• 한국유체기계학회 논문집
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• 제16권5호
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• pp.18-23
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• 2013

Thermal aging test is performed to qualify the life time of equipment in thermally aged condition. Due to long life time more than 10 years like as in power plant, the equipment is subjected to the accelerated thermal aging condition which is able to shorten the long aging test period by increasing aging temperature. Normally, conservatism of thermal aging test causes to impose unbalanced and excessive thermal load on components of the equipment, and deformation and damage problems of the components. Additionally, temperature rise of each component through heat generation of the electric equipment leads to long-term problem of the test period. Multi-phase accelerating aging test is to perform thermal aging test in multiple aging conditions after dividing into groups with various components of equipment. The groups might be classified considering various factors such as activation energy, temperature rise, glass transition temperature and melting temperature. In this study, we verify that the multi-phase accelerating aging test method can reduce and equalize the thermal over load of the components and shorten aging test time.

• 한국전기전자재료학회논문지
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• 제20권8호
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• pp.691-696
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• 2007

In this study accelerated aging test equipment was developed to simulate domestic weather condition for accelerated aging test of polymer housed distribution surge arresters. Polymer arresters were aged for 3,000 hours by this test equipment and chemical and electrical characteristics analysis of surge arresters were conducted after aging test. In addition, performance assessment of outdoor installed arresters for 3 years was conducted to compare aging effect between accelerated aging test and natural aging. Through this experiment it is verified that the capability of the proposed aging test for simulating natural aging and the housing material and disconnector of domestic polymer arresters can be deteriorated by the long time field operation.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2000년도 하계학술대회 논문집
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• pp.119-122
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• 2000

Recently polymer insulators are being used for outdoor high voltage applications. Polymer insulators for transmission line have significant advantages over porcelain and glass insulators, especially for ultra-high voltage transmission lines. Their advantages are light weight, vandalism resistance and hydrophobicity. Polymer insulators are a relatively new technology, but their expected life is still unknown. Therefore these estimating technique are very important. Their life time is related to weathering and operating condition. Multi-aging test is requested because aging factor is occurred by multi-aging than unique aging. The aging test about polymer insulators have mainly carried out by IEC 61109. This paper presents multi-stress chamber experiments and tracking wheel test to examine the tracking and erosion performance of polymer insulator for transmission. Multi-stress testing is able to demonstrate deficiencies of polymer insulator materials and designs, including the nature of interfaces in insulation design. We have investigated IEC 61109 Annex C (5000h aging test) and CEA tracking wheel test as test methods of artificial accelerated aging. The aging degree of polymer insulator is estimated by leakage current, measurement of hydrophobicity degree, damage conditions of insulator surface, withstand voltage test etc.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2001년도 춘계학술대회 논문집 유기절연재료 전자세라믹 방전플라즈마 연구회
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• pp.10-14
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• 2001

In order to assess the long-tenn reliability of polymer insulators for distribution power systems, we have developed the accelerated aging test method which can simulate the operation conditions. In this study, 3000 hours aging test for 4 kinds of polymer insulators has been completed by the developed accelerated aging test. After 3000 hours aging test, visual inspection and electrical tests were carried for identifying a change of characteristics. Some specimens showed the surface erosion and the manufacturing defect. In the electrical tests, the wet flashover voltage was significant1y decreased by the accelerated aging test. In comparison with the field-aged polymer insulators, it can be concluded that the developed test method can evaluate the long-tenn reliability within short time and screen the manufacturing defect.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2004년도 하계학술대회 논문집 Vol.5 No.1
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• pp.469-472
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• 2004

There have been numerous accelerated aging laboratory tests for evaluating suitability of polymeric materials and devices. Aging test for materials and its full scale device has been conducted, but poor correlation of aging test such as service experience were observed. Service experience plays a key role in the utility section of composite insulators. A meaningful and reliable accelerated aging test is needed for evaluating composite insulator. During the service these insulators are subjected to aging stress such as humidity, pollution, and electrical field, and erosion and tracking of the weathershed occurs. This paper presents the criteria of reliability evaluation and evaluation facilities for 22.9 kV suspension composite insulator. We adopt the criteria of reliability evaluation consist of two test methods. One is CEA tracking wheel test for examining the tracking and erosion performance of composite insulator. The other is multi-stress aging test for examining effects of environmental factors such as UV, temperature, humidity, etc on composite insulator.

• 한국항공우주학회지
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• 제48권8호
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• pp.581-588
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• 2020

고전압 기폭관의 노화 특성에 관하여 연구하였다. 노화 특성 관측을 위해 먼저 고전압 기폭관의 주요 구성품을 분류하고, 고장 메커니즘을 정의하였다. 위력과 감도 측면에서 노화 특성을 정의하였으며, HFC (Heat Flow Calorimetry)를 통해 계산된 활성화 에너지와 아레니우스 이론을 기반으로 가속노화시험 계획을 수립하였다. 노화된 시료를 이용하여 민감도 시험인 Neyer Test와 위력시험인 Dent Test를 통하여 성능 변화를 관측하였다. 민감도 시험을 통해 구한 반폭점에서 노화 경향을 관찰하였으나 관련 규격을 고려하면 충분히 긴 수명을 가지고 있는 것으로 분석되었다.

• JSTS:Journal of Semiconductor Technology and Science
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• 제13권1호
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• pp.71-78
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• 2013

In highly reliable and durable systems, failures due to aging might result in catastrophes. Aging monitoring techniques to prevent catastrophes by predicting such a failure are required. Aging can be monitored by performing a delay test at faster clocks than functional clock in field and checking the current delay state from the test clock frequencies at which the delay test is passed or failed. In this paper, we focus on test clock control scheme for a system-on-chip (SoC) with multiple clock domains. We describe limitations of existing at-speed test clock control methods and present an on-chip faster-than-at-speed test clock control scheme for intra/inter-clock domain test. Experimental results show our simulation results and area analysis. With a simple control scheme, with low area overhead, and without any modification of scan architecture, the proposed method enables faster-than-at-speed test of SoCs with multiple clock domains.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2000년도 하계학술대회 논문집
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• pp.596-598
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• 2000

This paper presents a new accelerating aging test facility for distribution lightning arresters. Aging parameters of lightning arrester are moisture ingress, electrical stress and surge absorption and so on. In this system, we applied 13.2kV to 6 samples and controled temperature and humidity of chamber and measured leakage currents of the all samples. Also we developed accelerating aging cycle which consists of -35$^{\circ}C$∼90$^{\circ}C$ temperature and 40%∼90% humidity. Through the aging test we found out the leakage current of aged sample increases rapidly according to the temperature rising. Hereafter we can determine the replacement guide of leakage current for field operating arresters and condition assessment of aged samples through this aging test.

• JSTS:Journal of Semiconductor Technology and Science
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• 제14권1호
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• pp.124-130
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• 2014

In highly reliable and durable systems, failures due to aging might result in catastrophes. Aging monitoring techniques to prevent catastrophes by predicting such a failure are required. This paper presents a scan-based on-line aging monitoring scheme which monitors aging during normal operation and gives an alarm if aging is detected so that the system users take action before a failure occurs. We illustrate our modified scan chain architecture and aging monitoring control method. Experimental results show our simulation results to verify the functions of the proposed scheme.

• 전력전자학회논문지
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• 제27권3호
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• pp.206-213
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• 2022

This paper presents setting up a laboratory-scale testbed to estimate the aging of power MOSFET devices and integrated power modules by measuring its on-state voltage and current. Based on the aging mechanisms of the component inside the power module (e.g., bond-wire, solder layer, and semiconductor chip), a system to measure the on-state resistance of device-under-test (DUT) is designed and experimented: a full-bridge circuit applies current stress to DUT, and a temperature chamber controls the ambient temperature of DUT during the aging test. The on-state resistance of SiC MOSFET measured by the proposed testbed was increased by 2.5%-3% after 44-hour of the aging test.