• 대한전자공학회논문지
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• 제26권9호
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• pp.1359-1368
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• 1989

In this paper, the composite BiCMOS transistor which combines a bipolar transistor and a MOS transistor in a cascade type, is analyzed in terms of I-V characteristics and small signal equivalent circuit. As a result, it has a larger driving capability than MOS transistor and a more extended rante of input voltage than bipolar transistor. Next, a BiCMOS differential amplifier as its application example is designed and compared with the CMOS one and the bipolar one. It increases the driving capability of the CMOS differential amp and improves the linear operation region of the bipolar differential amp.

• JSTS:Journal of Semiconductor Technology and Science
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• 제3권4호
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• pp.205-210
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• 2003

A 3-Transistor cell CMOS OTP ROM array using standard CMOS antifuse (AF) based on permanent breakdown of MOSFET gate oxide is proposed, fabricated and characterized. The proposed 3-T OTP cell for ROM array is composed of an nMOS AF, a high voltage (HV) blocking nMOS, and cell access transistor, all compatible with standard CMOS technology. The experimental results show that the proposed structure can be a viable technology option as a high density OTP ROM array for modern digital as well as analog circuits.

• JSTS:Journal of Semiconductor Technology and Science
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• 제4권2호
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• pp.106-109
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• 2004

A high-density 3-transistor cell one-time programmable (OTP) ROM array using standard CMOS Gate-Oxide antifuse (AF) is proposed, fabricated, and characterized with $0.18{\mu}m$ CMOS process. The proposed non-volatile high-density OTP ROM is composed of an array of 3-T OTP cells with the 3-T consisting of an nMOS AF, a high voltage (HV) blocking transistor, and a cell access transistor, all compatible with standard CMOS technology.

• 전자공학회논문지A
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• 제32A권12호
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• pp.198-208
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• 1995

BiCMOS circuit consist of CMOS part which constructs logic function, and bipolar part which drives output load. Test to detect stuck-open faults in BiCMOS circuit is important, since these faults do sequential behavior and are represented as transition faults. In this paper, proposes a method for efficiently detecting transistor stuck-open faults in BiCMOS circuit by transforming them into slow-to=rise transition and slow-to-fall transition. In proposed method, BiCMOS circuit is transformed into equivalent gate-level circuit by dividing it into pull-up part which make output 1, and pull-down part which make output 0. Stuck-open faults in transistor are modelled as transition fault in input line of gate level circuit which is transformed from given circuit. Faults are detceted by using pull-up part gate level circuit when expected value is '01', or using pull-down part gate level circuit when expected value is '10'. By this method, transistor stuck-open faults in BiCMOS circuit are easily detected using conventional gate level test generation algorithm for transition fault.

• 대한전자공학회논문지
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• 제24권6호
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• pp.1080-1086
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• 1987

SLAGEN, a system for symbolic cell layout based on artificial intelligence approach, takes as input a transistor connection description of CMOS standard cells and environment information, and outputs a symbolic layout description. SLAGEN performas transistor grouping by a heuristic search method, in order to minimize the number of separations, and then performs group reordering and transistor reordering with an eye toward minimizing routing. Next, SLAGEN creates a rough initial routing in order to guarantee functionality and correctness, and then improve the initial routing by a rule-based approach.

• 정보처리학회논문지A
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• 제15A권5호
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• pp.243-248
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• 2008

본 논문은 다중 문턱전압 CMOS를 이용하여 저 전력 특성을 갖는 캐리 예측 가산기 (carry look-ahead adder)를 설계하였으며, 이를 일반적인 CMOS 가산기와 특성을 비교하였다. 전파 지연시간이 긴 임계경로에 낮은 문턱전압 트랜지스터를 사용하여 전파 지연시간을 감소시켰다. 전파 지연시간이 짧은 최단경로에는 높은 문턱전압 트랜지스터를 사용하여 회로전체의 소비전력을 감소시켰으며, 그 외의 논리블럭들은 정상 문턱전압의 트랜지스터를 사용하였다. 설계한 가산기는 일반적인 CMOS 회로와 비교하여 소비전력에서 14.71% 감소하였으며, 소비전력과 지연 시간의 곱에서 16.11%의 성능향상이 있었다. 이 회로는 삼성 $0.35{\mu}m$ CMOS 공정을 이용하여 설계하였으며, HSPICE를 통하여 검증하였다.

• 한국산업정보학회논문지
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• 제6권3호
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• pp.123-127
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• 2001

CMOS 트랜지스터의 등가회로모델 파라미터 $C_{gs}$ 의 예측방법이 CMOS 트랜지스의 반전층내의 유동전하량 계산과 전하유도 특성에 의해 제안되었다. 이 $C_{gs}$ 파라미터는 MOS 트랜지스터의 RF대역의 차단주파수를 결정하고 또한 입력과 출력을 커플링 시키는 중요한 파라미터이다. 이 제안된 방법은 등가회로 모델에서 파라미터 값을 예측하고 파라미터 값을 추출하는 소프트웨어 개발에 기여할 것이다.

• 제어로봇시스템학회:학술대회논문집
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• 제어로봇시스템학회 2000년도 제15차 학술회의논문집
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• pp.510-510
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• 2000

This paper introduces the design of BiCMOS latched comparator circuit for high-speed system application, which can be used in data conversion, instrumentation, communication system etc. By exploiting the advantage technology of the combination of both the bipolar transistor and the CMOS transistor devices. The comparator circuit includes an input stage that combines MOS sampling with a bipolar regenerative amplifier. The resistive load of conventional current-steering comparator is replaced by a load, which is made by a NMOS transistor. The advantage of design and PSPICE simulation of BiCMOS latched comparator are the circuit will obtain wide bandwidth with lowest power consumption at a single supply voltage. All the characteristics of the proposed BiCMOS latched comparator circuit is carried out by simulation program.

• 한국산업정보학회:학술대회논문집
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• 한국산업정보학회 2002년도 춘계학술대회 논문집
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• pp.195-199
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• 2002

This paper describes the effect of substrate back bias of CMOS Inverter. When the substrate back bias applied in body, the MOS transistor threshold voltage increased and drain saturation current decreased. The back gate reverse bias or substrate bias has been widely utilized and the following advantage has suppressing subthreshold leakage, lowering parasitic junction capacitance, preventing latch up or parasitic bipolar transistor, etc. When the reverse voltage applied substrate, this paper stimulated the propagation delay time CMOS inverter.

• 전자공학회논문지A
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• 제33A권2호
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• pp.184-195
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• 1996

Beause BiCMOS logic circuits consist of CMOS part which constructs logic function and bipolar part which drives output load, the effect of short faults on BiCMOS logic circuits represented different types from that on CMOS. This paper proposes new test method which detects short faults on BiCMOS logic circuits using current path graph. Proposed method transforms BiCMOS circuits into raph constructed by nodes and edges using extended switch-level model and separates the transformed graph into pull-up part and pull-down part. Also, proposed method eliminates edge or add new edge, according ot short faults on terminals of transistor, and can detect short faults using current path graph that generated from on- or off-relations of transistor by input patterns. Properness of proposed method is verified by comparing it with results of spice simulation.