• The Journal of Korea Institute of Information, Electronics, and Communication Technology
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• v.16 no.6
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• pp.465-471
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• 2023

This paper proposes a comparator structure that improves the noise and output delay of a single-slope ADC(SS-ADC) used in CMOS Image Sensor (CIS). To improve the noise and delay characteristics of the output, a comparator structure using the miller effect is designed by inserting a capacitor between the output node of the first stage and the output node of the second stage of the comparator. The proposed comparator structure improves the noise, delay of the output, and layout area by using a small capacitor. The CDS counter used in the single slop ADC is designed using a T-filp flop and bitwise inversion circuit, which improves power consumption and speed. The single-slope ADC also performs dual CDS, which combines analog correlated double sampling (CDS) and digital CDS. By performing dual CDS, image quality is improved by reducing fixed pattern noise (FPN), reset noise, and ADC error. The single-slope ADC with the proposed comparator structure is designed in a 0.18-㎛ CMOS process.

• Journal of Sensor Science and Technology
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• v.27 no.3
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• pp.160-164
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• 2018

In this paper, a wide dynamic range complementary metal-oxide-semiconductor (CMOS) image sensor with the adjustable sensitivity by using cascode metal-oxide-semiconductor field-effect transistor (MOSFET) and inverter is proposed. The characteristics of the CMOS image sensor were analyzed through experimental results. The proposed active pixel sensor consists of eight transistors operated under various light intensity conditions. The cascode MOSFET is operated as the constant current source. The current generated from the cascode MOSFET varies with the light intensity. The proposed CMOS image sensor has wide dynamic range under the high illumination owing to logarithmic response to the light intensity. In the proposed active pixel sensor, a CMOS inverter is added. The role of the CMOS inverter is to determine either the conventional mode or the wide dynamic range mode. The cascode MOSFET let the current flow the current if the CMOS inverter is turned on. The number of pixels is $140(H){\times}180(V)$ and the CMOS image sensor architecture is composed of a pixel array, multiplexer (MUX), shift registers, and biasing circuits. The sensor was fabricated using $0.35{\mu}m$ 2-poly 4-metal CMOS standard process.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.15 no.4
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• pp.897-904
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• 2011

In this paper, a novel circuit topology of a low-noise amplifier tunable at 1.8GHz band for PCS and 2.4GHz band for WLAN using a CMOS active inductor is proposed. This circuit topology to reduce higher noise figure of the low noise amplifier with the CMOS active load is analyzed. Furthermore, the noise canceling technique is adopted to reduce more the noise figure. The noise figure of the proposed circuit topology is analyzed and simulated in $0.18{\mu}m$ CMOS process technology. Thus, the simulation results exhibit that the noise performance enhancement of the tunable low noise amplifier is about 3.4dB, which is mainly due to the proposed new circuit topology.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.2
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• pp.125-129
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• 2008

A low-voltage active CMOS inductor approach, which can improve the quality-factor(Q), is proposed in this paper. A low-voltage active inductor circuit topology with a feedback resistance is proposed, which can substantially improve its equivalent inductance and quality-factor(Q). This proposed low-voltage active inductor with a feedback resistance was simulated by ADS(Agilent) using 0.18um standard CMOS technology. Simulation showed that the designed active inductor had a maximum quality-factor(Q) of 3000 with a 1.5nH inductance at 4GHz

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• v.9 no.2
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• pp.873-876
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• 2005

This paper presents a new current transient test technique for wideband CMOS Op Amps. This technique monitors the transient power supply current and output responses of the CMOS Op Amp to automatically differentiate faulty and fault-free op amps. The wideband op amp is designed using 0.25${\mu}$m CMOS technology. We present detailed simulation results for a wideband op amp. We show that catastrophic faults in op amps can be detected and analyzed by monitoring power supply currents and output responses. This technique is inexpensive and simple.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.18 no.4
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• pp.602-610
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• 1993

The DDA of new active element and the DDA differential integrator are designed. The DDA can be improved matching problems of external elements in op-amp application circuits. The design of DDA is used the transconductance element, differential pair and $2{\mu}m$ design rule. In order to evaluate the performance of the CMOS DDA, we simulated the DDA voltage inverter and the DDA level shifter using the designed CMOS DDA. Furthermore, the grounded resistor and the differential integrator is designed using the CMOS DDA and we found that its characteristics are agreed to OP-AMP differential integrator's. We performed the layout of the CMOS DDA and DDA differential integrator with MOSIS $2{\mu}m$ CMOS technology.

• Journal of the Institute of Electronics Engineers of Korea SC
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• v.41 no.5
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• pp.43-48
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• 2004

A PWM Circuit using CMOS OTA is proposed. It features that the oscillation frequency is independent of supply voltage and temperature, and is linearly controlled by the bias current of OTA. The H-SPICE simulation results are given and they show good performance of the proposed circuit. The layout results using 0.3${\mu}{\textrm}{m}$ CMOS technology for IC implementation are also given.

• Journal of IKEEE
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• v.8 no.2 s.15
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• pp.161-165
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• 2004

In this paper, an 8bit wave pipelined adder using the static CMOS plus Edge-Sensing Completion Detection Logic is presented. The clockless wave-pipelining algorithm was implemented in the circuit design. The Edge-Sensing Completion Detection (ESCD) in the algorithm is consisted of edge-sensing circuits and latches. Using the algorithm, skewed data at the output of 8bit adder could be aligned. Simulation results show that the adder operates at 1GHz in $0.35{\mu}m$ CMOS technology with 3.3V supply voltage.

• Journal of Korea Society of Industrial Information Systems
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• v.12 no.2
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• pp.79-84
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• 2007

This papar reports design and fabrication of CMOS temperature control circuit using MOSIS 0.25um-3.3V CMOS technology. The proposed circuit has a temperature coefficient of $13mV/^{\circ}C$ for a wide operating temperature range with a good linearity. Furthermore, the temperature coefficient of output voltage can be controlled by adjusting external bias voltage. This circuit my be applicable to the design of one-chip IC where quartz crystal resonator is mounted on CMOS oscillator chips.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.33 no.5C
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• pp.378-385
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• 2008

This paper has been designed with CMOS Analog-to-Digital Converter(ADC) to use a high speed embedded system. It used flash ADC with a voltage estimator and comparator for background developed autozeroing. The speed of this architecture is almost similar to conventional flash ADC but the die size are lower due to reduced numbers of comparators and associated circuity. This ADC is implemented in a $0.25{\mu}m$ pure digital CMOS technology.