JSTS:Journal of Semiconductor Technology and Science

  • 제14권1호
  • /
  • Pages.124-130
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  • 2014
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  • 1598-1657(pISSN)
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  • 2233-4866(eISSN)
대한전자공학회 (The Institute of Electronics and Information Engineers)
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A Scan-Based On-Line Aging Monitoring Scheme

  • Yi, Hyunbean (Dept. of Computer Engineering/Graduate School of Information & Communications, Hanbat National University) ;
  • Yoneda, Tomokazu (Graduate School of Information Science, Nara Institute of Science and Technology (NAIST)) ;
  • Inoue, Michiko (Graduate School of Information Science, Nara Institute of Science and Technology (NAIST))
  • 투고 : 2013.09.11
  • 심사 : 2013.11.25
  • 발행 : 2014.02.28
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초록

In highly reliable and durable systems, failures due to aging might result in catastrophes. Aging monitoring techniques to prevent catastrophes by predicting such a failure are required. This paper presents a scan-based on-line aging monitoring scheme which monitors aging during normal operation and gives an alarm if aging is detected so that the system users take action before a failure occurs. We illustrate our modified scan chain architecture and aging monitoring control method. Experimental results show our simulation results to verify the functions of the proposed scheme.

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참고문헌

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피인용 문헌

  1. On Diagnosing the Aging Level of Automotive Semiconductor Devices vol.64, pp.7, 2017, https://doi.org/10.1109/TCSII.2016.2601959