)에 따른 Retention 특성 분석)

  • Lee, Jaewoo;Kang, Myounggon
    • Journal of IKEEE
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    • v.26 no.2
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    • pp.329-332
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    • 2022
  • In this paper, retention characteristics of lateral charge migration according to parameters of 3D NAND flash memory to which ferroelectric (HfO2) structure is applied and ∆Vth were analyzed. The larger the Ps, the greater maximum polarization possible in ferroelectric during Programming. Therefore, the initial Vth increases by about 1.04V difference at Ps 70µC/cm2 than at Ps 25µC/cm2. Also, electrons trapped after the Program operation causes lateral charge migration over time. Since ferroelectric maintains polarization without applying voltage to the gate after Programming, regardless of Ps value, polarization increases as Pr increases and the ∆Vth due to lateral charge migration becomes smaller by about 1.54V difference at Pr 50µC/cm2 than Pr 5µC/cm2.

A simplified method to determine the chloride migration coefficient of concrete by the electric current in steady state

  • Lin, K.T.;Yang, C.C.
    • Computers and Concrete
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    • v.13 no.1
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    • pp.117-133
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    • 2014
  • This study presents a rapid method for determining the steady state migration coefficient of concrete by measuring the electric current. This study determines the steady state chloride migration coefficient using the accelerated chloride migration test (ACMT). There are two stages to obtain the chloride migration coefficient. The first stage, the steady-state condition was obtained from the initial electric current at the beginning of ACMT. The second stage, the average electrical current in the steady state condition was used to determine the steady state chloride migration coefficient. The chloride migration coefficient can be determined from the average steady state current to avoid sampling and analyzing chlorides during the ACMT.

The Effect of Domain Wall on Defect Energetics in Ferroelectric LiNbO3 from Density Functional Theory Calculations

  • Lee, Donghwa
    • Journal of the Korean Ceramic Society
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    • v.53 no.3
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    • pp.312-316
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    • 2016
  • The energetics of defects in the presence of domain walls in $LiNbO_3$ are characterized using density-functional theory calculations. Domain walls show stronger interactions with antisite defects than with interstitial defects or vacancies. As a result, antisite defects act as a strong pinning center for the domain wall in $LiNbO_3$. Analysis of migration behavior of the antisite defects across the domain wall shows that the migration barrier of the antisite defects is significantly high, such that the migration of antisite defects across the domain wall is energetically not preferable. However, further study on excess electrons shows that the migration barrier of antisite defects can be lowered by changing the charge states of the antisite defects. So, excess electrons can enhance the migration of antisite defects and thus facilitate domain wall movement by weakening the pinning effect.

Water Absorption and Charge Formation in PCB (PCB 절연체에서 전하 형성과 수분 흡수)

  • Lee, Jung-Soo;Hwang, Jong-Sun
    • Proceedings of the KIEE Conference
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    • 2008.09a
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    • pp.233-234
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    • 2008
  • We observed internal space charge behavior for two types of epoxy composites under dc electric fields to investigate the influence of water at high temperature. In the case of glass/epoxy specimen, homocharge is observed at water-treated specimen, and spatial oscillations become clearer in the water-treated specimens. Electric field in the vicinity of the electrodes shows the injection of homocharge. In aramid/epoxy specimens, heterocharge is observed at water-treated specimens, i.e. negative charge accumulates near the anode, while positive charge accumulates near the cathode. Electric field is enhanced just before each electrode. In order to further examine the mechanism of space charge formation, we have developed a new system that allows in situ space charge observation during ion migration tests at high temperature and high humidity. Using this in situ system.

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Influence of Water Absorption and Charge Formation in PCB (PCB 절연체에서 전하 형성과 수분 흡수의 영향)

  • Goo, Jung-Hyun;Choi, Yong-Sung;Lee, Kyung-Sup
    • Proceedings of the KIEE Conference
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    • 2008.07a
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    • pp.2307-2308
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    • 2008
  • We observed internal space charge behavior for two types of epoxy composites under dc electric fields to investigate the influence of water at high temperature. In the case of glass/epoxy specimen, homocharge is observed at water-treated specimen, and spatial oscillations become clearer in the water-treated specimens. Electric field in the vicinity of the electrodes shows the injection of homocharge. In aramid/epoxy specimens, heterocharge is observed at water-treated specimens, i.e. negative charge accumulates near the anode, while positive charge accumulates near the cathode. Electric field is enhanced just before each electrode. In order to further examine the mechanism of space charge formation, we have developed a new system that allows in situ space charge observation during ion migration tests at high temperature and high humidity. Using this in situ system.

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Theoretical Studies on Phentl Group Migration of Protonated 1,2-Diphenyl Hydrazines

  • Kim, Chan Gyeong;Lee, In Yeong;Kim, Jang Geun;Lee, Ik Chun
    • Bulletin of the Korean Chemical Society
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    • v.21 no.5
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    • pp.477-482
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    • 2000
  • Phenyl group migration within protonated 1,2-diphenyl hydrazines has been studied theoretically using the semi-empirical AM1 method. This reaction proceeds through a 3-membered cyclic transition state and requires high activation energy. In the reactant, there was no resonance stabilization for the moving Z-ring, however, hammett $p_Z^+$ values are large due to the direct involvement of the Z-ring inthe reaction, and the development of a negative charge on the reaction center gives them a posifive value. In the case of the non-moving ring, $p_Y^+$ values are small and negative owing to the smaller positive charge increase in the reaction center. The cross-interaction constant, $p_YZ^+$, was obtained from the activation enthalpies, using the multipe linear regression methdo, and the interaction between two substituents, Y and Z, is examined.

Computational study of protactinium incorporation effects in Th and Th compounds

  • Daroca, D. Perez;Llois, A.M.;Mosca, H.O.
    • Nuclear Engineering and Technology
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    • v.52 no.10
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    • pp.2285-2289
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    • 2020
  • Protactinium contamination is a mayor issue in the thorium fuel cycle. We investigate, in this work, the consequences of Pa incorporation in vacancy defects and interstitials in Th, ThC and ThN. We calculate charge transfers and lattice distortions due to these incorporations as well as migration paths and energies involved in the diffusion of Pa.