• Journal of the Korean Institute of Telematics and Electronics C
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• v.36C no.9
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• pp.44-53
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• 1999

Generating diagnostic test patterns for combinational circuits remain to be a very difficult problem. For example, ISCAS85 c7552 benchmark circuit has 100 million fault pairs, Thus, we need more sophisticated algorithm to get more information. A new diagnostic algorithm for test pattern generation is suggested and implemented in this paper. DIATEST algorithm based on PODEM is also implemented for comparison to the new algorithm. These two algorithms have been applied to ISCAS85 benchmark circuits. Experimental results show that (1) both algorithms achieve fault pair coverage over 99%, (2) total test length of the new algorithm is much shorter than that of DIATEST, and (3) the new algorithm gives much more information used for making diagnostic dictionary, diagnostic decision tree or diagnostic test system despite DIATEST is faster than the new algorithm.

• ETRI Journal
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• v.30 no.1
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• pp.129-140
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• 2008

In this paper, we propose a novel ant colony optimization (ACO)-based test scheduling method for testing network-on-chip (NoC)-based systems-on-chip (SoCs), on the assumption that the test platform, including specific methods and configurations such as test packet routing, generation, and absorption, is installed. The ACO metaheuristic model, inspired by the ant's foraging behavior, can autonomously find better results by exploring more solution space. The proposed method efficiently combines the rectangle packing method with ACO and improves the scheduling results by dynamically choosing the test-access-mechanism widths for cores and changing the testing orders. The power dissipation and variable test clock mode are also considered. Experimental results using ITC'02 benchmark circuits show that the proposed algorithm can efficiently reduce overall test time. Moreover, the computation time of the algorithm is less than a few seconds in most cases.

• ETRI Journal
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• v.25 no.5
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• pp.321-327
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• 2003

Testing time and power consumption during the testing of SoCs are becoming increasingly important with an increasing volume of test data in intellectual property cores in SoCs. This paper presents a new algorithm to reduce the scan-in power and test data volume using a modified scan latch reordering algorithm. We apply a scan latch reordering technique to minimize the column hamming distance in scan vectors. During scan latch reordering, the don't-care inputs in the scan vectors are assigned for low power and high compression. Experimental results for ISCAS 89 benchmark circuits show that reduced test data and low power scan testing can be achieved in all cases.

• JSTS:Journal of Semiconductor Technology and Science
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• v.16 no.5
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• pp.582-594
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• 2016

Various test data compression techniques have been developed to reduce the test costs of system-on-a-chips. In this paper, a scan chain reordering algorithm for code-based test data compression techniques is proposed. Scan cells within an acceptable relocation distance are ranked to reduce the number of conflicts in all test patterns and rearranged by a positioning algorithm to minimize the routing overhead. The proposed method is demonstrated on ISCAS '89 benchmark circuits with their physical layout by using a 180 nm CMOS process library. Significant improvements are observed in compression ratio and test power consumption with minor routing overhead.

• Tunnel and Underground Space
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• v.28 no.6
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• pp.670-691
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• 2018

This study presents the research results of the BMT(Benchmark Model Test) simulations of the DECOVALEX-2019 project Task B. Task B named 'Fault slip modelling' is aiming at developing a numerical method to predict fault reactivation and the coupled hydro-mechanical behavior of fault. BMT scenario simulations of Task B were conducted to improve each numerical model of participating group by demonstrating the feasibility of reproducing the fault behavior induced by water injection. The BMT simulations consist of seven different conditions depending on injection pressure, fault properties and the hydro-mechanical coupling relations. TOUGH-FLAC simulator was used to reproduce the coupled hydro-mechanical process of fault slip. A coupling module to update the changes in hydrological properties and geometric features of the numerical mesh in the present study. We made modifications to the numerical model developed in Task B Step 1 to consider the changes in compressibility, Permeability and geometric features with hydraulic aperture of fault due to mechanical deformation. The effects of the storativity and transmissivity of the fault on the hydro-mechanical behavior such as the pressure distribution, injection rate, displacement and stress of the fault were examined, and the results of the previous step 1 simulation were updated using the modified numerical model. The simulation results indicate that the developed model can provide a reasonable prediction of the hydro-mechanical behavior related to fault reactivation. The numerical model will be enhanced by continuing interaction and collaboration with other research teams of DECOVALEX-2019 Task B and validated using the field experiment data in a further study.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.33A no.2
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• pp.205-216
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• 1996

In this paper we propose an efficient robust path delay fault test genration algorithm for detection of path delay faluts in combinational ligic circuits. In the proposed robust test genration approach, the testability measure is computed for all gates in the circuit under test and these computed values are used to genrate weighted random delay test vetors for detection of path delay faults. For genrated robust test vectors, we perform fault simulation on ISCAS '85 benchmark circuits using parallel pattern technqieus. The results indicate that the proposed test genration method not only increases the number of detected robust path delay faults but also reduces the time taen to genrate robust tests.

• Proceedings of the IEEK Conference
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• 2001.06b
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• pp.125-128
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• 2001

In this paper, we propose a low power Scan-based Built-ln Self Test based on circuit partitioning and pattern suppression using modified test control unit. To partition a CUT(Circuit Under Testing), the MHPA(Multilevel Hypergraph Partition Algorithm) is used. As a result of circuit partition, we can reduce the total length of test pattern, so that power consumptions are decreased in test mode. Also, proposed Scan-based BIST architecture suppresses a redundant test pattern by inserting an additional decoder in BIST control unit. A decoder detects test pattern with high fault coverage, and applies it to partitioned circuits. Experimental result on the ISCAS benchmark circuits shows the efficiency of proposed low power BIST architecture.

• ETRI Journal
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• v.31 no.2
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• pp.209-214
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• 2009

In this paper, we propose a novel test methodology for the detection of catastrophic and parametric faults present in analog very large scale integration circuits. An automatic test pattern generation algorithm is proposed to generate piece-wise linear (PWL) stimulus using wavelets and a genetic algorithm. The PWL stimulus generated by the test algorithm is used as a test stimulus to the circuit under test. Faults are injected to the circuit under test and the wavelet coefficients obtained from the output response of the circuit. These coefficients are used to train the neural network for fault detection. The proposed method is validated with two IEEE benchmark circuits, namely, an operational amplifier and a state variable filter. This method gives 100% fault coverage for both catastrophic and parametric faults in these circuits.

• ETRI Journal
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• v.25 no.3
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• pp.187-194
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• 2003

Delay testing has become an area of focus in the field of digital circuits as the speed and density of circuits have greatly improved. This paper proposes a new scan flip-flop and test algorithm to overcome some of the problems in delay testing. In the proposed test algorithm, the second test pattern is generated by scan justification, and the first test pattern is processed by functional justification. In the conventional functional justification, it is hard to generate the proper second test pattern because it uses a combinational circuit for the pattern. The proposed scan justification has the advantage of easily generating the second test pattern by direct justification from the scan. To implement our scheme, we devised a new scan in which the slave latch is bypassed by an additional latch to allow the slave to hold its state while a new pattern is scanned in. Experimental results on ISCAS'89 benchmark circuits show that the number of testable paths can be increased by about 45 % over the conventional functional justification.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.8 no.2
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• pp.201-206
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• 2007

In this paper, we propose the efficient low power test methodology of NoC(Network-on chip) for the test of core-based systems that use this platform. To reduce the power consumption of transferring data through router channel, the scan vectors are partitioned into flits by channel width. The don't cares in unspecified scan vectors are mapped to binary values to minimize the switching rate between flits. Experimental results for full-scanned versions of ISCAS 89 benchmark circuits show that the proposed method leads to about 35% reduction in test power.