• 제목/요약/키워드: Channel doping

검색결과 244건 처리시간 0.022초

Design of DGMOSFET for Optimum Subthreshold Characteristics using MicroTec

  • Jung, Hak-Kee;Han, Ji-Hyeong
    • Journal of information and communication convergence engineering
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    • 제8권4호
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    • pp.449-452
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    • 2010
  • We have analyzed channel doping and dimensions(channel length, width and thickness) for the optimum subthreshold characteristics of DG(Double Gate) MOSFET based on the model of MicroTec 4.0. Since the DGMOSFET is the candidate device to shrink short channel effects, the determination of design rule for DGMOSFET is very important to develop sub-100nm devices for high speed and low power consumption. As device size scaled down, the controllability of dimensions and oxide thickness is very low. We have analyzed the short channel effects for the variation of channel dimensions, and found the design conditions of DGMOSFET having the optimum subthreshold characteristics for digital applications.

Design Optimization of Silicon-based Junctionless Fin-type Field-Effect Transistors for Low Standby Power Technology

  • Seo, Jae Hwa;Yuan, Heng;Kang, In Man
    • Journal of Electrical Engineering and Technology
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    • 제8권6호
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    • pp.1497-1502
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    • 2013
  • Recently, the junctionless (JL) transistors realized by a single-type doping process have attracted attention instead of the conventional metal-oxide-semiconductor field-effect transistors (MOSFET). The JL transistor can overcome MOSFET's problems such as the thermal budget and short-channel effect. Thus, the JL transistor is considered as great alternative device for a next generation low standby power silicon system. In this paper, the JL FinFET was simulated with a three dimensional (3D) technology computer-aided design (TCAD) simulator and optimized for DC characteristics according to device dimension and doping concentration. The design variables were the fin width ($W_{fin}$), fin height ($H_{fin}$), and doping concentration ($D_{ch}$). After the optimization of DC characteristics, RF characteristics of JL FinFET were also extracted.

Inclusion of Silicon Delta-doped Two-dimensional Electron Gas Layer on Multi-quantum Well Nano-structures of Blue Light Emitting Diodes

  • Kim, Keun-Joo
    • Transactions on Electrical and Electronic Materials
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    • 제5권5호
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    • pp.173-179
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    • 2004
  • The influence of heavily Si impurity doping in the GaN barrier of InGaN/GaN multi-quantum well structures of blue light emitting diodes were investigated by growing samples in metal-organic chemical vapor deposition. The delta-doped sample was compared to the sample with the undoped barrier. The delta-doped sample shows the tunneling behavior and forms the energy level of 0.32 eV for tunneling and the photoemission of the 450-nm band. The photo-luminescence shows the blue-shifted broad band of the radiative transition due to the inclusion of Si delta-doped layer indicating that the delta doping effect acts to form the higher energy level than that of quantum well. The dislocation may provide the carrier tunneling channel and plays as a source of acceptor. During the tunneling of hot carrier, there was no light emission.

Simulation of Source/Drain Doping Effects and Performance Analysis of MoS2 Transistor

  • Kim, Chul-min;Park, Il Hoo;Lee, Kook Jin
    • EDISON SW 활용 경진대회 논문집
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    • 제5회(2016년)
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    • pp.285-287
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    • 2016
  • 이황화 몰리브덴(Molybdenum disulfide: $MoS_2$)을 채널(Channel) 물질로 이용하여 metal-oxide-semiconductor(MOS) 구조를 제작하고, 효율적인 제작과정을 제시하였고 특히, Source/Drain의 Doping concentration을 조절하여 효과적인 $MoS_2$ Transistor를 제작 및 시뮬레이션 하였다. 그 후 여러 MOSFET의 특성 분석을 통하여 소자로서의 기능을 확인해보았다. 그리고 특히 채널의 전기적인 특성을 분석하고 채널 내 그리고 contact 사이의 저항 및 mobility의 특성을 알아보았는데, 그 중 Source/Drain Doping Effect와 performance 분석을 통해, 최적화된 $MoS_2$ Transistor를 찾아보았다.

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Effects of metal contacts and doping for high-performance field-effect transistor based on tungsten diselenide (WSe2)

  • Jo, Seo-Hyeon;Park, Jin-Hong
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2016년도 제50회 동계 정기학술대회 초록집
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    • pp.294.1-294.1
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    • 2016
  • Transition metal dichalcogenides (TMDs) with two-dimensional layered structure, such as molybdenum disulfide (MoS2) and tungsten diselenide (WSe2), are considered attractive materials for future semiconductor devices due to its relatively superior electrical, optical, and mechanical properties. Their excellent scalability down to a monolayer based on the van der Waals layered structure without surface dangling bonds makes semiconductor devices based on TMD free from short channel effect. In comparison to the widely studied transistor based on MoS2, researchs focusing on WSe2 transistor are still limited. WSe2 is more resistant to oxidation in humid ambient condition and relatively air-stable than sulphides such as MoS2. These properties of WSe2 provide potential to fabricate high-performance filed-effect transistor if outstanding electronic characteristics can be achieved by suitable metal contacts and doping phenomenon. Here, we demonstrate the effect of two different metal contacts (titanium and platinum) in field-effect transistor based on WSe2, which regulate electronic characteristics of device by controlling the effective barreier height of the metal-semiconductor junction. Electronic properties of WSe2 transistor were systematically investigated through monitoring of threshold voltage shift, carrier concentration difference, on-current ratio, and field-effect mobility ratio with two different metal contacts. Additionally, performance of transistor based on WSe2 is further enhanced through reliable and controllable n-type doping method of WSe2 by triphenylphosphine (PPh3), which activates the doping phenomenon by thermal annealing process and adjust the doping level by controlling the doping concentration of PPh3. The doping level is controlled in the non-degenerate regime, where performance parameters of PPh3 doped WSe2 transistor can be optimized.

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20nm이하 FinFET의 크기변화에 따른 서브문턱스윙분석 (Analysis of Dimension Dependent Subthreshold Swing for FinFET Under 20nm)

  • 정학기
    • 한국정보통신학회논문지
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    • 제10권10호
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    • pp.1815-1821
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    • 2006
  • 본 연구에서는 20m이하 채널길이를 가진 FinFET에 대하여 문턱 전압이 하에서 서브문턱 스윙을 분석하였다. 분석을 위하여 분석 학적 전류모델을 개발하였으며 열방사 전류 및 터 널링 전류를 포함하였다. 열방사전류는 포아슨 방정식에 의하여 구한 포텐셜분포 및 맥스월-볼쯔만통계를 이용한 캐리어분포를 이용하여 구하였으며 터널링전류는 WKB(Wentzel-Kramers-Brillouin) 근사를 이용하였다. 이 두 모델은 상호 독립적이므로 각각 전류를 구해 더 함으로써 차단전류를 구하였다. 본 연구에서 제시한 모델을 이용하여 구한 서브문턱스윙 값이 이차원시뮬레이션 값과 비교되었으며 잘 일치함을 알 수 있었다. 분석 결과 10nm이하에서 특히 터널링의 영향이 증가하여 서브문턱스윙특성이 매우 저하됨을 알 수 있었다. 이러한 단채널현상을 감소시키기 위하여 채널두께 및 게이트산화막의 두께를 가능한 한 얇게 제작하여 야함을 알았으며 이를 위한 산화공정 개발이 중요하다고 사료된다. 또한 채널도핑 변화에 따른 서브문턱 스윙 값을 구하였으며 저도핑영역에서 일정한 값을 가지는 것을 알 수 있었다.

무접합 원통형 게이트 MOSFET에서 문턱전압이동 분석을 위한 문턱전압이하 전류 모델 (Subthreshold Current Model for Threshold Voltage Shift Analysis in Junctionless Cylindrical Surrounding Gate(CSG) MOSFET)

  • 정학기
    • 한국정보통신학회논문지
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    • 제21권4호
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    • pp.789-794
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    • 2017
  • 본 논문에서는 무접합 원통형 MOSFET의 해석학적 전위분포를 이용하여 문턱전압이하 전류모델을 제시하고 이를 이용하여 문턱전압이동을 해석하였다. 무접합 원통형 MOSFET는 채널을 게이트 단자가 감싸고 있기 때문에 캐리어 흐름을 제어하는 게이트 단자의 능력이 매우 우수하다. 본 연구에서는 쌍곡선 전위분포모델을 이용하여 포아송방정식을 풀고 이 때 얻어진 중심 전위분포를 이용하여 문턱전압이하 전류 모델을 제시하였다. 제시된 전류모델을 이용하여 $0.1{\mu}A$의 전류가 흐를 때 게이트 전압을 문턱전압으로 정의하고 2차원 시뮬레이션 값과 비교하였다. 비교결과 잘 일치하였으므로 이 전류모델을 이용하여 채널크기 및 도핑농도에 따라 문턱전압이동을 고찰하였다. 결과적으로 채널 반지름이 증가할수록 문턱전압이동은 매우 크게 나타났으며 산화막 두께가 증가할 경우도 문턱전압이동은 증가하였다. 채널 도핑농도에 따라 문턱전압을 관찰한 결과, 소스/드레인과 채널 간 도핑농도의 차이가 클수록 문턱전압은 크게 증가하는 것을 관찰하였다.

이중 $\delta$ 도핑 채널 MESFET의 특성향상 (Performance Improvement of Double $\delta$-doped Channel MESFET's)

  • 이관흠;이찬호
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 1998년도 추계종합학술대회 논문집
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    • pp.537-540
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    • 1998
  • A MESFET device with double $\delta-doped$ channel is designed and investigated by computer simulation. The device with optimized design parameters such as a doping ratio and a spacer thickness, shows superior performance to conventional MESFETs. The effects of the FWHM of $\delta-doped$ layers device characteristics are investigated to account for the thermal process

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Novel Devices for Sub-100 nm CMOS Technology

  • Lee, Jong-Ho
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2000년도 춘계학술대회 논문집 전자세라믹스 센서 및 박막재료 반도체재료 일렉트렛트 및 응용기술
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    • pp.180-183
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    • 2000
  • Beginning with a brief introduction on near 100 nm or below CMOS devices, this paper addresses novel devices for future sub-100 nm CMOS. First, key issues such as gate materials, gate dielectric, source/drain, and channel in Si bulk CMOS devices are considered. CMOS devices with different channel doping and structure are introduced by explaining a figure of merit. Finally, novel device structures such as SOI, SiGe, and double-gate devices will be discussed for possible candidates for sub-100 nm CMOS.

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A Study of SCEs and Analog FOMs in GS-DG-MOSFET with Lateral Asymmetric Channel Doping

  • Sahu, P.K.;Mohapatra, S.K.;Pradhan, K.P.
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제13권6호
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    • pp.647-654
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    • 2013
  • The design and analysis of analog circuit application on CMOS technology are a challenge in deep sub-micrometer process. This paper is a study on the performance value of Double Gate (DG) Metal Oxide Semiconductor Field Effect Transistor (MOSFET) with Gate Stack and the channel engineering Single Halo (SH), Double Halo (DH). Four different structures have been analysed keeping channel length constant. The short channel parameters and different sub-threshold analog figures of merit (FOMs) are analysed. This work extensively provides the device structures which may be applicable for high speed switching and low power consumption application.