• Title/Summary/Keyword: CTE

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A Study on Estimation Model of Resistance Value from Change of PTH Crack Size (PTH Crack을 고려한 저항 변화 추정 모델)

  • Kim, Gi-Young;Park, Boo-Hee;Kim, Seon-Jin;Yoo, Ki-Hun;Seol, Dong-Jin;Jang, Joong-Soon;Lee, Hyung-Rok;Kim, Tae-Hyuk
    • Journal of Applied Reliability
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    • v.8 no.4
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    • pp.155-166
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    • 2008
  • PTH cracks are caused by the mismatch of coefficient of thermal expansion(CTE) between polymer and laminated materials, and are one of the main failure mechanisms of multi layer boards. In spite of its importance, it is usually hard to measure or detect them because of its small size and invisibility. To detect PTH cracks more effectively, this paper proposes a theoretical model that can estimate the resistance value from crack size of PTHs. Using four-point probe resistance measurement method, the resistance value of test coupons is measured. Through measured data, we verify the validity of the proposed theoretical model and set up criteria of failure.

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Effect of Underfill on $\mu$BGA Reliability ($\mu$BGA 장기신뢰성에 미치는 언더필영향)

  • 고영욱;신영의;김종민
    • Proceedings of the International Microelectronics And Packaging Society Conference
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    • 2002.05a
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    • pp.138-141
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    • 2002
  • There are continuous efforts in the electronics industry to a reduced electronic package size. Reducing the size of electronic packages can be achieved by a variety of means, and for ball grid array(BGA) packages an effective method is to decrease the pitch between the individual balls. Chip scale package(CSP) and BGA are now one of the major package types. However, a reduced package size has the negative effect of reducing board-level reliability. The reliability concern is for the different thermal expansion rates of the two-substrate materials and how that coefficient CTE mismatch creates added stress to the BGA solder joint when thermal cycled. The point of thermal fatigue in a solder joint is an important factor of BGA packages and knowing at how many thermal cycles can be ran before failure in the solder BGA joint is a must for designing a reliable BGA package. Reliability of the package was one of main issues and underfill was required to improve board-level reliability. By filling between die and substrate, the underfill could enhance the reliability of the device. The effect of underfill on various thermomechanical reliability issues in $\mu$BGA packages is studied in this paper.

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EFFECTS OF PROCESS INDUCED DEFECTS ON THERMAL PERFORMANCE OF FLIP CHIP PACKAGE

  • Park, Joohyuk;Sham, Man-Lung
    • Proceedings of the International Microelectronics And Packaging Society Conference
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    • 2002.11a
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    • pp.39-47
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    • 2002
  • Heat is always the root of stress acting upon the electronic package, regardless of the heat due to the device itself during operation or working under the adverse environment. Due to the significant mismatch in coefficient of thermal expansion (CTE) and the thermal conductivity (K) of the packaging components, on one hand intensive research has been conducted in order to enhance the device reliability by minimizing the mechanical stressing and deformation within the package. On the other hand the effectiveness of different thermal enhancements are pursued to dissipate the heat to avoid the overheating of the device. However, the interactions between the thermal-mechanical loading has not yet been address fully. in articular when the temperature gradient is considered within the package. To address the interactions between the thermal loading upon the mechanical stressing condition. coupled-field analysis is performed to account the interaction between the thermal and mechanical stress distribution. Furthermore, process induced defects are also incorporated into the analysis to determine the effects on thermal conducting path as well as the mechanical stress distribution. It is concluded that it feasible to consider the thermal gradient within the package accompanied with the mechanical analysis, and the subsequent effects of the inherent defects on the overall structural integrity of the package are discussed.

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The Influence of Encapsulation Layer Incorporated into Flexible Substrates for Bending Stress (Flexible 기판의 Bending Stress에 대한 Encapsulation Layer의 영향)

  • Park, Jun-Baek;Seo, Dae-Shik;Lee, Sang-Keuk;Lee, Joon-Ung;Kim, Yong-Hoon;Moon, Dae-Gyu;Han, Jeong-In
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.11a
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    • pp.473-476
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    • 2003
  • This paper shows necessity of encapsulation layer to maximite flexibility of brittle indium-tin-oxide (ITO) on polymer substrates. And, Young's modulus (E) of encapsulation layer have an significant effect on external bending stress and the coefficient of thermal expansion (CTE) of that have a significant effect on internal thermal stress. To compare magnitude of total mechanical stress including both bending stress and thermal stress, the mechanical stress of triple-layer structure (substrate / ITO / encapsulation layer or substrate / buffer layer / ITO) can be quantified and numerically analyzed through the farthest cracked island position. As a result, it should be noted that multi-layer structures with more elastic encapsulation material have small mechanical stress compared to that of buffer and encapsulation structure of large Young's modulus material when they were externally bent.

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A Study on the Mis-align during Fabricated Poly-Si TFT on Polymer substrate (고분자 기판위에 Poly-Si TFT 제작시 Mis-align방지를 위한 연구)

  • Kang, Su-Hee;Hwang, Jung-Yeon;Seo, Dae-Shik;Kim, Young-Hun;Moon, Dae-Kyu;Han, Jung-In
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2005.05a
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    • pp.173-176
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    • 2005
  • Teijin사의 HT100-B60의 폴리카보네이트(polycarbonate) $100{\mu}m$, I-Component사의 PES(polyethersulfone) $200{\mu}m$, Ferrania사의 PAR(polyacrylate) $100{\mu}m$$200{\mu}m$를 사용하였다 열팽창계수의 차이로 인해 공정상 기판의 가열과 냉각시 열응력이 발생하여 기판의 크랙발생의 원인이 된다. 이를 최소화하기 위해 모든 공정이 시작하기 전에 pre-annealing을 통해 plastic 기판의 시간별 공정을 실시하였다. plastic film의 annealing time은 0h, 12h, 24, 40h, 50h, 60h, 70h, 80h으로 사간을 달리하여 오븐 안의 진공상태를 조성하여 실험하였다. Thermal evaporator로 Al을 약 170nm 증착하였으며 (주)동진 세미캠의 DTFR-1011s DR LCD용 감광액을 Spin Coating Spread(500rpm/6sec), Spin(3000rpm/20sec)으로 coating하였다.

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Synthesis and Characterization of Colorless Polyimide Nanocomposite Films Containing Pendant Trifluoromethyl Groups

  • Jin, Hyo-Seong;Chang, Jin-Hae;Kim, Jeong-Cheol
    • Macromolecular Research
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    • v.16 no.6
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    • pp.503-509
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    • 2008
  • A series of colorless polyimide (PI) nanocomposite films were synthesized from 2,2'-bis(3,4-dicarboxyphenyl)hexafluoropropane dianhydride (6FDA) and 2,2'-bis(trifluoromethyl)-4,4'-diaminobiphenyl (TFDB) with various organoclay contents by solution intercalation polymerization to poly(amic acid)s, followed by thermal imidization. The variation with the organoclay content of the thermomechanical properties, morphology, and optical transparency of the hybrids was examined at organoclay loadings ranging from 0 to 1.0 wt%. The hybrid films showed high optical transparency and almost no color, with cut-off wavelengths ranging from 352 and 356 nm and very low $b^*$ values of 1.19-1.77. The hybrid PI films showed good thermal properties with a glass transition temperature of $280-287^{\circ}C$. Most films did not show any significant thermal decomposition below $490^{\circ}C$. The addition of only a small amount of organoclay was sufficient to improve the tensile properties of the PI films with maximum enhancement being observed at 0.25 wt% organoclay. Moreover, these PI hybrids also had low coefficients of thermal expansion (CTE).

Accelerated Thermo-Mechanical Fatigue Life of Pb-Free Solder Joints for PZT Ceramic Resonator (PZT 세라믹 레조네이터 무연솔더 접합부의 열-기계적 피로 가속수명)

  • Hong, Won-Sik;Park, No-Chang;Oh, Chul-Min
    • Korean Journal of Materials Research
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    • v.19 no.6
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    • pp.337-343
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    • 2009
  • In this study, we optimized Pb-free Sn/Ni plating thickness and conditions were optimized to counteract the environmental regulations, such as RoHS and ELV(End-of Life Vehicles). The $B_{10}$ life verification method was also suggested to have been successful when used with the accelerated life test(ALT) for assessing Pb-free solder joint life of piezoelectric (PZT) ceramic resonator. In order to evaluate the solder joint life, a modified Norris-Landzberg equation and a Coffin-Manson equation were utilized. Test vehicles that were composed of 2520 PZT ceramic resonator on FR-4 PCB with Sn-3.0Ag-0.5Cu for ALT were manufactured as well. Thermal shock test was conducted with 1,500 cycles from $(-40{\pm}2)^{\circ}C$ to $(120{\pm}2)^{\circ}C$, and 30 minutes dwell time at each temperature, respectively. It was discovered that the thermal shock test is a very useful method in introducing the CTE mismatch caused by thermo-mechanical stress at the solder joints. The resonance frequency of test components was measured and observed the microsection views were also observed to confirm the crack generation of the solder joints.

The Effect of Heat Treatment on the Thermal Expansion Behavior of Electroformed Nano-crystalline Fe-42 wt%Ni Alloy

  • Lee, Minsu;Han, Yunho;Yim, Tai Hong
    • Journal of the Korean institute of surface engineering
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    • v.47 no.6
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    • pp.293-296
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    • 2014
  • Fe-Ni has been of great interest because it is known as one of low thermal expansion alloys as various application areas. This alloy was fabricated by electroforming process, and effect of heat treatment on thermal expansion and hardness was investigated. Nano-crystalline structure of 13.3 - 63.5 nm in size was observed in the as-deposited alloy. To investigate the effect of heat treatment on grain growth and mechanical/thermal properties, we conducted hardness and coefficient of thermal expansion (CTE). From this, we confirmed these properties were varied by heat treatment. In this nano-crystalline alloy, we could observe abnormal behavior in thermal expansion between $350-400^{\circ}C$. Additionally, an abrupt change in hardness has also been observed. However, once the grains grow up to micro-sized the mechanical and thermal properties mentioned above were stabilized similar to those of bulk alloys due to heat treatment.

Genotoxic Effects of Volatile Organic Compounds in Water (물속 휘발성 유기화합물이 염색체 돌연변이에 미치는 영향)

  • Jung Kyu Saeng;Lee Chae Yang;Shin Heuyn Kil;Lee Ki Nam;Jeung Jae Yeal;Lee Jong Young
    • Journal of Physiology & Pathology in Korean Medicine
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    • v.16 no.5
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    • pp.899-904
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    • 2002
  • For determination of the genotoxicity of VOCs(Volatile Organic Compounds) in water, in vitro Comet assay was performed using 3T3 cells. The selected 5 VOCs; Trichloroethylene(TCE), Tetrachloroethylene(PCE), Carbontetrachloride (CteC), Dichloromethane(DCM) and Chlorofrom(Chl) and mixed solvent(Mix), are the test items for drinking water quality. Author analyzed the genotoxicity of these solvents through their tail length (TL) values. Mix, PCE, Chl, TCE in order had cytotoxicity at the highest concentration, and CCl₄ and DCM had no cytotoxic effect. TCE, CCl₄, Chl, PCE, Mix, DCM had genotoxicity, Chl, PCE, Mix had both cytotoxicity and genotoxicity simultaneously, Cytotoxic effect of mixed organic solvents, compared with that of single component, at each concentration, was influenced by the synergistic effect of the interaction of each organic component.

Synthesis and Characterization of Polyimide/silica Hybrid Films Derived from Silane Oligomer Containing Epoxy Group (에폭시 그룹을 함유한 실란 올리고머의 합성과 그로부터 유도된 폴리이미드/실리카 혼성 필름의 특성)

  • Lee, Jun Hyuk;Park, Yun Jun;Choi, Jong-Ho;Nam, Sang Yong;Kim, Sung Won;Hong, Young Taik
    • Journal of Adhesion and Interface
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    • v.10 no.2
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    • pp.98-105
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    • 2009
  • Poly(amic acid) was synthesized from the reaction of p-PDA/ODA and PMDA/BPDA and silane oligomer containing epoxy group was also synthesized from the reaction of tetramethylorthosilicate (TMOS) and glycidol. After hybridizing poly (amic acid) and silane oligomer, they were effectively converted into polyimide/silica hybrid films by thermal imidization process. As the silica contents in hybrid films increased, CTE values decreased from 17 ppm/K to 10 ppm/K and the tensile modulus increased, in spite of decreasing tensile strength. In addition, the peel test showed that the adhesion strength of hybrid film was enhanced from $0.43kg_f/cm$ to $1.02kg_f/cm$. Therefore, it could be concluded that the polyimide/silica hybrid film is effective to enhance adhesion strength for FCCL films.

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