• Journal of the Korean Data and Information Science Society
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• 제15권4호
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• pp.935-943
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• 2004

Most of the accelerated life tests deal with tests that use only one accelerating variable and no other explanatory variables. Frequently, however, there is a test to use more than one accelerating or other experimental variables, such as, for examples, a test of capacitors at higher than usual conditions of temperature and voltage, a test of circuit boards at higher than usual conditions of temperature, humidity and voltage. A accelerated life test is extended to M-level stress accelerated life test with k-stress variables. The optimal design for Weibull distribution is studied with k-stress variables.

• International Journal of Reliability and Applications
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• 제17권1호
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• pp.21-49
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• 2016

Many mechanical, electrical and electronic products have more than one performance characteristics (PCs). For example the performance degradation of rubidium discharge lamps can be characterized by the rubidium consumption or the decreasing intensity the lamp. The product may degrade due to all the PCs which may be independent or dependent. This paper deals with the design of optimal bivariate step-stress partially accelerated degradation test (PADT) with degradation paths modelled by gamma process. The dependency between PCs has been modelled through Frank copula function. In partial step-stress loading, the unit is tested at usual stress for some time, and then the stress is accelerated. This helps in preventing over-stressing of the test specimens. Failure occurs when the performance characteristic crosses the critical value the first time. Under the constraint of total experimental cost, the optimal test duration and the optimal number of inspections at each intermediate stress level are obtained using variance optimality criterion.

• 전자공학회논문지A
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• 제32A권6호
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• pp.67-74
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• 1995

This paper proposes the step-stress type-I censoring model for analyzing the data of accelerated life test and reducing the time of accelerated life test. In order to obtain the data of accelerated life test, the step-stress accelerated life test was run with voltage stress to CMOS Hex Buffer. The Weibull distribution, the Inverse-power-law model and Maximum likelihood method were used. The iterative procedure using modified-quasi-linearization method is applied to solve the nonlinear equation. The proposed Weibull step-stress type-I censoring model exactly estimases the life time of units, while reducting the time of accelerated life test and the equipments of test.

• 한국철도학회:학술대회논문집
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• 한국철도학회 2006년도 추계학술대회 논문집
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• pp.624-630
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• 2006

본 논문은 열차제어시스템의 하부구성요소단위 예측신뢰도를 가속스트레스시험을 통해 입증하기 위한 모델링을 연구한다. 예측신뢰도의 입증을 위해서는 전체시스템단위 시운전과 하부구성요소단위 가속수명시험 및 가속스트레스 시험을 통한 방법이 있으며, 본 논문에서는 하부구성요소단위로 정해진 시간동안 가속된 스트레스를 주입하여 장치의 생존여부에 따라 예측신뢰도를 입증하는 가속스트레스 시험을 위한 열차제어시스템의 모델링을 연구하였다. 전자부품으로 구성된 열차제어시스템은 사용온도에 따라 신뢰도가 급격하게 변화한다는 점에 착안하여 아레니우스 방정식 및 전자부품 활성화에너지를 고려하였으며, 가중평균을 사용한 신뢰성시험 모델링을 제시하여 열차제어시스템 가속스트레스시험의 시험시간을 산출하였다.

• 한국신뢰성학회지:신뢰성응용연구
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• 제17권2호
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• pp.129-135
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• 2017

Purpose: This article provides step-stress accelerated degradation test (ADT) plans based on the Wiener process. Method: Step-stress levels and the stress change times are determined based on the D-optimality criteria to develop test plans. Further, a simple grid search method is provided for obtaining the optimal test plan. Results: Based on the solution procedure, ADT plans which include the stress levels and change times are developed for conducting the reliability test. Conclusion: Optimal step-stress ADT plans are provided for the case where the number of measurements is small.

• International Journal of Reliability and Applications
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• 제17권1호
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• pp.85-105
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• 2016

In this paper accelerated life testing is incorporated in quality control technique of acceptance sampling plan to induce early failures in high reliability products.Stress under accelerated condition can be applied in constant-stress, step-stress and progressive-stress or combination of such loadings. A ramp-stress results when stress is increased linearly (from zero) with time. In this paper optimum failure-censored ramp-stress accelerated life test sampling plan for log-logistic distribution has been formulated with cost considerations. The log-logistic distribution has been found appropriate for insulating materials. The optimal plans consist in finding optimum sample size, sample proportion allocated to each stress, and stress rate factor such that producer's and consumer's interests are safeguarded. Variance optimality criterion is used when expected cost per lot is not taken into consideration, and bilevel programming approach is used in cost optimization problems. The methods developed have been illustrated using some numerical examples, and sensitivity analyses carried out in the context of ramp-stress ALTSP based on variable SSP for proportion nonconforming.

• 한국신뢰성학회지:신뢰성응용연구
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• 제7권2호
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• pp.57-72
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• 2007

This paper suggests an approach for using ALTA 7 PRO to design accelerated life test plans. Conducting a accelerated life test requires finding life distributions at different stress levels and determining an appropriate life-stress relationship. Moreover, a test plan needs to be developed. In its optimal test plan, stress levels are determined and the proportions of test units are assigned at each stress level so that asymptotic variance of the maximum likelihood estimate of a (log) percentile of the life distribution at the design stress is minimized. Examples are presented for usage.

• 응용통계연구
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• 제9권1호
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• pp.53-73
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• 1996

일정형 및 계단형 가속수명시험의 시험설계에 대한 일반적인 모형과 최적설계에 대한 최근의 연구결과를 소개하고, 수명분포가 와이블인 경우에 대하여 두가지 시험방법에 대한 최적설계를 점근분산의 행태, 설계변수의 효과, 최적시험조건에서 시험종결 시점까지의 기대고장개수 및 기대시험종결시간, 점근분산의 상대적효율과 설계변수의 사전추정치에 대한 둔감성의 측면에서 비교, 분석하였다.

• International Journal of Reliability and Applications
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• 제15권1호
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• pp.23-50
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• 2014

This paper deals with formulation of optimum multi-objective modified step-stress accelerated life test (ALT) plan for Burr type-XII distribution under type-I censoring. Since it is impractical to estimate only one objective parameter after conducting costly ALT tests; also, it is not desirable to assume instantaneous changes in stress levels because of limited capacity of test equipments and the presence of undesirable failure modes, therefore, an optimum multi-objective modified step-stress ALT plan has been designed. The optimal test plan consists in determining the optimum low stress level and optimal time at which stress starts linearly increasing from low stress by minimizing the weighted sum of the asymptotic variances of the maximum likelihood estimator of quantile lifetimes at design constant stress. The method developed has been illustrated using an example. Sensitivity analysis has been carried out. Comparative study has also been done to highlight the merits of the proposed model.

• 한국신뢰성학회:학술대회논문집
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• 한국신뢰성학회 2004년도 정기학술대회
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• pp.129-137
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• 2004

This paper presents an accelerated life test for burnout of tungsten filament of incandescent lamp. From failure analyses of field samples, it is shown that their root causes are local heating or hot sports in the filament caused by tungsten evaporation and wire sag. Finite element analysis is performed to evaluate the effect of vibration and impact for burnout, but any points of stress concentration or structural weakness are not found in the sample. To estimate the burnout life of lamp, an accelerated life test is planned by using quality function deployment and fractional factorial design, where voltage, vibration, and temperature are selected as accelerating variables. We assumed that Weibull lifetime distribution and a generalized linear model of life-stress relationship hold through goodness of fit test and test for common shape parameter of the distribution. Using accelerated life testing software, we estimated the common shape parameter of Weibull distribution, life-stress relationship, and accelerating factor.